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High Resolution Electron Microscopy Of Defects In Materials
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Author :Materials Research Society Publisher :Pittsburgh, Pa. : Materials Research Society ISBN 13 : Total Pages :424 pages Book Rating :4.3/5 (91 download)
Book Synopsis High Resolution Electron Microscopy of Defects in Materials: Volume 183 by : Materials Research Society
Download or read book High Resolution Electron Microscopy of Defects in Materials: Volume 183 written by Materials Research Society and published by Pittsburgh, Pa. : Materials Research Society. This book was released on 1990-08-10 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis In-Situ Electron Microscopy at High Resolution by :
Download or read book In-Situ Electron Microscopy at High Resolution written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis High-Resolution Electron Microscopy for Materials Science by : Daisuke Shindo
Download or read book High-Resolution Electron Microscopy for Materials Science written by Daisuke Shindo and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Book Synopsis High-Resolution Imaging and Spectrometry of Materials by : Manfred Rühle
Download or read book High-Resolution Imaging and Spectrometry of Materials written by Manfred Rühle and published by Springer Science & Business Media. This book was released on 2003-01-31 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
Book Synopsis In-situ Electron Microscopy at High Resolution by : Florian Banhart
Download or read book In-situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Book Synopsis Handbook of Microscopy for Nanotechnology by : Nan Yao
Download or read book Handbook of Microscopy for Nanotechnology written by Nan Yao and published by Springer Science & Business Media. This book was released on 2006-07-12 with total page 745 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Book Synopsis High Resolution Electron Microscopy of Defects in Materials: by : Robert Sinclair
Download or read book High Resolution Electron Microscopy of Defects in Materials: written by Robert Sinclair and published by Cambridge University Press. This book was released on 2014-06-05 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis High-Resolution Electron Microscopy by : John C. H. Spence
Download or read book High-Resolution Electron Microscopy written by John C. H. Spence and published by Oxford University Press. This book was released on 2009 with total page 425 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Book Synopsis High-Resolution Transmission Electron Microscopy by : Peter Buseck
Download or read book High-Resolution Transmission Electron Microscopy written by Peter Buseck and published by Oxford University Press. This book was released on 1989-02-02 with total page 670 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
Book Synopsis Characterisation of Radiation Damage by Transmission Electron Microscopy by : M.L Jenkins
Download or read book Characterisation of Radiation Damage by Transmission Electron Microscopy written by M.L Jenkins and published by CRC Press. This book was released on 2000-11-21 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Book Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz
Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2012-10-14 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Book Synopsis Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals by : Jie Feng
Download or read book Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals written by Jie Feng and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-dimensional characterization of defects is an essential step in the engineering of point defects to control the type, concentration, and spatial distribution of defects with nanometer-scale resolution to design materials with new functions and properties. High-resolution electron microscopy is becoming a general-purpose tool for characterizing several point defects with single-defect sensitivity and sub-unit cell spatial resolution in all three dimensions. Detectable defects include substitutional impurities, interstitial impurities, self-interstitials, and impurity-containing defect complexes. However, all the defects so far imaged at the single-defect level often increase the local electron scattering by 50% or more, and 3D imaging of defects that change column intensity less than 10%, such as single vacancies was only reported very recently. In the first part of this thesis, we demonstrated an approach for three-dimensional imaging of single vacancies using high precision quantitative high-angle annular dark-field Z-contrast scanning transmission electron microscopy. Vacancies are identified by both the reduction in scattered intensity created by the missing atom and the distortion of the surrounding atom positions. Vacancy positions are determined laterally to a unique lattice site in the image and in depth to within one of two lattice sites by dynamical diffraction effects. 35 single La vacancies are identified in images of a LaMnO3 thin film sample. The vacancies are randomly distributed in depth and correspond to a La vacancy concentration of 0.79%, which is consistent with the level of control of cation stoichiometry within our synthesis process (~1%) and with the equilibrium concentration of La vacancies under the film growth conditions. This method can be extended to detect other defects including impurities and defect clusters and these results represent a step forward in characterizing point defects in materials one at a time, at atomic resolution, matching our current capabilities in materials simulation and our growing control over defect distributions in synthesis. In the second parts of this thesis, I adapted the cut-edge Poisson denoising and machine learning algorithm into the four-dimensional STEM, which could potentially detect point defects that are undetectable by traditional STEM. We demonstrate that the iterative BM4D Poisson denoising algorithm could recover most of the image features corrupted by Poisson noise and increase the PSNR most. We also demonstrate that the convolutional neural network (VGG-16), trained on simulated PACBED data set, could accurately predict TEM sample thickness with> 99% accuracy within 100 nm with 2 nm thickness step.
Book Synopsis Experimental High-resolution Electron Microscopy by : John C. H. Spence
Download or read book Experimental High-resolution Electron Microscopy written by John C. H. Spence and published by Oxford University Press, USA. This book was released on 1988 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: The new edition of this highly practical microscopy guide covers a wider range of applications and includes a new chapter on associated techniques along with new material on high-resolution images of periodic structures.
Book Synopsis Transmission Electron Microscopy by : David B. Williams
Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Book Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz
Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2009-10-15 with total page 771 pages. Available in PDF, EPUB and Kindle. Book excerpt: This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Book Synopsis Electron Microscopy in the Study of Materials by : Philip James Grundy
Download or read book Electron Microscopy in the Study of Materials written by Philip James Grundy and published by Crane Russak, Incorporated. This book was released on 1976 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis High-Resolution Imaging and Spectrometry of Materials by : Frank Ernst
Download or read book High-Resolution Imaging and Spectrometry of Materials written by Frank Ernst and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
