High Quality Transition And Small Delay Fault Atpg

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Author : Sandeep K. Goel
Publisher : CRC Press
ISBN 13 : 1351833707
Total Pages : 266 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by : Sandeep K. Goel

Download or read book Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel and published by CRC Press. This book was released on 2017-12-19 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.

Test and Diagnosis for Small-Delay Defects

Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 1441982973
Total Pages : 228 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Test and Diagnosis for Small-Delay Defects by : Mohammad Tehranipoor

Download or read book Test and Diagnosis for Small-Delay Defects written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

High Quality Test Pattern Generation and Boolean Satisfiability

Author : Stephan Eggersglüß
Publisher : Springer Science & Business Media
ISBN 13 : 1441999760
Total Pages : 208 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis High Quality Test Pattern Generation and Boolean Satisfiability by : Stephan Eggersglüß

Download or read book High Quality Test Pattern Generation and Boolean Satisfiability written by Stephan Eggersglüß and published by Springer Science & Business Media. This book was released on 2012-02-01 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.

Nanometer Technology Designs

Author : Nisar Ahmed
Publisher : Springer Science & Business Media
ISBN 13 : 0387757287
Total Pages : 288 pages
Book Rating : 4.3/5 (877 download)

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Book Synopsis Nanometer Technology Designs by : Nisar Ahmed

Download or read book Nanometer Technology Designs written by Nisar Ahmed and published by Springer Science & Business Media. This book was released on 2010-02-26 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

VLSI-SoC: New Technology Enabler

Author : Carolina Metzler
Publisher : Springer Nature
ISBN 13 : 3030532739
Total Pages : 355 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis VLSI-SoC: New Technology Enabler by : Carolina Metzler

Download or read book VLSI-SoC: New Technology Enabler written by Carolina Metzler and published by Springer Nature. This book was released on 2020-07-22 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019. The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.

IEEE VLSI Test Symposium

Author :
Publisher :
ISBN 13 :
Total Pages : 498 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis IEEE VLSI Test Symposium by :

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Hardware Security

Author : Swarup Bhunia
Publisher : Morgan Kaufmann
ISBN 13 : 0128124784
Total Pages : 528 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Hardware Security by : Swarup Bhunia

Download or read book Hardware Security written by Swarup Bhunia and published by Morgan Kaufmann. This book was released on 2018-10-30 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardware Security: A Hands-On Learning Approach provides a broad, comprehensive and practical overview of hardware security that encompasses all levels of the electronic hardware infrastructure. It covers basic concepts like advanced attack techniques and countermeasures that are illustrated through theory, case studies and well-designed, hands-on laboratory exercises for each key concept. The book is ideal as a textbook for upper-level undergraduate students studying computer engineering, computer science, electrical engineering, and biomedical engineering, but is also a handy reference for graduate students, researchers and industry professionals. For academic courses, the book contains a robust suite of teaching ancillaries. Users will be able to access schematic, layout and design files for a printed circuit board for hardware hacking (i.e. the HaHa board) that can be used by instructors to fabricate boards, a suite of videos that demonstrate different hardware vulnerabilities, hardware attacks and countermeasures, and a detailed description and user manual for companion materials. - Provides a thorough overview of computer hardware, including the fundamentals of computer systems and the implications of security risks - Includes discussion of the liability, safety and privacy implications of hardware and software security and interaction - Gives insights on a wide range of security, trust issues and emerging attacks and protection mechanisms in the electronic hardware lifecycle, from design, fabrication, test, and distribution, straight through to supply chain and deployment in the field - A full range of instructor and student support materials can be found on the authors' own website for the book: http://hwsecuritybook.org

Advances in Electronic Testing

Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
ISBN 13 : 0387294090
Total Pages : 431 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Advances in Electronic Testing by : Dimitris Gizopoulos

Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 792 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Electronic Design Automation for IC System Design, Verification, and Testing

Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno

Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Asian Test Symposium

Author :
Publisher :
ISBN 13 :
Total Pages : 526 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Asian Test Symposium by :

Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:

VLSI Design Theory and Practice

Author :
Publisher : Laxmi Publications
ISBN 13 : 9381159440
Total Pages : 444 pages
Book Rating : 4.3/5 (811 download)

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Book Synopsis VLSI Design Theory and Practice by :

Download or read book VLSI Design Theory and Practice written by and published by Laxmi Publications. This book was released on 2013 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Test Pattern Generation using Boolean Proof Engines

Author : Rolf Drechsler
Publisher : Springer Science & Business Media
ISBN 13 : 9048123607
Total Pages : 196 pages
Book Rating : 4.0/5 (481 download)

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Book Synopsis Test Pattern Generation using Boolean Proof Engines by : Rolf Drechsler

Download or read book Test Pattern Generation using Boolean Proof Engines written by Rolf Drechsler and published by Springer Science & Business Media. This book was released on 2009-04-22 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

HCTL Open Science and Technology Letters (STL)

Author : Raj Gaurav Mishra
Publisher : HCTL Open Publications Solutions, India
ISBN 13 : 1627769633
Total Pages : 84 pages
Book Rating : 4.6/5 (277 download)

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Book Synopsis HCTL Open Science and Technology Letters (STL) by : Raj Gaurav Mishra

Download or read book HCTL Open Science and Technology Letters (STL) written by Raj Gaurav Mishra and published by HCTL Open Publications Solutions, India. This book was released on 2013-06-30 with total page 84 pages. Available in PDF, EPUB and Kindle. Book excerpt: HCTL Open Science and Technology Letters (HCTL Open STL) is an international, open-access, peer-reviewed journal devoted to various disciplines of Science and Technology published (bi-monthly) by HCTL Open Publications Solutions and Hybrid Computing Technology Labs, India. - Get more information at: http://stl.hctl.org/

Embedded Processor-Based Self-Test

Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
ISBN 13 : 1402028016
Total Pages : 226 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Embedded Processor-Based Self-Test by : Dimitris Gizopoulos

Download or read book Embedded Processor-Based Self-Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.