IEEE Std 1003.1, 2004 Edition The Open Group Technical Standard. Base Specifications, Issue 6. Includes IEEE Std 1003.1-2001, IEEE Std 1003.1-2001/Cor 1-2002 and IEEE Std 1003.1-2001/Cor 2-2004. Shell

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ISBN 13 : 9780738140483
Total Pages : pages
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Book Synopsis IEEE Std 1003.1, 2004 Edition The Open Group Technical Standard. Base Specifications, Issue 6. Includes IEEE Std 1003.1-2001, IEEE Std 1003.1-2001/Cor 1-2002 and IEEE Std 1003.1-2001/Cor 2-2004. Shell by :

Download or read book IEEE Std 1003.1, 2004 Edition The Open Group Technical Standard. Base Specifications, Issue 6. Includes IEEE Std 1003.1-2001, IEEE Std 1003.1-2001/Cor 1-2002 and IEEE Std 1003.1-2001/Cor 2-2004. Shell written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

IEEE Std 1003.1-2001/Cor 1-2002. The Open Group Technical Standard Base Specifications, Issue 6: IEEE Standard for Information Technology - Portable Operating System Interface (POSIX) Technical Corrigendum 1

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IEEE Std 1003.1, 2004 Edition The Open Group Technical Standard. Base Specifications, Issue 6. Includes IEEE Std 1003.1-2001, IEEE Std 1003.1-2001

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ISBN 13 :
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Book Synopsis IEEE Std 1003.1, 2004 Edition The Open Group Technical Standard. Base Specifications, Issue 6. Includes IEEE Std 1003.1-2001, IEEE Std 1003.1-2001 by :

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IEEE Std 1003.1-2008/Cor 2-2016 (Corrigendum to IEEE Std 1003.1-2008) The Open Group Technical Standard Base Specifications, Issue 7

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ISBN 13 : 9781504421485
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IEEE Std 1003.1-2001 (Revision of IEEE Std 1003.1-1996 and IEEE Std 1003.2-1992)

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Book Synopsis IEEE Std 1003.1-2001 (Revision of IEEE Std 1003.1-1996 and IEEE Std 1003.2-1992) by :

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IEEE Standard for Information Technology - Telecommunications and Information Exchange Between Systems - Local and Metropolitan Area Networks - Specific Requirements Part 15.3

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ISBN 13 : 9780738160511
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IEEE Std 2003.1b-2000

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ISBN 13 : 9780738119700
Total Pages : 370 pages
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Download or read book IEEE Std 2003.1b-2000 written by and published by . This book was released on 2000 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: This standard defines the test method specifications for IEEE Std 1003.1b-1993 (based on the document corresponding to the merger of IEEE Std 1003.1-1990 and IEEE Std 1003.1b-1993). The test method specifications consist of assertions to be tested and related test procedures. As an amendment to IEEE Std 1003.1-1990, this standard is structured to amend those portions of IEEE Std 2003.1-1992 (4) (the test method specification for IEEE Std 1003.1-1990) that correspond to the amended parts of IEEE Std 1003.1-1990. This standard is aimed primarily at providers of test methods for IEEE Std 1003.1b-1993 and at implementers of IEEE Std 1003.1b-1993.

1003.1-2001 - IEEE Standard for IEEE Information Technology - Portable Operating System Interface

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ISBN 13 :
Total Pages : 0 pages
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Book Synopsis 1003.1-2001 - IEEE Standard for IEEE Information Technology - Portable Operating System Interface by : Institute of Electrical and Electronics Engineers (IEEE)

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IEEE Std 1003.1, 2004 Edition: IEEE Standard for Information Technology - Portable Operating System Interface (POSIX(R)) - Base Definitions

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IEEE Std 1003.1-2001. Base Definitions, Issue 6

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IEEE Std 802.11b-1999/Cor 1-2001

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IEEE Std 1003.1, 2013 Edition

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National Library of Medicine Programs and Services

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ISBN 13 :
Total Pages : 88 pages
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System Interfaces and Headers

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File System Forensic Analysis

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Publisher : Addison-Wesley Professional
ISBN 13 : 0134439546
Total Pages : 895 pages
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Book Synopsis File System Forensic Analysis by : Brian Carrier

Download or read book File System Forensic Analysis written by Brian Carrier and published by Addison-Wesley Professional. This book was released on 2005-03-17 with total page 895 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Definitive Guide to File System Analysis: Key Concepts and Hands-on Techniques Most digital evidence is stored within the computer's file system, but understanding how file systems work is one of the most technically challenging concepts for a digital investigator because there exists little documentation. Now, security expert Brian Carrier has written the definitive reference for everyone who wants to understand and be able to testify about how file system analysis is performed. Carrier begins with an overview of investigation and computer foundations and then gives an authoritative, comprehensive, and illustrated overview of contemporary volume and file systems: Crucial information for discovering hidden evidence, recovering deleted data, and validating your tools. Along the way, he describes data structures, analyzes example disk images, provides advanced investigation scenarios, and uses today's most valuable open source file system analysis tools—including tools he personally developed. Coverage includes Preserving the digital crime scene and duplicating hard disks for "dead analysis" Identifying hidden data on a disk's Host Protected Area (HPA) Reading source data: Direct versus BIOS access, dead versus live acquisition, error handling, and more Analyzing DOS, Apple, and GPT partitions; BSD disk labels; and Sun Volume Table of Contents using key concepts, data structures, and specific techniques Analyzing the contents of multiple disk volumes, such as RAID and disk spanning Analyzing FAT, NTFS, Ext2, Ext3, UFS1, and UFS2 file systems using key concepts, data structures, and specific techniques Finding evidence: File metadata, recovery of deleted files, data hiding locations, and more Using The Sleuth Kit (TSK), Autopsy Forensic Browser, and related open source tools When it comes to file system analysis, no other book offers this much detail or expertise. Whether you're a digital forensics specialist, incident response team member, law enforcement officer, corporate security specialist, or auditor, this book will become an indispensable resource for forensic investigations, no matter what analysis tools you use.

Research Problems in Discrete Geometry

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Publisher : Springer Science & Business Media
ISBN 13 : 0387238158
Total Pages : 507 pages
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Book Synopsis Research Problems in Discrete Geometry by : Peter Brass

Download or read book Research Problems in Discrete Geometry written by Peter Brass and published by Springer Science & Business Media. This book was released on 2006-06-19 with total page 507 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the result of a 25-year-old project and comprises a collection of more than 500 attractive open problems in the field. The largely self-contained chapters provide a broad overview of discrete geometry, along with historical details and the most important partial results related to these problems. This book is intended as a source book for both professional mathematicians and graduate students who love beautiful mathematical questions, are willing to spend sleepless nights thinking about them, and who would like to get involved in mathematical research.

Integration of Functional Oxides with Semiconductors

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Publisher : Springer Science & Business Media
ISBN 13 : 146149320X
Total Pages : 284 pages
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Book Synopsis Integration of Functional Oxides with Semiconductors by : Alexander A. Demkov

Download or read book Integration of Functional Oxides with Semiconductors written by Alexander A. Demkov and published by Springer Science & Business Media. This book was released on 2014-02-20 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic devices and describes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, Integration of Functional Oxides with Semiconductors describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, ferroelectric and piezoelectric materials and the coupling between them will also be discussed. GaN, SiC, Si, GaAs and Ge semiconductors are covered within the context of optimizing next-generation device performance for monolithic device processing.