Introduction to IDDQ Testing

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Publisher : Springer Science & Business Media
ISBN 13 : 146156137X
Total Pages : 336 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Introduction to IDDQ Testing by : S. Chakravarty

Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

IDDQ Testing of VLSI Circuits

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1461531462
Total Pages : 121 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis IDDQ Testing of VLSI Circuits by : Ravi K. Gulati

Download or read book IDDQ Testing of VLSI Circuits written by Ravi K. Gulati and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Iddq Testing for CMOS VLSI

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Author :
Publisher : Artech House Publishers
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Iddq Testing for CMOS VLSI by : Rochit Rajsuman

Download or read book Iddq Testing for CMOS VLSI written by Rochit Rajsuman and published by Artech House Publishers. This book was released on 1995 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.

Introduction to Microelectronics to Nanoelectronics

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Publisher : CRC Press
ISBN 13 : 1000223094
Total Pages : 350 pages
Book Rating : 4.0/5 (2 download)

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Book Synopsis Introduction to Microelectronics to Nanoelectronics by : Manoj Kumar Majumder

Download or read book Introduction to Microelectronics to Nanoelectronics written by Manoj Kumar Majumder and published by CRC Press. This book was released on 2020-11-25 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt: Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VLSI fabrication, designing (analog and digital), on-chip interconnect modeling culminating with emerging non-silicon/ nano devices. It gives detailed description of both theoretical as well as industry standard HSPICE, Verilog, Cadence simulation based real-time modeling approach with focus on fabrication of bulk and nano-devices. Each chapter of this proposed title starts with a brief introduction of the presented topic and ends with a summary indicating the futuristic aspect including practice questions. Aimed at researchers and senior undergraduate/graduate students in electrical and electronics engineering, microelectronics, nanoelectronics and nanotechnology, this book: Provides broad and comprehensive coverage from Microelectronics to Nanoelectronics including design in analog and digital electronics. Includes HDL, and VLSI design going into the nanoelectronics arena. Discusses devices, circuit analysis, design methodology, and real-time simulation based on industry standard HSPICE tool. Explores emerging devices such as FinFETs, Tunnel FETs (TFETs) and CNTFETs including their circuit co-designing. Covers real time illustration using industry standard Verilog, Cadence and Synopsys simulations.

ISTFA 1997: International Symposium for Testing and Failure Analysis

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Author :
Publisher : ASM International
ISBN 13 : 1615030824
Total Pages : 310 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis ISTFA 1997: International Symposium for Testing and Failure Analysis by : Grace M. Davidson

Download or read book ISTFA 1997: International Symposium for Testing and Failure Analysis written by Grace M. Davidson and published by ASM International. This book was released on 1997-01-01 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in Electronic Testing

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Publisher : Springer Science & Business Media
ISBN 13 : 0387294090
Total Pages : 431 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Advances in Electronic Testing by : Dimitris Gizopoulos

Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Testing of Digital Systems

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Publisher : Cambridge University Press
ISBN 13 : 9781139437431
Total Pages : 1022 pages
Book Rating : 4.4/5 (374 download)

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Book Synopsis Testing of Digital Systems by : N. K. Jha

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Nanometer CMOS ICs

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Author :
Publisher : Springer
ISBN 13 : 3319475975
Total Pages : 611 pages
Book Rating : 4.3/5 (194 download)

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Book Synopsis Nanometer CMOS ICs by : Harry J.M. Veendrick

Download or read book Nanometer CMOS ICs written by Harry J.M. Veendrick and published by Springer. This book was released on 2017-04-28 with total page 611 pages. Available in PDF, EPUB and Kindle. Book excerpt: This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.

Semiconductor Material and Device Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Principles of Testing Electronic Systems

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Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Digest of Papers

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Author :
Publisher :
ISBN 13 :
Total Pages : 138 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Digest of Papers by :

Download or read book Digest of Papers written by and published by . This book was released on 1997 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Introduction to VLSI Systems

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Author :
Publisher : CRC Press
ISBN 13 : 1439897328
Total Pages : 890 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Introduction to VLSI Systems by : Ming-Bo Lin

Download or read book Introduction to VLSI Systems written by Ming-Bo Lin and published by CRC Press. This book was released on 2011-11-28 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advance of semiconductors and ubiquitous computing, the use of system-on-a-chip (SoC) has become an essential technique to reduce product cost. With this progress and continuous reduction of feature sizes, and the development of very large-scale integration (VLSI) circuits, addressing the harder problems requires fundamental understanding

SOI Design

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Publisher : Springer Science & Business Media
ISBN 13 : 0306481618
Total Pages : 392 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis SOI Design by : Andrew Marshall

Download or read book SOI Design written by Andrew Marshall and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: This title introduces state-of-the-art design principles for SOI circuit design, and is primarily concerned with circuit-related issues. It considers SOI material in terms of implementation that is promising or has been used elsewhere in circuit development, with historical perspective where appropriate.

The Electronic Design Automation Handbook

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Publisher : Springer Science & Business Media
ISBN 13 : 0387735437
Total Pages : 655 pages
Book Rating : 4.3/5 (877 download)

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Book Synopsis The Electronic Design Automation Handbook by : Dirk Jansen

Download or read book The Electronic Design Automation Handbook written by Dirk Jansen and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: When I attended college we studied vacuum tubes in our junior year. At that time an average radio had ?ve vacuum tubes and better ones even seven. Then transistors appeared in 1960s. A good radio was judged to be one with more thententransistors. Latergoodradioshad15–20transistors and after that everyone stopped counting transistors. Today modern processors runing personal computers have over 10milliontransistorsandmoremillionswillbeaddedevery year. The difference between 20 and 20M is in complexity, methodology and business models. Designs with 20 tr- sistors are easily generated by design engineers without any tools, whilst designs with 20M transistors can not be done by humans in reasonable time without the help of Prof. Dr. Gajski demonstrates the Y-chart automation. This difference in complexity introduced a paradigm shift which required sophisticated methods and tools, and introduced design automation into design practice. By the decomposition of the design process into many tasks and abstraction levels the methodology of designing chips or systems has also evolved. Similarly, the business model has changed from vertical integration, in which one company did all the tasks from product speci?cation to manufacturing, to globally distributed, client server production in which most of the design and manufacturing tasks are outsourced.

Thermal Testing of Integrated Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 1475736355
Total Pages : 212 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Thermal Testing of Integrated Circuits by : J. Altet

Download or read book Thermal Testing of Integrated Circuits written by J. Altet and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

Proceedings

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Author :
Publisher :
ISBN 13 :
Total Pages : 584 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Proceedings by :

Download or read book Proceedings written by and published by . This book was released on 2002 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Asian Test Symposium

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Author :
Publisher :
ISBN 13 :
Total Pages : 504 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Asian Test Symposium by :

Download or read book Asian Test Symposium written by and published by . This book was released on 2004 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: