Microscope A Force Atomique Et Imagerie Mecanique

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MICROSCOPE A FORCE ATOMIQUE ET IMAGERIE MECANIQUE

Author : PIERRE-EMMANUEL.. MAZERAN
Publisher :
ISBN 13 :
Total Pages : 159 pages
Book Rating : 4.:/5 (49 download)

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Book Synopsis MICROSCOPE A FORCE ATOMIQUE ET IMAGERIE MECANIQUE by : PIERRE-EMMANUEL.. MAZERAN

Download or read book MICROSCOPE A FORCE ATOMIQUE ET IMAGERIE MECANIQUE written by PIERRE-EMMANUEL.. MAZERAN and published by . This book was released on 1998 with total page 159 pages. Available in PDF, EPUB and Kindle. Book excerpt: LES MICROSCOPES A FORCE ATOMIQUE (AFM) ET A FORCE LATERALE (LFM) PERMETTENT DE REALISER DES IMAGES TOPOGRAPHIQUES ET EN FORCE DE FROTTEMENT DE MATERIAUX DE NATURE TRES VARIEE, AVEC DES RESOLUTIONS NANOMETRIQUES. CETTE THESE A DEUX OBJECTIFS. LE PREMIER CONSISTE A ETENDRE LES CAPACITES DE L'APPAREIL A L'IMAGERIE MECANIQUE QUANTITATIVE DES RAIDEURS DU CONTACT POINTE/SURFACE. LE SECOND CONSISTE A DETERMINER LES PROPRIETES ELASTO-PLASTIQUES D'UNE SURFACE A PARTIR DES VALEURS DES RAIDEURS DU CONTACT POINTE/SURFACE EN UTILISANT LES THEORIES DU CONTACT ELASTIQUES OU PLASTIQUE. DANS UN PREMIER TEMPS, NOUS AVONS CARACTERISE LES PROPRIETES MECANIQUES ET GEOMETRIQUES DU MICROLEVIER AFM. LA RAIDEUR EN FLEXION DU MICROLEVIER EST DETERMINEE A PARTIR DE SA FREQUENCE DE RESONANCE. LA COURBURE DE L'EXTREMITE DE LA POINTE EST EXTRAITE D'IMAGES TOPOGRAPHIQUES REALISEES SUR UNE SURFACE MODELE. DANS UN SECOND TEMPS, NOUS AVONS COMPARE ET ANALYSE LES TECHNIQUES DE MODULATION DE FORCE (FM) DIRECTE ET INDIRECTE. CES TECHNIQUES PERMETTENT DE MESURER DE MANIERE QUALITATIVE LES PROPRIETES MECANIQUES DE LA SURFACE. ELLES CONSISTENT A MESURER LA VARIATION D'INDENTATION DE LA SURFACE PROVOQUEE PAR UNE VARIATION DE LA FORCE NORMALE. EN UTILISANT UN MODELE BIDIMENSIONNEL, NOUS MONTRONS QUE LE CONTRASTE DANS LES IMAGES FM EST ESSENTIELLEMENT DU A LA FORCE LATERALE APPLIQUEE SUR LA POINTE. ON PEUT NEANMOINS MESURER DE MANIERE APPROCHEE LE MODULE D'ELASTICITE DE LA SURFACE EN UTILISANT DES LEVIERS DE GRANDES RAIDEURS, COMPTE TENU DE LA NATURE ELASTO-PLASTIQUE DU CONTACT. DANS UN TROISIEME TEMPS, NOUS AVONS DEVELOPPE UNE METHODE DYNAMIQUE D'ACQUISITION DU SIGNAL LFM POUR REALISER DES IMAGES EN FROTTEMENT ET DES IMAGES EN RAIDEUR LATERALE DU CONTACT. APRES AVOIR ETALONNE LE SIGNAL LFM EN TERME DE FORCE LATERALE, NOUS POUVONS OBTENIR UNE IMAGE QUANTITATIVE EN RAIDEUR LATERALE DU CONTACT POINTE/SURFACE. LA QUANTIFICATION DU MODULE D'ELASTICITE DE LA SURFACE DONNE DES RESULTATS SATISFAISANTS.

High-Speed Atomic Force Microscopy in Biology

Author : Toshio Ando
Publisher : Springer Nature
ISBN 13 : 3662647850
Total Pages : 327 pages
Book Rating : 4.6/5 (626 download)

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Book Synopsis High-Speed Atomic Force Microscopy in Biology by : Toshio Ando

Download or read book High-Speed Atomic Force Microscopy in Biology written by Toshio Ando and published by Springer Nature. This book was released on 2022-03-23 with total page 327 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular “movies” created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena.

Apports de la Microscopie à Force Atomique à l'étude de phénomènes dynamiques en biologie et développement instrumental associé

Author : Eléonore Lambert
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (11 download)

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Book Synopsis Apports de la Microscopie à Force Atomique à l'étude de phénomènes dynamiques en biologie et développement instrumental associé by : Eléonore Lambert

Download or read book Apports de la Microscopie à Force Atomique à l'étude de phénomènes dynamiques en biologie et développement instrumental associé written by Eléonore Lambert and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Le Laboratoire de Recherche en Nanosciences EA 4682 s'est récemment équipé de la microscopie à force atomique haute-vitesse (HS-AFM) permettant la visualisation en temps réel des dynamiques d'interactions d'un panel infini d'échantillons biologiques à l'échelle nanométrique. De nombreux champ de recherche nécessite la mise au point de techniques permettant à la fois une imagerie dynamique (vidéomicroscopie) mais également de plus en plus une imagerie haute résolution (microscopie champ proche). Ce couplage a été récemment obtenu grâce au développement de la microscopie à force atomique ultra-rapide. La limitation actuelle de ce microscope ultra-rapide, à savoir l'acquisition d'informations en relation uniquement avec la surface de l'objet biologique étudié, crée un rempart à l'obtention de connaissances nouvelles sur les dynamiques sous-jacentes que renferment certains systèmes biomoléculaires. Pour s'affranchir de cette contrainte, nous nous proposons dans ce projet de faire évoluer notre outil de nanocaractérisation en lui ajoutant des fonctionnalités optiques et des fonctionnalités permettant de faire de la spectroscopie de force. La conduite de ce projet se fera selon un travail de développement instrumental scindé en deux grandes étapes : - l'apport d'outils de microscopie optique conventionnels : FRAP - FRET - FLIM - Fluorescence - TIRFM. Nous couplons ainsi la nanocaractérisation hautement résolue spatialement et temporellement avec des informations intrinsèques de nos échantillons. Cette complémentarité apparaît de plus en plus comme fondamentale dans les demandes des biologistes. - la mise au point de protocoles de fonctionnalisation de leviers AFM afin de réaliser de la spectroscopie de force et ainsi obtenir des informations sur les propriétés mécaniques des échantillons biologiques. Ce projet de recherche sera réalisé au Laboratoire de Recherche en Nanosciences EA 4682, Université de Reims Champagne Ardenne sous la direction du Pr. Michael Molinari et du Dr. Maxime Ewald récemment recruté en tant que maître de conférences (sept. 2013) et qui pu démarrer la thématique de la microscopie AFM haute-vitesse au sein de l'équipe. Il s'effectuera en collaboration avec le Pr. T. Ando du Biophysics Lab' de l'Université de Kanazawa (Japon) pour la partie instrumentation, et avec le Dr. Gabriel Paës pour l'étude des échantillons biologiques. Les objets étudiés lors de cette thèse seront liés au projet ANR Lignoprog qui vient de démarrer au 1er novembre 2014 porté par Dr. Gabriel Paës (INRA UMR FARE, Reims). Dans ce projet, des échantillons biologiques se doivent d'être caractériser en dynamique. Ils concernent la biomasse lignocellulosique (BL), réseau complexe de polymères constituant les parois végétales (PV). La complexité architecturale et chimique de la BL est un frein à sa conversion industrielle. Pour atteindre ce but, non seulement la fraction cellulosique mais aussi les fractions hémicellulosiques et ligneuses doivent être valorisées, sinon les bio-raffineries ne seront pas compétitives. Le principal challenge à relever est celui du coût élevé et de la relative faible efficacité de l'étape de déconstruction enzymatique de la BL. Avec les fonctionnalités d'imagerie développées dans ce projet, nous espérons apporter des éléments de réponses sur la déconstruction enzymatique. Par ailleurs, même si les objets étudiés seront principalement ceux du projet Lignoprog, une validation du dispositif pourra être réalisée en parallèle sur d'autres échantillons biologiques tels que des cellules vivantes seront envisagées : caractérisation, mise en évidence leur réactivité vis-à-vis des divers paramètres physiologiques du milieu (pH, concentration, composition), corrélation de ces résultats avec leurs propriétés mécaniques.

Imagerie de Surface de Polymeres: Microscope a Force Atomique

Author :
Publisher : Ed. Techniques Ingénieur
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4./5 ( download)

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Book Synopsis Imagerie de Surface de Polymeres: Microscope a Force Atomique by :

Download or read book Imagerie de Surface de Polymeres: Microscope a Force Atomique written by and published by Ed. Techniques Ingénieur. This book was released on with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Atomic Force Microscopy

Author : Bert Voigtländer
Publisher : Springer
ISBN 13 : 303013654X
Total Pages : 331 pages
Book Rating : 4.0/5 (31 download)

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Book Synopsis Atomic Force Microscopy by : Bert Voigtländer

Download or read book Atomic Force Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2019-05-23 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Atomic Force Microscopy

Author : Peter Eaton
Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.1/5 (995 download)

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Book Synopsis Atomic Force Microscopy by : Peter Eaton

Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Atomic Force Microscopy For Biologists

Author : Patrick A Gunning
Publisher : World Scientific
ISBN 13 : 1783261854
Total Pages : 348 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis Atomic Force Microscopy For Biologists by : Patrick A Gunning

Download or read book Atomic Force Microscopy For Biologists written by Patrick A Gunning and published by World Scientific. This book was released on 1999-12-02 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.

Atomic Force Microscopy

Author : Armand Vance
Publisher :
ISBN 13 : 9781681172125
Total Pages : 0 pages
Book Rating : 4.1/5 (721 download)

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Book Synopsis Atomic Force Microscopy by : Armand Vance

Download or read book Atomic Force Microscopy written by Armand Vance and published by . This book was released on 2016-04 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning. Compared to competitive technologies such as optical microscopy and electron microscopy, the major diﬀerence between these and the atomic-force microscope is that the latter does not use lenses or beam irradiation. Therefore, it does not suﬀer from a limitation of space resolution due to diﬀraction limit and aberration, and it is not necessary to prepare a space for guiding the beam (by creating a vacuum) or to stain the sample. Piezo-ceramics position the tip with high resolution. Piezoelectric ceramics are a class of materials that expand or contract when in the presence of a voltage gradient. Piezo-ceramics make it possible to create three-dimensional positioning devices of arbitrarily high precision. In contact mode, AFMs use feedback to regulate the force on the sample. The AFM not only measures the force on the sample but also regulates it, allowing acquisition of images at very low forces. The feedback loop consists of the tube scanner that controls the height of the tip; the cantilever and optical lever, which measures the local height of the sample; and a feedback circuit that attempts to keep the cantilever deﬂection constant by adjusting the voltage applied to the scanner. The atomic force microscope is a powerful tool that is invaluable if to measure incredibly small samples with a great degree of accuracy. Unlike rival technologies it does not require either a vacuum or the sample to undergo treatment that might damage it. At the limits of operation however, researchers have demonstrated atomic resolution in high vacuum and even liquid environments. The book entitled Atomic Force Microscopy covers the applications and theories of atomic force microscope.

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 2 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Atomic Force Microscopy/Scanning Tunneling Microscopy

Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 0306448904
Total Pages : 468 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1994 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.

Atomic Force Microscopy

Author : Pier Carlo Braga
Publisher : Springer Science & Business Media
ISBN 13 : 1592596479
Total Pages : 388 pages
Book Rating : 4.5/5 (925 download)

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Book Synopsis Atomic Force Microscopy by : Pier Carlo Braga

Download or read book Atomic Force Microscopy written by Pier Carlo Braga and published by Springer Science & Business Media. This book was released on 2008-02-02 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Approches numérique et théorique du microscope à force atomique

Author : Fabien Castanié
Publisher :
ISBN 13 :
Total Pages : 180 pages
Book Rating : 4.:/5 (867 download)

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Book Synopsis Approches numérique et théorique du microscope à force atomique by : Fabien Castanié

Download or read book Approches numérique et théorique du microscope à force atomique written by Fabien Castanié and published by . This book was released on 2012 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: La microscopie à force atomique (AFM) est un outil puissant et polyvalent capable de réaliser des images avec une résolution sub-nanométrique d'un grand type d'échantillons, comme des surfaces de matériaux inorganiques avec ou sans molécules adsorbées, et d'opérer dans des environnements allant de l'ultra-haut vide (UHV) à l'interface solide/liquide. Parmi les différents modes existants, l'AFM en mode modulation de fréquence (FM-AFM) donne des résultats remarquables grâce à deux boucles de contrôle et une d'asservissement qui s'influencent mutuellement. En contrepartie, la compréhension du fonctionnement de la machine ainsi que l'optimisation de ses réglages s'avèrent délicates. De plus, cette difficulté est accentuée par l'interprétation souvent complexe liée aux phénomènes spécifiques à l'échelle nanométrique. Pour pallier ces difficultés, le travail de thèse a consisté en l'élaboration d'un AFM numérique (n-AFM) à partir d'un code de calcul conçu par L. Nony en langage C. Après une phase d'implémentation en Fortran 90 pour assurer portabilité et compatibilité avec d'autres programmes scientifiques, de nouvelles fonctionnalités ont été développées. Parmi celles-ci, un couplage avec un code de dynamique moléculaire (MD) a été réalisé afin de considérer les effets de température et de relaxation du système imagé. Ces développements du n-AFM ont permis de mettre en oeuvre différents régimes et modes d'utilisation à travers l'étude de plusieurs systèmes. En premier lieu, des molécules bi- et tri-dimensionnelles adsorbées ont permis d'éprouver la sensibilité et la stabilité du n-AFM en simulant un cantilever classique et un tuning fork. En deuxième lieu, la reconstruction de la surface 6H-SiC(3X3) a été étudiée à l'aide de la MD puis du n-AFM. Les images expérimentales de cette reconstruction révèlent un comportement atypique que nous nous sommes efforcés de comprendre et d'expliquer. Enfin, l'utilisation du n-AFM a été étendue à d'autres domaines que l'étude des surfaces et molécules. En particulier, nous avons modélisé et étudié en FM-AFM l'influence d'un défaut sur les parois d'une nano-pointe oscillant à l'interface air/liquide. Et nous avons enfin poursuivi par l'étude de l'influence, sur le comportement d'un AFM en mode modulation d'amplitude (tapping mode), de nano-films de liquide à la surface du système pointe-substrat.

Atomic Force Microscopy

Author : Greg Haugstad
Publisher : John Wiley & Sons
ISBN 13 : 1118360680
Total Pages : 496 pages
Book Rating : 4.1/5 (183 download)

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Book Synopsis Atomic Force Microscopy by : Greg Haugstad

Download or read book Atomic Force Microscopy written by Greg Haugstad and published by John Wiley & Sons. This book was released on 2012-09-04 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

Force Microscopy

Author : Bhanu P. Jena
Publisher : John Wiley & Sons
ISBN 13 : 0470007699
Total Pages : 310 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Force Microscopy by : Bhanu P. Jena

Download or read book Force Microscopy written by Bhanu P. Jena and published by John Wiley & Sons. This book was released on 2006-07-11 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: A complete examination of the uses of the atomic force microscope in biology and medicine This cutting-edge text, written by a team of leading experts, is the first detailed examination of the latest, most powerful scanning probe microscope, the atomic force microscope (AFM). Using the AFM, in combination with conventional tools and techniques, readers gain a profound understanding of the cell, subcellular organelles, and biomolecular structure and function. The text begins with three chapters describing the molecular machinery and mechanism of cell secretion and membrane fusion in cells, using approaches that combine AFM, electron microscopy, X-ray diffraction, photon correlation spectroscopy, molecular biology, biochemistry, and electrophysiology. The discovery of a new cellular structure the "porosome" or fusion pore--the cells secretory machinery, the molecular mechanism of membrane fusion in cells, and the expulsion of intravesicular contents during cell secretion are outlined in the first three chapters. The book also covers: * Identification of the "porosome" in the growth hormone secreting cell of the pituitary gland * Probing the structural and physical properties of microbial cell surfaces * Scanning probe microscopic characterization of the higher plant cell wall and its components * Case studies of nano drug delivery systems using engineered dendrimers * AFM techniques for studying living cells * Investigating the intermolecular forces of leukocyte adhesion molecules * Protein-protein interactions * Micromechanical properties of lipid bilayers and vesicles The text concludes with four chapters that examine new and emerging approaches in the use of force microscopy in biology and medicine. This text is ideal for advanced undergraduate and graduate students and researchers in cell and molecular biology, genetics, genomics, physiology, neuroscience, biophysics, and biochemistry. Not only does it provide the theory, but also practical considerations such as the selection of the right tools and approach.

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Author : Gerd Kaupp
Publisher : Springer Science & Business Media
ISBN 13 : 3540284729
Total Pages : 302 pages
Book Rating : 4.5/5 (42 download)

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Book Synopsis Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching by : Gerd Kaupp

Download or read book Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Scanning Probe Microscopy

Author : Bert Voigtländer
Publisher : Springer
ISBN 13 : 3662452405
Total Pages : 375 pages
Book Rating : 4.6/5 (624 download)

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Book Synopsis Scanning Probe Microscopy by : Bert Voigtländer

Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Atomic Force Microscopy

Author : Nuno C. Santos
Publisher : Humana
ISBN 13 : 9781493994076
Total Pages : 372 pages
Book Rating : 4.9/5 (94 download)

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Book Synopsis Atomic Force Microscopy by : Nuno C. Santos

Download or read book Atomic Force Microscopy written by Nuno C. Santos and published by Humana. This book was released on 2019-12-10 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls. Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.