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Author : Jamie Stuart Laird
Publisher :
ISBN 13 :
Total Pages : 349 pages
Book Rating : 4.:/5 (222 download)
Download or read book Scanning Ion Deep Level Transient Spectroscopy written by Jamie Stuart Laird and published by . This book was released on 1999 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Local Deep Level Transient Spectroscopy Using Super-higher-order Scanning Nonlinear Dielectric Microscopy written by and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Kim Hung Ng
Publisher :
ISBN 13 :
Total Pages : 132 pages
Book Rating : 4.:/5 (39 download)
Download or read book Deep Level Transient Spectroscopy in Resistive Layers written by Kim Hung Ng and published by . This book was released on 1989 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Scott David Berggren
Publisher :
ISBN 13 :
Total Pages : 372 pages
Book Rating : 4.:/5 (31 download)
Download or read book An Isothermal Deep-level Transient Spectroscopy System Implemented with Rate-scanning Software written by Scott David Berggren and published by . This book was released on 1991 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Academic Press
ISBN 13 : 0080864430
Total Pages : 335 pages
Book Rating : 4.0/5 (88 download)
Download or read book Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization written by and published by Academic Press. This book was released on 1997-06-12 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer after high temperature annealing. The editors of this volume and Volume 45 focus on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented. Provides basic knowledge of ion implantation-induced defects Focuses on physical mechanisms of defect annealing Utilizes electrical, physical, and optical characterization tools for processed semiconductors Provides the basis for understanding the problems caused by the defects generated by implantation and the means for their characterization and elimination
Author : Charles W. Griffin
Publisher :
ISBN 13 :
Total Pages : 236 pages
Book Rating : 4.:/5 (11 download)
Download or read book A Deep Level Transient Spectroscopy System written by Charles W. Griffin and published by . This book was released on 1983 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : B.G. Yacobi
Publisher : Springer Science & Business Media
ISBN 13 : 1489914927
Total Pages : 459 pages
Book Rating : 4.4/5 (899 download)
Download or read book Microanalysis of Solids written by B.G. Yacobi and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author :
Publisher : ASM International
ISBN 13 : 0871707454
Total Pages : 162 pages
Book Rating : 4.8/5 (717 download)
Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author :
Publisher : ASM International
ISBN 13 : 0871707691
Total Pages : 160 pages
Book Rating : 4.8/5 (717 download)
Download or read book Microelectronic Failure Analysis written by and published by ASM International. This book was released on 2002-01-01 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3540740805
Total Pages : 512 pages
Book Rating : 4.5/5 (47 download)
Download or read book Applied Scanning Probe Methods VIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author : John C. Vickerman
Publisher : John Wiley & Sons
ISBN 13 : 1119965519
Total Pages : 690 pages
Book Rating : 4.1/5 (199 download)
Download or read book Surface Analysis written by John C. Vickerman and published by John Wiley & Sons. This book was released on 2011-08-10 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Author : Ginger Kerrick
Publisher :
ISBN 13 :
Total Pages : 114 pages
Book Rating : 4.:/5 (298 download)
Download or read book Infrared Deep Level Transient Spectroscopy written by Ginger Kerrick and published by . This book was released on 1993 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sergio Pizzini
Publisher : Royal Society of Chemistry
ISBN 13 : 1837671370
Total Pages : 330 pages
Book Rating : 4.8/5 (376 download)
Download or read book Chemistry of Semiconductors written by Sergio Pizzini and published by Royal Society of Chemistry. This book was released on 2023-11-24 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon, germanium, and compound semiconductors, among which silicon carbide, gallium arsenide and gallium nitride are the most representative examples, play a withstanding role in the world economy, since they were and still are the keys for the advancement of modern microelectronics and optoelectronics, with a wealth of sister technologies relevant for renewable energy solutions and advanced spectroscopy applications. This textbook will cover the synthesis, spectroscopic characterisation and optimisation of semiconductor materials, accounting for the most recent developments in the field of nanomaterials. It will be of great interest for scholars and instructors to have the chance to look at semiconductor science with a basic chemical approach. Homopolar semiconductors (silicon and germanium) are examined first, considering the role of these materials in modern microelectronics and in photovoltaics. Compound semiconductors (for example, carbides, arsenides, tellurides, nitrides) are also discussed in detail, considering that the chemistry of their preparation is even more critical and their role in photonic applications is strategic. Authored by a leading expert in the field, this easily accessible text is appropriate for advanced undergraduates and postgraduates studying materials science and technology.
Author : R.W. Cahn
Publisher : Elsevier
ISBN 13 : 1483287513
Total Pages : 670 pages
Book Rating : 4.4/5 (832 download)
Download or read book Concise Encyclopedia of Materials Characterization written by R.W. Cahn and published by Elsevier. This book was released on 2016-01-22 with total page 670 pages. Available in PDF, EPUB and Kindle. Book excerpt: To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
Author : S. Amelinckx
Publisher : John Wiley & Sons
ISBN 13 : 3527620532
Total Pages : 507 pages
Book Rating : 4.5/5 (276 download)
Download or read book Handbook of Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-08-29 with total page 507 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Author : Gaius Gillman Fountain
Publisher :
ISBN 13 :
Total Pages : 214 pages
Book Rating : 4.:/5 (87 download)
Download or read book Deep Level Transient Spectroscopy written by Gaius Gillman Fountain and published by . This book was released on 1982 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt:
