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Author : Ming Li
Publisher :
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.:/5 (246 download)
Download or read book High Resolution X-ray Scattering Investigations of II-VI Semiconductor Heterostructures written by Ming Li and published by . This book was released on 1998 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ullrich Pietsch
Publisher : Springer Science & Business Media
ISBN 13 : 1475740506
Total Pages : 410 pages
Book Rating : 4.4/5 (757 download)
Download or read book High-Resolution X-Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Author : Paul F. Fewster
Publisher : World Scientific
ISBN 13 : 1860941591
Total Pages : 303 pages
Book Rating : 4.8/5 (69 download)
Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.
Author : Giovanni Agostini
Publisher : Newnes
ISBN 13 : 044459549X
Total Pages : 829 pages
Book Rating : 4.4/5 (445 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Giovanni Agostini and published by Newnes. This book was released on 2013-04-11 with total page 829 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology. Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures
Author : Giovanni Agostini
Publisher : Elsevier
ISBN 13 : 0080558151
Total Pages : 501 pages
Book Rating : 4.0/5 (85 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Giovanni Agostini and published by Elsevier. This book was released on 2011-08-11 with total page 501 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors
Author : Emil S. Božin
Publisher : Elsevier Inc. Chapters
ISBN 13 : 0128083395
Total Pages : 48 pages
Book Rating : 4.1/5 (28 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Emil S. Božin and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615039953
Total Pages : 643 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2012 written by ASM International and published by ASM International. This book was released on 2012 with total page 643 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wen-Jih Lin
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (66 download)
Download or read book High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors written by Wen-Jih Lin and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 704 pages
Book Rating : 4.:/5 (31 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wen-Jih Lin
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (66 download)
Download or read book High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors written by Wen-Jih Lin and published by . This book was released on 1998 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Giuseppe Portale
Publisher : Elsevier Inc. Chapters
ISBN 13 : 0128083387
Total Pages : 87 pages
Book Rating : 4.1/5 (28 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Giuseppe Portale and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 87 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jeroen A. van Bokhoven
Publisher : John Wiley & Sons
ISBN 13 : 1118844238
Total Pages : 940 pages
Book Rating : 4.1/5 (188 download)
Download or read book X-Ray Absorption and X-Ray Emission Spectroscopy written by Jeroen A. van Bokhoven and published by John Wiley & Sons. This book was released on 2016-03-21 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Author : Claudio Ferrari
Publisher : Elsevier Inc. Chapters
ISBN 13 : 0128083360
Total Pages : 59 pages
Book Rating : 4.1/5 (28 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Claudio Ferrari and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 59 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Tobias Schülli
Publisher : Elsevier Inc. Chapters
ISBN 13 : 0128083379
Total Pages : 93 pages
Book Rating : 4.1/5 (28 download)
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Tobias Schülli and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 93 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zhiyong Ma
Publisher : CRC Press
ISBN 13 : 135173394X
Total Pages : 843 pages
Book Rating : 4.3/5 (517 download)
Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 843 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author :
Publisher :
ISBN 13 :
Total Pages : 812 pages
Book Rating : 4.3/5 (91 download)
Download or read book Physics Briefs written by and published by . This book was released on 1992 with total page 812 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Kiyoshi Ueda
Publisher : MDPI
ISBN 13 : 3038428795
Total Pages : 457 pages
Book Rating : 4.0/5 (384 download)
Download or read book X-Ray Free-Electron Laser written by Kiyoshi Ueda and published by MDPI. This book was released on 2018-07-04 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a printed edition of the Special Issue "X-Ray Free-Electron Laser" that was published in Applied Sciences
