Latchup in Dielectrically Isolated Integrated Circuits

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Publisher :
ISBN 13 :
Total Pages : 176 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Latchup in Dielectrically Isolated Integrated Circuits by : Mayrant Simons

Download or read book Latchup in Dielectrically Isolated Integrated Circuits written by Mayrant Simons and published by . This book was released on 1969 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Physics and Modeling of Latch-up and CMOS Integrated Circuits

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Publisher :
ISBN 13 :
Total Pages : 344 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis The Physics and Modeling of Latch-up and CMOS Integrated Circuits by : Donald B. Estreich

Download or read book The Physics and Modeling of Latch-up and CMOS Integrated Circuits written by Donald B. Estreich and published by . This book was released on 1980 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:

High Voltage Integrated Circuits

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Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 384 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis High Voltage Integrated Circuits by : B. Jayant Baliga

Download or read book High Voltage Integrated Circuits written by B. Jayant Baliga and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1988 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: Very Good,No Highlights or Markup,all pages are intact.

Nuclear Science Abstracts

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Publisher :
ISBN 13 :
Total Pages : 1462 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis Nuclear Science Abstracts by :

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1973 with total page 1462 pages. Available in PDF, EPUB and Kindle. Book excerpt: NSA is a comprehensive collection of international nuclear science and technology literature for the period 1948 through 1976, pre-dating the prestigious INIS database, which began in 1970. NSA existed as a printed product (Volumes 1-33) initially, created by DOE's predecessor, the U.S. Atomic Energy Commission (AEC). NSA includes citations to scientific and technical reports from the AEC, the U.S. Energy Research and Development Administration and its contractors, plus other agencies and international organizations, universities, and industrial and research organizations. References to books, conference proceedings, papers, patents, dissertations, engineering drawings, and journal articles from worldwide sources are also included. Abstracts and full text are provided if available.

A Proposal for Dielectric Isolation in Integrated Circuits

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Publisher :
ISBN 13 :
Total Pages : 44 pages
Book Rating : 4.:/5 (216 download)

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Book Synopsis A Proposal for Dielectric Isolation in Integrated Circuits by : Alan L. Conley

Download or read book A Proposal for Dielectric Isolation in Integrated Circuits written by Alan L. Conley and published by . This book was released on 1967 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Dielectric Isolation Technology for Bipolar and MOS Integrated Circuits

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Publisher :
ISBN 13 :
Total Pages : 219 pages
Book Rating : 4.:/5 (123 download)

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Book Synopsis Dielectric Isolation Technology for Bipolar and MOS Integrated Circuits by : Phillip William Barth

Download or read book Dielectric Isolation Technology for Bipolar and MOS Integrated Circuits written by Phillip William Barth and published by . This book was released on 1980 with total page 219 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

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Publisher : World Scientific
ISBN 13 : 9789812794703
Total Pages : 354 pages
Book Rating : 4.7/5 (947 download)

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Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Dan M. Fleetwood

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."

Advanced CMOS Process Technology

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Publisher : Elsevier
ISBN 13 : 0323156800
Total Pages : 305 pages
Book Rating : 4.3/5 (231 download)

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Book Synopsis Advanced CMOS Process Technology by : J Pimbley

Download or read book Advanced CMOS Process Technology written by J Pimbley and published by Elsevier. This book was released on 2012-12-02 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced CMOS Process Technology is part of the VLSI Electronics Microstructure Science series. The main topic of this book is complementary metal-oxide semiconductor or CMOS technology, which plays a significant part in the electronics systems. The topics covered in this book range from metallization, isolation techniques, reliability, and yield. The volume begins with an introductory chapter that discusses the microelectronics revolution of the 20th century. Then Chapter 2 puts focus on the CMOS devices and circuit background, discussing CMOS capacitors and field effect transistors. Metallization topics and concepts are covered in Chapter 3, while isolation techniques are tackled in Chapter 4. Long-term reliability of CMOS is the topic covered in Chapter 5. Finally, the ability of semiconductor technology to yield circuits is discussed in Chapter 6. The book is particularly addressed to engineers, scientists, and technical managers.

Integrated Circuit Design for Radiation Environments

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Publisher : John Wiley & Sons
ISBN 13 : 1119966345
Total Pages : 404 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Integrated Circuit Design for Radiation Environments by : Stephen J. Gaul

Download or read book Integrated Circuit Design for Radiation Environments written by Stephen J. Gaul and published by John Wiley & Sons. This book was released on 2019-12-31 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.

Improvement of Integrated Circuit Performance Using Dielectric Isolation Techniques

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Publisher :
ISBN 13 :
Total Pages : 106 pages
Book Rating : 4.:/5 (835 download)

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Book Synopsis Improvement of Integrated Circuit Performance Using Dielectric Isolation Techniques by : Andrew F. McKelvey

Download or read book Improvement of Integrated Circuit Performance Using Dielectric Isolation Techniques written by Andrew F. McKelvey and published by . This book was released on 1969 with total page 106 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Analysis and Design of Integrated Circuits

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Publisher :
ISBN 13 :
Total Pages : 592 pages
Book Rating : 4.:/5 (35 download)

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Book Synopsis Analysis and Design of Integrated Circuits by : Motorola, inc. Semiconductor Products Division

Download or read book Analysis and Design of Integrated Circuits written by Motorola, inc. Semiconductor Products Division and published by . This book was released on 1967 with total page 592 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fernsprechtechnik, Telefonie (Technik).

Single Event Latchup

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ISBN 13 :
Total Pages : 121 pages
Book Rating : 4.:/5 (815 download)

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Book Synopsis Single Event Latchup by : Nathaniel Anson Dodds

Download or read book Single Event Latchup written by Nathaniel Anson Dodds and published by . This book was released on 2012 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Microcircuit Reliability Bibliography

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Publisher :
ISBN 13 :
Total Pages : 412 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Microcircuit Reliability Bibliography by :

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings of the ... International Symposium on Semiconductor Wafer Bonding

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Publisher :
ISBN 13 :
Total Pages : 524 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Proceedings of the ... International Symposium on Semiconductor Wafer Bonding by :

Download or read book Proceedings of the ... International Symposium on Semiconductor Wafer Bonding written by and published by . This book was released on 1991 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Introduction to Microfabrication

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Publisher : John Wiley & Sons
ISBN 13 : 0470020563
Total Pages : 424 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Introduction to Microfabrication by : Sami Franssila

Download or read book Introduction to Microfabrication written by Sami Franssila and published by John Wiley & Sons. This book was released on 2005-01-28 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microfabrication is the key technology behind integrated circuits,microsensors, photonic crystals, ink jet printers, solar cells andflat panel displays. Microsystems can be complex, but the basicmicrostructures and processes of microfabrication are fairlysimple. Introduction to Microfabrication shows how the commonmicrofabrication concepts can be applied over and over again tocreate devices with a wide variety of structures andfunctions. Featuring: * A comprehensive presentation of basic fabrication processes * An emphasis on materials and microstructures, rather than devicephysics * In-depth discussion on process integration showing how processes,materials and devices interact * A wealth of examples of both conceptual and real devices Introduction to Microfabrication includes 250 homework problems forstudents to familiarise themselves with micro-scale materials,dimensions, measurements, costs and scaling trends. Both researchand manufacturing topics are covered, with an emphasis on silicon,which is the workhorse of microfabrication. This book will serve as an excellent first text for electricalengineers, chemists, physicists and materials scientists who wishto learn about microstructures and microfabrication techniques,whether in MEMS, microelectronics or emerging applications.

The Impact of Very High Performance Integrated Circuits on Radar, Guidance and Avionics Systems

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Publisher :
ISBN 13 :
Total Pages : 456 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis The Impact of Very High Performance Integrated Circuits on Radar, Guidance and Avionics Systems by : North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development. Avionics Panel. Symposium

Download or read book The Impact of Very High Performance Integrated Circuits on Radar, Guidance and Avionics Systems written by North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development. Avionics Panel. Symposium and published by . This book was released on 1985 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Lateral Power Transistors in Integrated Circuits

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Publisher : Springer
ISBN 13 : 3319005006
Total Pages : 235 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Lateral Power Transistors in Integrated Circuits by : Tobias Erlbacher

Download or read book Lateral Power Transistors in Integrated Circuits written by Tobias Erlbacher and published by Springer. This book was released on 2014-10-08 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book summarizes and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power electronic applications. In its first part, the book motivates the necessity for lateral power transistors by a top-down approach: First, it presents typical energy conversion applications in modern industrial, automotive and consumer electronics. Next, it introduces common circuit topologies suitable for these applications, and discusses the feasibility for monolithic integration. Finally, the combination of power and logic functionality on a single chip is motivated and the requirements and limitations for the power semiconductor devices are deduced. The second part describes the evolution of lateral power transistors over the past decades from the simple pin-type concept to double-acting RESURF topologies. It describes the principle of operation for these LDMOS devices and discusses limitations of lateral power devices. Moreover, figures-of-merit are presented which can be used to evaluate the performance of the novel lateral power transistors described in this book with respect to the LDMOS devices. In the last part, [..] the fundamental physical concepts including charge compensation and trench gate topologies are discussed. Also, the status of research in LDMOS devices on silicon carbide is presented. Advantages and drawbacks for each of these integration approaches are summarized, and the feasibility with respect to power electronic applications is evaluated.