Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Power Constrained Testing Of Vlsi Circuits
Download Power Constrained Testing Of Vlsi Circuits full books in PDF, epub, and Kindle. Read online Power Constrained Testing Of Vlsi Circuits ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Power-Constrained Testing of VLSI Circuits by : Nicola Nicolici
Download or read book Power-Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Book Synopsis VLSI Circuits and Embedded Systems by : Hafiz Md. Hasan Babu
Download or read book VLSI Circuits and Embedded Systems written by Hafiz Md. Hasan Babu and published by CRC Press. This book was released on 2022-07-29 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: Very Large-Scale Integration (VLSI) creates an integrated circuit (IC) by combining thousands of transistors into a single chip. While designing a circuit, reduction of power consumption is a great challenge. VLSI designs reduce the size of circuits which eventually reduces the power consumption of the devices. However, it increases the complexity of the digital system. Therefore, computer-aided design tools are introduced into hardware design processes. Unlike the general-purpose computer, an embedded system is engineered to manage a wide range of processing tasks. Single or multiple processing cores manage embedded systems in the form of microcontrollers, digital signal processors, field-programmable gate arrays, and application-specific integrated circuits. Security threats have become a significant issue since most embedded systems lack security even more than personal computers. Many embedded systems hacking tools are readily available on the internet. Hacking in the PDAs and modems is a pervasive example of embedded systems hacking. This book explores the designs of VLSI circuits and embedded systems. These two vast topics are divided into four parts. In the book's first part, the Decision Diagrams (DD) have been covered. DDs have extensively used Computer-Aided Design (CAD) software to synthesize circuits and formal verification. The book's second part mainly covers the design architectures of Multiple-Valued Logic (MVL) Circuits. MVL circuits offer several potential opportunities to improve present VLSI circuit designs. The book's third part deals with Programmable Logic Devices (PLD). PLDs can be programmed to incorporate a complex logic function within a single IC for VLSI circuits and Embedded Systems. The fourth part of the book concentrates on the design architectures of Complex Digital Circuits of Embedded Systems. As a whole, from this book, core researchers, academicians, and students will get the complete picture of VLSI Circuits and Embedded Systems and their applications.
Book Synopsis Advances in VLSI and Embedded Systems by : Zuber Patel
Download or read book Advances in VLSI and Embedded Systems written by Zuber Patel and published by Springer Nature. This book was released on 2020-08-28 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Book Synopsis Design and Test Technology for Dependable Systems-on-chip by : Raimund Ubar
Download or read book Design and Test Technology for Dependable Systems-on-chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang
Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Book Synopsis Introduction to Advanced System-on-Chip Test Design and Optimization by : Erik Larsson
Download or read book Introduction to Advanced System-on-Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author :Hans-Joachim Wunderlich Publisher :Springer Science & Business Media ISBN 13 :9048132827 Total Pages :263 pages Book Rating :4.0/5 (481 download)
Book Synopsis Models in Hardware Testing by : Hans-Joachim Wunderlich
Download or read book Models in Hardware Testing written by Hans-Joachim Wunderlich and published by Springer Science & Business Media. This book was released on 2009-11-12 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Book Synopsis Evolvable Systems: From Biology to Hardware by : Gianluca Tempesti
Download or read book Evolvable Systems: From Biology to Hardware written by Gianluca Tempesti and published by Springer Science & Business Media. This book was released on 2010-08-30 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Biology has inspired electronics from the very beginning: the machines that we now call computers are deeply rooted in biological metaphors. Pioneers such as Alan Turing and John von Neumann openly declared their aim of creating arti?cial machines that could mimic some of the behaviors exhibited by natural organisms. Unfortunately, technology had not progressed enough to allow them to put their ideas into practice. The 1990s saw the introduction of programmable devices, both digital (FP- GAs) and analogue (FPAAs). These devices, by allowing the functionality and the structure of electronic devices to be easily altered, enabled researchers to endow circuits with some of the same versatility exhibited by biological entities and sparked a renaissance in the ?eld of bio-inspired electronics with the birth of what is generally known as evolvable hardware. Eversince,the?eldhasprogressedalongwiththetechnologicalimprovements and has expanded to take into account many di?erent biological processes, from evolution to learning, from development to healing. Of course, the application of these processes to electronic devices is not always straightforward (to say the least!), but rather than being discouraged, researchers in the community have shown remarkable ingenuity, as demostrated by the variety of approaches presented at this conference and included in these proceedings.
Book Synopsis Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by : Manoj Sachdev
Download or read book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Author :Krishnendu Chakrabarty Publisher :Springer Science & Business Media ISBN 13 :1475765274 Total Pages :202 pages Book Rating :4.4/5 (757 download)
Book Synopsis SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by : Krishnendu Chakrabarty
Download or read book SOC (System-on-a-Chip) Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Book Synopsis Thermal-Aware Testing of Digital VLSI Circuits and Systems by : Santanu Chattopadhyay
Download or read book Thermal-Aware Testing of Digital VLSI Circuits and Systems written by Santanu Chattopadhyay and published by CRC Press. This book was released on 2018-04-24 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Book Synopsis Ubiquitous Communications and Network Computing by : Navin Kumar
Download or read book Ubiquitous Communications and Network Computing written by Navin Kumar and published by Springer. This book was released on 2017-12-22 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the First International Conference on Ubiquitous Communications and Network Computing, UBICNET 2017, held in Bangalore, India, in August 2017. The 23 full papers were selected from 71 submissions and are grouped in topical sections on safety and energy efficient computing, cloud computing and mobile commerce, advanced and software defined networks, and advanced communication systems and networks.
Book Synopsis Reliability, Availability and Serviceability of Networks-on-Chip by : Érika Cota
Download or read book Reliability, Availability and Serviceability of Networks-on-Chip written by Érika Cota and published by Springer Science & Business Media. This book was released on 2011-09-23 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Book Synopsis Proceedings, ... International Symposium on VLSI Design by :
Download or read book Proceedings, ... International Symposium on VLSI Design written by and published by . This book was released on 2005 with total page 938 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Progress in VLSI Design and Test by : Hafizur Rahaman
Download or read book Progress in VLSI Design and Test written by Hafizur Rahaman and published by Springer. This book was released on 2012-06-26 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Book Synopsis Thermal Issues in Testing of Advanced Systems on Chip by : Nima Aghaee Ghaleshahi
Download or read book Thermal Issues in Testing of Advanced Systems on Chip written by Nima Aghaee Ghaleshahi and published by Linköping University Electronic Press. This book was released on 2015-09-23 with total page 219 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. Such very large scale integration is enabled by a core-based design paradigm as well as deep-submicron and 3D-stacked-IC technologies. These technologies are susceptible to reliability and testing complications caused by thermal issues. Three crucial thermal issues related to temperature variations, temperature gradients, and temperature cycling are addressed in this thesis. Existing test scheduling techniques rely on temperature simulations to generate schedules that meet thermal constraints such as overheating prevention. The difference between the simulated temperatures and the actual temperatures is called temperature error. This error, for past technologies, is negligible. However, advanced SoCs experience large errors due to large process variations. Such large errors have costly consequences, such as overheating, and must be taken care of. This thesis presents an adaptive approach to generate test schedules that handle such temperature errors. Advanced SoCs manufactured as 3D stacked ICs experience large temperature gradients. Temperature gradients accelerate certain early-life defect mechanisms. These mechanisms can be artificially accelerated using gradient-based, burn-in like, operations so that the defects are detected before shipping. Moreover, temperature gradients exacerbate some delay-related defects. In order to detect such defects, testing must be performed when appropriate temperature-gradients are enforced. A schedule-based technique that enforces the temperature-gradients for burn-in like operations is proposed in this thesis. This technique is further developed to support testing for delay-related defects while appropriate gradients are enforced. The last thermal issue addressed by this thesis is related to temperature cycling. Temperature cycling test procedures are usually applied to safety-critical applications to detect cycling-related early-life failures. Such failures affect advanced SoCs, particularly through-silicon-via structures in 3D-stacked-ICs. An efficient schedule-based cycling-test technique that combines cycling acceleration with testing is proposed in this thesis. The proposed technique fits into existing 3D testing procedures and does not require temperature chambers. Therefore, the overall cycling acceleration and testing cost can be drastically reduced. All the proposed techniques have been implemented and evaluated with extensive experiments based on ITC’02 benchmarks as well as a number of 3D stacked ICs. Experiments show that the proposed techniques work effectively and reduce the costs, in particular the costs related to addressing thermal issues and early-life failures. We have also developed a fast temperature simulation technique based on a closed-form solution for the temperature equations. Experiments demonstrate that the proposed simulation technique reduces the schedule generation time by more than half.
