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Layout Aware Modeling And Analysis Methodologies For Transient Radiation Effects On Integrated Circuit Electronics
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Book Synopsis Layout-aware Modeling and Analysis Methodologies for Transient Radiation Effects on Integrated Circuit Electronics by : Jeffrey Scott Kauppila
Download or read book Layout-aware Modeling and Analysis Methodologies for Transient Radiation Effects on Integrated Circuit Electronics written by Jeffrey Scott Kauppila and published by . This book was released on 2015 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Radiation Effects on Integrated Circuits and Systems for Space Applications by : Raoul Velazco
Download or read book Radiation Effects on Integrated Circuits and Systems for Space Applications written by Raoul Velazco and published by Springer. This book was released on 2019-04-10 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
Book Synopsis Radiation Tolerant Electronics by : Paul Leroux
Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Book Synopsis Radiation Effects of Advanced Electronic Devices and Circuits by : Yaqing Chi
Download or read book Radiation Effects of Advanced Electronic Devices and Circuits written by Yaqing Chi and published by . This book was released on 2024-06-27 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: As integrated circuit technologies continue to scale down and electronic devices become more complex, their susceptibility to ionizing radiation has introduced numerous exciting challenges, anticipated to drive research over the next decade. Consequently, new solutions are necessary to mitigate radiation sensitivity in advanced devices and integrated circuits. The aim of this reprint is to disclose the basic mechanisms of radiation effects for advanced devices and the breakthrough of new solutions to assess and mitigate radiation sensitivity in advanced devices and integrated circuits. This reprint presents new modeling approaches that predict how radiation impacts electronic devices and circuits. Accurate models are essential for designing devices that can tolerate radiation without significant performance degradation. We also focus on the innovative design and fabrication techniques that enhance the radiation tolerance of integrated circuits. Moreover, some discussions highlight new testing protocols and methodologies that provide more accurate and comprehensive evaluations of radiation hardness, as well as the latest advancements and trends that are of particular interest to researchers and professionals in the radiation effects community. Overall, this issue offers valuable insights into the challenges and opportunities in this rapidly evolving field, highlighting the critical importance of continued innovation and collaboration to address the complex problems posed by radiation in modern electronics.
Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Dan M. Fleetwood
Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
Book Synopsis Ionizing Radiation Effects in Electronics by : Marta Bagatin
Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Book Synopsis Transient-radiation Effects on Electronics Handbook by : Richard K. Thatcher
Download or read book Transient-radiation Effects on Electronics Handbook written by Richard K. Thatcher and published by . This book was released on 1967 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.
Book Synopsis Radiation Tolerant Electronics, Volume II by : Paul LeRoux
Download or read book Radiation Tolerant Electronics, Volume II written by Paul LeRoux and published by Mdpi AG. This book was released on 2023-01-16 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade. After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects.
Book Synopsis Multi-scale Modeling of Radiation Effects for Emerging Space Electronics by : Victor Malherbe
Download or read book Multi-scale Modeling of Radiation Effects for Emerging Space Electronics written by Victor Malherbe and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The effects of cosmic radiation on electronics have been studied since the early days of space exploration, given the severe reliability constraints arising from harsh space environments. However, recent evolutions in the space industry landscape are changing radiation effects practices and methodologies, with mainstream technologies becoming increasingly attractive for radiation-hardened integrated circuits. Due to their high operating frequencies, new transistor architectures, and short rad-hard development times, chips manufactured in latest CMOS processes pose a variety of challenges, both from an experimental standpoint and for modeling perspectives. This work thus focuses on simulating single-event upsets and transients in advanced FD-SOI and bulk silicon processes.The soft-error response of 28 nm FD-SOI transistors is first investigated through TCAD simulations, allowing to develop two innovative models for radiation-induced currents in FD-SOI. One of them is mainly behavioral, while the other captures complex phenomena, such as parasitic bipolar amplification and circuit feedback effects, from first semiconductor principles and in agreement with detailed TCAD simulations.These compact models are then interfaced to a complete Monte Carlo Soft-Error Rate (SER) simulation platform, leading to extensive validation against experimental data collected on several test vehicles under accelerated particle beams. Finally, predictive simulation studies are presented on bit-cells, sequential and combinational logic gates in 28 nm FD-SOI and 65 nm bulk Si, providing insights into the mechanisms that contribute to the SER of modern integrated circuits in orbit.
Book Synopsis Analysis of Radiation Induced Coupling Effects Between Integrated Circuit Elements by : F. Frankovsky
Download or read book Analysis of Radiation Induced Coupling Effects Between Integrated Circuit Elements written by F. Frankovsky and published by . This book was released on 1967 with total page 55 pages. Available in PDF, EPUB and Kindle. Book excerpt: The report describes the investigation of several elements of an integrated circuit model in the initial phase of a program to analyze pulsed ionizing radiation effects on these elements. The radiation effects on silicon dioxide and semiconductor structures incorporating silicon-dioxide layers are considered. Physical and mathematical models are developed for this analysis. A SCEPTRE simulation was developed to solve the equations of the mathematical model. Experimental techniques are established for future dielectric studies under this program. Also analyzed is the isolation diffusion across the intersection of the NPN or PNP junctions of an isolation diffusion model. IBM recommends that no further effort be expended in this analysis. The transient radiation behavior of a junction FET is reviewed and a synthesis of an equivalent circuit model is described. (Author).
Book Synopsis Integrated Time-Based Signal Processing Circuits for Harsh Radiation Environments by : Arijit Karmakar
Download or read book Integrated Time-Based Signal Processing Circuits for Harsh Radiation Environments written by Arijit Karmakar and published by Springer Nature. This book was released on 2023-11-13 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the most recent, advanced methods for designing mixed-signal integrated circuits, for radiation-hardened sensor readouts (capacitive) and frequency synthesizers (quadrature, digitally controlled oscillators and all-digital PLL etc.). The authors discuss the ionizing radiation sources, complex failure mechanisms as well as several mitigation strategies for avoiding such failures. Readers will benefit from an introduction to the essential theory and fundamentals of ionizing radiation and time-based signal processing, with the details of the implementation of several radiation-hardened IC prototypes. The radiation-hardening methods and solutions described are supported by theory and experimental data with, underlying tradeoffs. Discusses the basics of time-based signal processing and its effectiveness in mitigating ionizing radiation Provides mitigation strategies and recommendations for reducing radiation induced effects in Integrated Circuits Includes coverage of devices used in measuring radiation, focusing on semiconductor-based radiation sensors
Book Synopsis Radiation Tolerant Electronics, Volume II. by : Paul Leroux
Download or read book Radiation Tolerant Electronics, Volume II. written by Paul Leroux and published by . This book was released on 2023 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade.After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects.
Book Synopsis Radiation Effects on Embedded Systems by : Raoul Velazco
Download or read book Radiation Effects on Embedded Systems written by Raoul Velazco and published by Springer Science & Business Media. This book was released on 2007-06-19 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Book Synopsis Handbook of Modeling for Circuit Analysis Including Radiation Effects by :
Download or read book Handbook of Modeling for Circuit Analysis Including Radiation Effects written by and published by . This book was released on 1979 with total page 718 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook is a compilation and organization of previous research in computer modeling of semiconductor devices. It is designed to serve as a reference for the analyst who must analyze the effects of nuclear radiation on electronic circuits. It uses a modular approach wherein the analyst uses the simplest model which will yield the desired accuracy. The latest technology in representing second order effects is included in the handbook. The organization of the handbook proceeds from diodes to transistors, MOSFETs, IFETs, SCRs, UJTs, transformers and integrated circuits. The final chapter presents examples of computer aided analyses. (Author).
Book Synopsis Analysis and Modeling Methods for Predicting Functional Robustness of Integrated Circuits During Fast Transient Events by : Rémi Bèges
Download or read book Analysis and Modeling Methods for Predicting Functional Robustness of Integrated Circuits During Fast Transient Events written by Rémi Bèges and published by . This book was released on 2017 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Miniaturization of electronic circuits continues nowadays with the more recent technology nodes being applied to diverse fields of application such as automotive. Very dense and small integrated circuits are interesting for economic reasons, because they are cheaper to manufacture in mass and can pack more functionalities with elevated performances. The counterpart of size reduction is integrated circuits becoming more fragile electrically. In the automotive world, the new trend of fully autonomous driving is seeing tremendous progress recently. Autonomous vehicles must take decisions and perform critical actions such as braking or steering the wheel. Those decisions are taken by electronic modules, that have now very high responsibilities with regards of our safety. It is important to ensure that those modules will operate no matter the kind of disturbances they can be exposed to. The automotive world is a quite harsh environment for electronic systems. A major source of electrical stress is called the Electrostatic Discharge (ESD). It is a very sudden flow of electricity of large amplitude capable of destroying electronic components, or disturb them during their normal operation. This research focuses on functional failures where functionality can be temporarily lost after an ESD with various impact on the vehicle. To guarantee before manufacturing that a module and its components will perform their duty correctly, new analysis and prediction methods are required against soft-failures caused by electrostatic discharges. In this research, different approaches have been explored and proposed towards that goal. First, a modelling method for reproducing the ESD waveforms from the test generator up to the integrated circuit input is presented. It is based on a hierarchical approach where each element of the system is modelled individually, then added to the complete setup model. A practical case of functional failure at silicon-level is analyzed using simulation tools. To acquire more data on this fault, a testchip has been designed. It contains on-chip monitoring structures to measure voltage and current, and monitor function behavior directly at silicon-level. The last part of this research details different analysis methods developed for identifying efficiently functional weaknesses. The methods rely heavily on simulation tools, and prototypes have been implemented to prove the initial concepts. The first method models each function inside the chip individually, using behavioral models, then enables to connect the models together to deduce the full function's robustness. It enables hierarchical analysis of complex integrated circuit designs, to identify potential weak spots inside the circuit that could require more shielding or protection. The second method is focused on constructing equivalent electrical black box models of integrated circuit functions. The goal is to model the IC with a behavioral, black-box model capable of reproducing waveforms in powered conditions during the ESD. In summary, this research work has led to the development of several hardware and software prototypes. It has also highlighted important modelling challenges to solve in future works to achieve better functional robustness against electrostatic discharges.
Book Synopsis Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices by : D. C. Jones
Download or read book Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices written by D. C. Jones and published by . This book was released on 1963 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by : Eishi H. Ibe
Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2014-11-26 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide varietyof radiation fields and their effects on the electronic devices andsystems. The author covers faults and failures in ULSI devicesinduced by a wide variety of radiation fields, including electrons,alpha-rays, muons, gamma rays, neutrons and heavy ions. Readerswill learn how to make numerical models from physical insights, todetermine the kind of mathematical approaches that should beimplemented to analyze radiation effects. A wide variety ofprediction, detection, characterization and mitigation techniquesagainst soft-errors are reviewed and discussed. The author showshow to model sophisticated radiation effects in condensed matter inorder to quantify and control them, and explains how electronicsystems including servers and routers are shut down due toenvironmental radiation. Provides an understanding of how electronic systems are shutdown due to environmental radiation by constructing physical modelsand numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the backgroundphysics to the topic followed by various modelling techniques, andchapter summary Written by a widely-recognized authority in soft-errors inelectronic devices Code samples available for download from the CompanionWebsite This book is targeted at researchers and graduate students innuclear and space radiation, semiconductor physics and electrondevices, as well as other areas of applied physics modelling.Researchers and students interested in how a variety of physicalphenomena can be modelled and numerically treated will also findthis book to present helpful methods.
