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Quantitative Convergent Beam Electron Diffraction And Its Applications In Studying Crystal Structure And Bonding
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Book Synopsis Quantitative Convergent Beam Electron Diffraction and Its Applications in Studying Crystal Structure and Bonding by : Jian-min Zuo
Download or read book Quantitative Convergent Beam Electron Diffraction and Its Applications in Studying Crystal Structure and Bonding written by Jian-min Zuo and published by . This book was released on 1989 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Structural refinement of single crystals using digital-large angle convergent beam electron diffraction by : AJM Hubert
Download or read book Structural refinement of single crystals using digital-large angle convergent beam electron diffraction written by AJM Hubert and published by University of Warwick. This book was released on 2019-09-25 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: We explore the capability of digital-large angle convergent beam electron diffraction (D-LACBED) data for the structural refinement of single crystals. To achieve this, we use three materials as test cases. We use corundum for atomic position refi nement, copper and gallium arsenide for Debye-Waller factor (DWF) re finement. D-LACBED patterns are found to be extremely sensitive to atomic position, within 0.4 pm of reference X-ray values. The patterns are less sensitive to DWF (using the independent atom model - IAM) but nonetheless give good agreement to X-ray and Mossbauer radiation values for copper. We find the IAM to be insufficient for accurate refinement of gallium arsenide due to the influence of previously suggested strong anharmonicity and bonding within the material. Finally, we use simulation to explore the sensitivity of D-LACBED patterns through most re fineable structural parameters, providing context to the aforementioned results. During the analysis we see that higher g-vector patterns within the D-LACBED data may be more sensitive to structural parameters in general.
Book Synopsis Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects by : Jean- Paul Morniroli
Download or read book Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects written by Jean- Paul Morniroli and published by CRC Press. This book was released on 2004-11-01 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
Book Synopsis Electron Crystallography by : Thomas E. Weirich
Download or read book Electron Crystallography written by Thomas E. Weirich and published by Springer Science & Business Media. This book was released on 2006-08-18 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. Moreover, these developments have been accompanied by a now available new generation of computer controlled electron microscopes equipped with high-coherent field-emission sources, cryo-specimen holders, ultra-fast CCD cameras, imaging plates, energy filters and even correctors for electron optical distortions. Thus, a fast and semi-automatic data acquisition from small sample areas, similar to what we today know from imaging plates diffraction systems in X-ray crystallography, can be envisioned for the very near future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous recent achievements, this NATO Advanced Study Institute was devoted to the novel approaches of electron crystallography for structure determination of nanosized materials.
Book Synopsis Electron Crystallography by : D. Dorset
Download or read book Electron Crystallography written by D. Dorset and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 447 pages. Available in PDF, EPUB and Kindle. Book excerpt: The re-emergent field of quantitative electron crystallography is described by some of its most eminent practitioners. They describe the theoretical framework for electron scattering, specimen preparation, experimental techniques for optimum data collection, the methodology of structure analysis and refinement, and a range of applications to inorganic materials (including minerals), linear polymers, small organic molecules (including those used in nonlinear optical devices), incommensurately modulated structures (including superconductors), alloys, and integral membrane proteins. The connection between electron crystallography and X-ray crystallography is clearly defined, especially in the utilisation of the latest methods for direct determination of crystallographic phases, as well as the unique role of image analysis of high-resolution electron micrographs for phase determination. Even the aspect of multiple beam dynamic diffraction (once dreaded because it was thought to preclude ab initio analysis) is considered as a beneficial aid for symmetry determination as well as the elucidation of crystallographic phases, and as a criterion for monitoring the progress of structure refinement. Whereas other texts have hitherto preferentially dealt with the analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects of looking at `harder' materials, composed of heavier atoms. Audience: Could be used with profit as a graduate-level course on electron crystallography. Researchers in the area will find a statement of current progress in the field.
