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Author : Marong Phadoongsidhi
Publisher :
ISBN 13 :
Total Pages : 152 pages
Book Rating : 4.:/5 (89 download)
Download or read book High Level Test Methodology for Crosstalk Faults in Sequential Circuits written by Marong Phadoongsidhi and published by . This book was released on 2004 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : S. Jayanthy
Publisher : Springer
ISBN 13 : 981132493X
Total Pages : 161 pages
Book Rating : 4.8/5 (113 download)
Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Author : Richard Zurawski
Publisher : CRC Press
ISBN 13 : 1420038168
Total Pages : 1161 pages
Book Rating : 4.4/5 (2 download)
Download or read book Embedded Systems Handbook written by Richard Zurawski and published by CRC Press. This book was released on 2005-08-16 with total page 1161 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded systems are nearly ubiquitous, and books on individual topics or components of embedded systems are equally abundant. Unfortunately, for those designers who thirst for knowledge of the big picture of embedded systems there is not a drop to drink. Until now. The Embedded Systems Handbook is an oasis of information, offering a mix of basic a
Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)
Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author :
Publisher :
ISBN 13 :
Total Pages : 504 pages
Book Rating : 4.3/5 (91 download)
Download or read book Asian Test Symposium written by and published by . This book was released on 2004 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 938 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings, ... International Symposium on VLSI Design written by and published by . This book was released on 2005 with total page 938 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ricardo A. Reis
Publisher : Springer
ISBN 13 : 0387353119
Total Pages : 569 pages
Book Rating : 4.3/5 (873 download)
Download or read book VLSI: Integrated Systems on Silicon written by Ricardo A. Reis and published by Springer. This book was released on 2013-06-05 with total page 569 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the papers that have been presented at the ninth Very Large Scale Integrated Systems conference VLSI'97 that is organized biannually by IFIP Working Group 10.5. It took place at Hotel Serra Azul, in Gramado Brazil from 26-30 August 1997. Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble and Tokyo. The papers in this book report on all aspects of importance to the design of the current and future integrated systems. The current trend towards the realization of versatile Systems-on-a-Chip require attention of embedded hardware/software systems, dedicated ASIC hardware, sensors and actuators, mixed analog/digital design, video and image processing, low power battery operation and wireless communication. The papers as presented in Jhis book have been organized in two tracks, where one is dealing with VLSI System Design and Applications and the other presents VLSI Design Methods and CAD. The following topics are addressed: VLSI System Design and Applications Track • VLSI for Video and Image Processing. • Microsystem and Mixed-mode design. • Communication And Memory System Design • Cow-voltage & Low-power Analog Circuits. • High Speed Circuit Techniques • Application Specific DSP Architectures. VLSI Design Methods and CAD Track • Specification and Simulation at System Level. • Synthesis and Technology Mapping. • CAD Techniques for Low-Power Design. • Physical Design Issues in Sub-micron Technologies. • Architectural Design and Synthesis. • Testing in Complex Mixed Analog and Digital Systems.
Author :
Publisher :
ISBN 13 :
Total Pages : 192 pages
Book Rating : 4.:/5 (31 download)
Download or read book IEEE International High-Level Design Validation and Test Workshop written by and published by . This book was released on 2003 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)
Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author :
Publisher :
ISBN 13 :
Total Pages : 698 pages
Book Rating : 4.3/5 (91 download)
Download or read book Digest of Technical Papers written by and published by . This book was released on 2001 with total page 698 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Louis Scheffer
Publisher : CRC Press
ISBN 13 : 1420007947
Total Pages : 544 pages
Book Rating : 4.4/5 (2 download)
Download or read book EDA for IC System Design, Verification, and Testing written by Louis Scheffer and published by CRC Press. This book was released on 2018-10-03 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.
Author :
Publisher : IEEE Computer Society Press
ISBN 13 :
Total Pages : 464 pages
Book Rating : 4.E/5 ( download)
Download or read book 11th Asian Test Symposium (ATS'02) written by and published by IEEE Computer Society Press. This book was released on 2002 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt: Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author :
Publisher :
ISBN 13 : 9780818672620
Total Pages : 480 pages
Book Rating : 4.6/5 (726 download)
Download or read book Proceedings of the Twenty-sixth International Symposium on Fault-Tolerant Computing written by and published by . This book was released on 1996 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 1441982973
Total Pages : 228 pages
Book Rating : 4.4/5 (419 download)
Download or read book Test and Diagnosis for Small-Delay Defects written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author : J. Altet
Publisher : Springer Science & Business Media
ISBN 13 : 1475736355
Total Pages : 212 pages
Book Rating : 4.4/5 (757 download)
Download or read book Thermal Testing of Integrated Circuits written by J. Altet and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
Author : EDFAS Desk Reference Committee
Publisher : ASM International
ISBN 13 : 1615037268
Total Pages : 673 pages
Book Rating : 4.6/5 (15 download)
Download or read book Microelectronics Failure Analysis written by EDFAS Desk Reference Committee and published by ASM International. This book was released on 2011 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes bibliographical references and index.
Author :
Publisher :
ISBN 13 :
Total Pages : 1860 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 1860 pages. Available in PDF, EPUB and Kindle. Book excerpt:
