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Industrial Applications Of X Ray Diffraction
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Book Synopsis Industrial Applications of X-Ray Diffraction by : Frank Smith
Download or read book Industrial Applications of X-Ray Diffraction written by Frank Smith and published by CRC Press. This book was released on 1999-09-22 with total page 1026 pages. Available in PDF, EPUB and Kindle. Book excerpt: By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.
Book Synopsis Industrial Applications of X-Ray Diffraction by : Frank Smith
Download or read book Industrial Applications of X-Ray Diffraction written by Frank Smith and published by CRC Press. This book was released on 1999-09-22 with total page 1024 pages. Available in PDF, EPUB and Kindle. Book excerpt: By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major
Book Synopsis X-Ray Diffraction Imaging by : Joel Greenberg
Download or read book X-Ray Diffraction Imaging written by Joel Greenberg and published by CRC Press. This book was released on 2018-11-02 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. Teaches novel methods for X-ray diffraction imaging Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms Features state-of-the-art work of international authors from both academia and industry. Includes practical applications in the medical, industrial, and security sectors
Book Synopsis Advanced X-ray Techniques in Research and Industry by : Ashok Kumar Singh
Download or read book Advanced X-ray Techniques in Research and Industry written by Ashok Kumar Singh and published by IOS Press. This book was released on 2005 with total page 604 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
Book Synopsis Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis by :
Download or read book Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis written by and published by . This book was released on 1957 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book X-Ray Imaging written by Harry E. Martz and published by CRC Press. This book was released on 2016-10-26 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt: While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.
Book Synopsis Two-dimensional X-ray Diffraction by : Bob B. He
Download or read book Two-dimensional X-ray Diffraction written by Bob B. He and published by John Wiley & Sons. This book was released on 2018-05-18 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.
Book Synopsis Radiation Source Use and Replacement by : National Research Council
Download or read book Radiation Source Use and Replacement written by National Research Council and published by National Academies Press. This book was released on 2008-05-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the United States there are several thousand devices containing high-activity radiation sources licensed for use in areas ranging from medical uses such as cancer therapy to safety uses such as testing of structures and industrial equipment. Those radiation sources are licensed by the U.S. Nuclear Regulatory Commission and state agencies. Concerns have been raised about the safety and security of the radiation sources, particularly amid fears that they could be used to create dirty bombs, or radiological dispersal device (RDD). In response to a request from Congress, the U.S. Nuclear Regulatory Commission asked the National Research Council to conduct a study to review the uses of high-risk radiation sources and the feasibility of replacing them with lower risk alternatives. The study concludes that the U.S. government should consider factors such as potential economic consequences of misuse of the radiation sources into its assessments of risk. Although the committee found that replacements of most sources are possible, it is not economically feasible in some cases. The committee recommends that the U.S. government take steps to in the near term to replace radioactive cesium chloride radiation sources, a potential "dirty bomb" ingredient used in some medical and research equipment, with lower-risk alternatives. The committee further recommends that longer term efforts be undertaken to replace other sources. The book presents a number of options for making those replacements.
Download or read book X-Ray Diffraction written by B. E. Warren and published by Courier Corporation. This book was released on 2012-05-23 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Download or read book Polymer Morphology written by Qipeng Guo and published by John Wiley & Sons. This book was released on 2016-05-16 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: With a focus on structure-property relationships, this book describes how polymer morphology affects properties and how scientists can modify them. The book covers structure development, theory, simulation, and processing; and discusses a broad range of techniques and methods. • Provides an up-to-date, comprehensive introduction to the principles and practices of polymer morphology • Illustrates major structure types, such as semicrystalline morphology, surface-induced polymer crystallization, phase separation, self-assembly, deformation, and surface topography • Covers a variety of polymers, such as homopolymers, block copolymers, polymer thin films, polymer blends, and polymer nanocomposites • Discusses a broad range of advanced and novel techniques and methods, like x-ray diffraction, thermal analysis, and electron microscopy and their applications in the morphology of polymer materials
Download or read book X-ray Diffraction written by Kaimin Shih and published by Nova Science Publishers. This book was released on 2013 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries. Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with co-ordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination.
Book Synopsis The Industrial Applications of X-rays by : Percival Henry Sydney Kempton
Download or read book The Industrial Applications of X-rays written by Percival Henry Sydney Kempton and published by . This book was released on 1922 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book X-Ray Imaging written by Harry E. Martz and published by CRC Press. This book was released on 2016-10-26 with total page 905 pages. Available in PDF, EPUB and Kindle. Book excerpt: While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.
Book Synopsis X-Ray Metrology in Semiconductor Manufacturing by : D. Keith Bowen
Download or read book X-Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Book Synopsis High Resolution X-Ray Diffractometry And Topography by : D.K. Bowen
Download or read book High Resolution X-Ray Diffractometry And Topography written by D.K. Bowen and published by CRC Press. This book was released on 1998-02-05 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda
Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Book Synopsis Introduction to X-Ray Powder Diffractometry by : Ron Jenkins
Download or read book Introduction to X-Ray Powder Diffractometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1996-07-12 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.