Book Synopsis Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 by : Rodenburg
Download or read book Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 written by Rodenburg and published by CRC Press. This book was released on 1997-01-01 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Book Synopsis Large-angle Convergent-beam Electron Diffraction (LACBED) by : Jean Paul Morniroli
Download or read book Large-angle Convergent-beam Electron Diffraction (LACBED) written by Jean Paul Morniroli and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
Book Synopsis Convergent-beam Electron Diffraction by : Michiyoshi Tanaka
Download or read book Convergent-beam Electron Diffraction written by Michiyoshi Tanaka and published by . This book was released on 1985 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Density Determination, Bonding and Properties of Tetragonal Ferromagnetic Intermetallics by :
Download or read book Electron Density Determination, Bonding and Properties of Tetragonal Ferromagnetic Intermetallics written by and published by . This book was released on 2016 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: The project developed quantitative convergent-beam electron diffraction (QCBED) methods by energy-filtered transmission electron microscopy (EFTEM) and used them in combination with density functional theory (DFT) calculations to study the electron density distribution in metallic and intermetallic phases with different cubic and non-cubic crystal structures that comprise elements with d-electron shells. The experimental methods developed here focus on the bonding charge distribution as one of the quantum mechanical characteristics central for understanding of intrinsic properties and validation of DFT calculations. Multiple structure and temperature factors have been measured simultaneously from nano-scale volumes of high-quality crystal with sufficient accuracy and precision for comparison with electron density distribution calculations by DFT. The often anisotropic temperature factors for the different atoms and atom sites in chemically ordered phases can differ significantly from those known for relevant pure element crystals due to bonding effects. Thus they have been measured from the same crystal volumes from which the structure factors have been determined. The ferromagnetic ordered intermetallic phases FePd and FePt are selected as model systems for 3d-4d and 3d-5d electron interactions, while the intermetallic phases NiAl and TiAl are used to probe 3d-3p electron interactions. Additionally, pure transition metal elements with d-electrons have been studied. FCC metals exhibit well defined delocalized bonding charge in tetrahedral sites, while less directional, more distributed bonding charge attains in BCC metals. Agreement between DFT calculated and QCBED results degrades as d-electron levels fill in the elements, and for intermetallics as d-d interactions become prominent over p-d interactions. Utilizing the LDA+U approach enabled inclusion of onsite Coulomb-repulsion effects in DFT calculations, which can afford improved agreements with QCBED results. This implies that onsite Coulomb repulsion effects become non-negligible as the d-orbitals fill. The use of now easily measured low-order structure factors as an additional experimental metric in validation of DFT calculation of electronic structures of crystals offers potential to capture better both total energy related properties and details of the interatomic bonding in system with d-electron orbital contributions. This effort advanced the state of the art in quantitative TEM experimentation, provides original experimental data uniquely suited for new validation approaches of DFT calculations of d-electron affected transition metals and intermetallics.
Book Synopsis Dissertation Abstracts International by :
Download or read book Dissertation Abstracts International written by and published by . This book was released on 1990 with total page 802 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Convergent Beam Electron Diffraction of Alloy Phases by : John Wickham Steeds
Download or read book Convergent Beam Electron Diffraction of Alloy Phases written by John Wickham Steeds and published by Institute of Physics Publishing (GB). This book was released on 1984 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Microdiffraction by : J.M. Zuo
Download or read book Electron Microdiffraction written by J.M. Zuo and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 374 pages. Available in PDF, EPUB and Kindle. Book excerpt: Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies.
Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo
Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Book Synopsis Electron Crystallography by : D. Dorset
Download or read book Electron Crystallography written by D. Dorset and published by Springer. This book was released on 1997-11-30 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt: The re-emergent field of quantitative electron crystallography is described by some of its most eminent practitioners. They describe the theoretical framework for electron scattering, specimen preparation, experimental techniques for optimum data collection, the methodology of structure analysis and refinement, and a range of applications to inorganic materials (including minerals), linear polymers, small organic molecules (including those used in nonlinear optical devices), incommensurately modulated structures (including superconductors), alloys, and integral membrane proteins. The connection between electron crystallography and X-ray crystallography is clearly defined, especially in the utilisation of the latest methods for direct determination of crystallographic phases, as well as the unique role of image analysis of high-resolution electron micrographs for phase determination. Even the aspect of multiple beam dynamic diffraction (once dreaded because it was thought to preclude ab initio analysis) is considered as a beneficial aid for symmetry determination as well as the elucidation of crystallographic phases, and as a criterion for monitoring the progress of structure refinement. Whereas other texts have hitherto preferentially dealt with the analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects of looking at `harder' materials, composed of heavier atoms. Audience: Could be used with profit as a graduate-level course on electron crystallography. Researchers in the area will find a statement of current progress in the field.
Book Synopsis Electron Diffraction in the Transmission Electron Microscope by : P.E. Champness
Download or read book Electron Diffraction in the Transmission Electron Microscope written by P.E. Champness and published by Garland Science. This book was released on 2020-08-13 with total page 185 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.
Book Synopsis Structure Analysis by Electron Diffraction by : B. K. Vainshtein
Download or read book Structure Analysis by Electron Diffraction written by B. K. Vainshtein and published by Elsevier. This book was released on 2013-10-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: Structure Analysis by Electron Diffraction focuses on the theory and practice of studying the atomic structure of crystalline substances through electron diffraction. The publication first offers information on diffraction methods in structure analysis and the geometrical theory of electron diffraction patterns. Discussions focus on the fundamental concepts of the theory of scattering and structure analysis of crystals, structure analysis by electron diffraction, formation of spot electron diffraction patterns, electron diffraction texture patterns, and polycrystalline electron diffraction patterns. The text then ponders on intensities of reflections, including atomic scattering, temperature factor, structure amplitude, experimental measurements of intensity, and review of equations for intensities of reflections in electron diffraction patterns. The manuscript examines the Fourier methods in electron diffraction and experimental electron diffraction structure investigations. Topics include the determination of the structure of the hydrated chlorides of transition metals; structures of carbides and nitrides of certain metals and semi-conducting alloys; electron diffraction investigation of clay minerals; and possibilities inherent in structure analysis by electron diffraction. The book is a helpful source of data for readers interested in structure analysis by electron diffraction.
Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster
Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques
