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Download or read book OPTIQUE DES RAYONS X ET MICROANALYSE. written by and published by . This book was released on 1966 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Raymond Castaing
Publisher :
ISBN 13 :
Total Pages : 716 pages
Book Rating : 4.U/5 (183 download)
Download or read book Optique des rayons X et microanalyse written by Raymond Castaing and published by . This book was released on 1966 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 706 pages
Book Rating : 4.:/5 (31 download)
Download or read book Optique des rayons X et microanalyse written by and published by . This book was released on 1966 with total page 706 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Gottfried Möllenstedt
Publisher : Springer-Verlag
ISBN 13 : 366224778X
Total Pages : 624 pages
Book Rating : 4.6/5 (622 download)
Download or read book Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer-Verlag. This book was released on 2013-07-02 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Gottfried Möllenstedt
Publisher : Springer Science & Business Media
ISBN 13 : 3662121085
Total Pages : 624 pages
Book Rating : 4.6/5 (621 download)
Download or read book Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Author : Philip F. Kane
Publisher : Springer Science & Business Media
ISBN 13 : 1461344905
Total Pages : 675 pages
Book Rating : 4.4/5 (613 download)
Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Download or read book X-RAY OPTICS AND MICROANALYSIS- 4 CONGRES INTERNATIONAL SUR L OPTIQUE DES RAYONS X ET LA MICROANALYSE. written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Library of Medicine (U.S.)
Publisher :
ISBN 13 :
Total Pages : 752 pages
Book Rating : 4.3/5 (91 download)
Download or read book National Library of Medicine Current Catalog written by National Library of Medicine (U.S.) and published by . This book was released on 1970 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt: First multi-year cumulation covers six years: 1965-70.
Author : Karl Zierold
Publisher : Springer Science & Business Media
ISBN 13 : 364274477X
Total Pages : 331 pages
Book Rating : 4.6/5 (427 download)
Download or read book Electron Probe Microanalysis written by Karl Zierold and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of electron probe microanalysis of biological systems is to identify, localize, and quantify elements, mass, and water in cells and tissues. The method is based on the idea that all electrons and photons emerging from an electron beam irradiated specimen contain information on its structure and composition. In particular, energy spectroscopy of X-rays and electrons after interaction of the electron beam with the specimen is used for this purpose. However, the application of this method in biology and medicine has to overcome three specific problems: 1. The principle constituent of most cell samples is water. Since liquid water is not compatible with vacuum conditions in the electron microscope, specimens have to be prepared without disturbing the other components, in parti cular diffusible ions (elements). 2. Electron probe microanaly sis provides physical data on either dry specimens or fully hydrated, frozen specimens. This data usually has to be con verted into quantitative data meaningful to the cell biologist or physiologist. 3. Cells and tissues are not static but dynamic systems. Thus, for example, microanalysis of physiolo gical processes requires sampling techniques which are adapted to address specific biological or medical questions. During recent years, remarkable progress has been made to overcome these problems. Cryopreparation, image analysis, and electron energy loss spectroscopy are key areas which have solved some problems and offer promise for future improvements.
Author : P.B. Kenway
Publisher : CRC Press
ISBN 13 : 1000157083
Total Pages : 684 pages
Book Rating : 4.0/5 (1 download)
Download or read book X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK written by P.B. Kenway and published by CRC Press. This book was released on 2020-10-08 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
Author : R. Good
Publisher : Springer Science & Business Media
ISBN 13 : 1461579694
Total Pages : 354 pages
Book Rating : 4.4/5 (615 download)
Download or read book Surface and Colloid Science written by R. Good and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface science and colloid science are preeminently experimental subjects. They constitute complementary aspects of a field which has been notably active since World War II; there is every reason to expect that the level of activity will continue to rise in the coming decades, so it is timely to review certain experimental methods of surface and colloid science as they exist, and to evaluate and refine those methods. This volume, and others that will follow, are principally concerned with experimental methods. The working scientist needs access to the latest techniques, of course. He also needs to learn of the potentialities of recently developed techniques which he may not have been aware of. Equally important, or perhaps even more so, he needs to learn of the pitfalls of existing methods. One might say, wistfully, that it would be nice to be able to pick up somebody's description of a new piece of apparatus, to go into the laboratory, to build it, and to have it work, the first time! There is, however, a serious problem of the interaction between the experiment per se and the theory for which the experiment is designed. Very often, this interaction renders problematic the interpretation of "direct" observations. An example, from experience of the senior editor of this volume, is the question of contact angle hysteresis. (See Chapters 1 and 2.
Author : Peter W. Hawkes
Publisher : Elsevier
ISBN 13 : 0080490107
Total Pages : 605 pages
Book Rating : 4.0/5 (84 download)
Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Elsevier. This book was released on 2004-12-18 with total page 605 pages. Available in PDF, EPUB and Kindle. Book excerpt: * A special volume devoted principally to therole of the late Sir Charles Oatley in the development of the scanning electron microscopeings * It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory * Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Although the scanning electron microscope had a prehistory in Germany and the USA, its real champion was Charles Oatley, who launched his projectin the Cambridge University Engineering Department shortly after the end of World War II. A first microscope was built successfully by D. McMullan, oneof the Guest Editors of this volume and a succession of progressively improved instruments followed. One in particular, built by K.C.A. Smith was commissioned specially for the Canadian Pulp and Paper Research Institute for use in their Montreal laboratories. All these efforts culminated in the commercial model built by the Cambridge Instrument Company and marketed in 1965 under the trade name, Stereoscan.Although this story has been told on several occasions, in particular in these Advances, it seemed appropriate, in the centenary year of the birth of Sir Charles Oatley, that more details should be published to celebrate these achievements. This volume is the result. It contains not only historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory but also full or partial reproductions of many of the key publications, beginning with McMullan's early paper of 1953 and including Oatley's own "Early history of the scanning electron microscope" (1982). A website has been created, in which supplementary material is collected. This volume is a tribute to a bold pioneering scientist and a vivid record of the creation of the first commercial scanning electron microscopes and of subsequent developments. * A special volume devoted principally to therole of the late Sir Charles Oatley in the development of the scanning electron microscopeings* It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory* Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
Author : Abraham Boekestein
Publisher : Springer Science & Business Media
ISBN 13 : 3709166799
Total Pages : 271 pages
Book Rating : 4.7/5 (91 download)
Download or read book Electron Microbeam Analysis written by Abraham Boekestein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.
Author : K.F.J. Heinrich
Publisher : Springer Science & Business Media
ISBN 13 : 1489926178
Total Pages : 397 pages
Book Rating : 4.4/5 (899 download)
Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author :
Publisher :
ISBN 13 :
Total Pages : 334 pages
Book Rating : 4.3/5 (91 download)
Download or read book NBS Special Publication written by and published by . This book was released on 1918 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Kurt F. J. Heinrich
Publisher :
ISBN 13 :
Total Pages : 60 pages
Book Rating : 4.:/5 (31 download)
Download or read book A Simple Correction Procedure for Quantitative Electron Probe Microanalysis written by Kurt F. J. Heinrich and published by . This book was released on 1972 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Kurt F. J. Heinrich
Publisher :
ISBN 13 :
Total Pages : 24 pages
Book Rating : 4.:/5 (31 download)
Download or read book Present State of the Classical Theory of Quantitative Electron Probe Microanalysis written by Kurt F. J. Heinrich and published by . This book was released on 1970 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt: Although the foundations for a procedure of data reduction in quantitative electron probe analysis have not been changed for several years, there has been progress in the choice of expressions, parameters, and constants. A brief account of recommended expressions and procedures is given. Reference is made to the Standard Reference Materials of Au-Ag and Au-Cu alloys issued for electron probe microanalysis.These are especially useful for investigating the application of correction procedures.
