Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Download Fault Simulation And Test Pattern Selectionfor Small Delay Defects Using Gpu full books in PDF, epub, and Kindle. Read online Fault Simulation And Test Pattern Selectionfor Small Delay Defects Using Gpu ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author : 許聖章
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (92 download)
Download or read book Fault Simulation and Test Pattern Selectionfor Small Delay Defects Using Gpu written by 許聖章 and published by . This book was released on 2013 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wangqi Qiu
Publisher :
ISBN 13 : 9781109849929
Total Pages : 130 pages
Book Rating : 4.8/5 (499 download)
Download or read book Fault Simulation and Test Generation for Small Delay Faults written by Wangqi Qiu and published by . This book was released on 2006 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt: The ATPG methodology has been implemented on industrial designs. Speed binning has been done on many devices and silicon data has shown significant benefit of the KLPG test, compared to several traditional delay test approaches.
Author : Arjun Singh Gill
Publisher :
ISBN 13 :
Total Pages : 46 pages
Book Rating : 4.:/5 (869 download)
Download or read book Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults written by Arjun Singh Gill and published by . This book was released on 2013 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt: The ever increasing complexity and size of digital circuits complemented by Deep Sub Micron (DSM) technology trends today pose challenges to the efficient Design For Test (DFT) methodologies. Innovation is required not only in designing the digital circuits, but also in automatic test pattern generation (ATPG) to ensure that the pattern set screens all the targeted faults while still complying with the Automatic Test Equipment (ATE) memory constraints. DSM technology trends push the requirements of ATPG to not only include the conventional static defects but also to include test patterns for dynamic defects. The current industry practices consider test pattern generation for transition faults to screen dynamic defects. It has been observed that just screening for transition faults alone is not sufficient in light of the continuing DSM technology trends. Shrinking technology nodes have pushed DFT engineers to include Small Delay Defect (SDD) test patterns in the production flow. The current industry standard ATPG tools are evolving and SDD ATPG is not the most economical option in terms of both test generation CPU time and pattern volume. New techniques must be explored in order to ensure that a quality test pattern set can be generated which includes patterns for stuck-at, transition and SDD faults, all the while ensuring that the pattern volume remains economical. This thesis explores the use of a "Top-Off" ATPG methodology to generate an optimal test pattern set which can effectively screen the required fault models while containing the pattern volume within a reasonable limit. The electronic version of this dissertation is accessible from http://hdl.handle.net/1969.1/149598
Download or read book High Quality Transition and Small Delay Fault ATPG written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Path selection and generating tests for small delay faults is an important issue in the delay fault area. A novel technique for generating effective vectors for delay defects is the first issue that we have presented in the thesis. The test set achieves high path delay fault coverage to capture small-distributed delay defects and high transition fault coverage to capture gross delay defects. Furthermore, non-robust paths for ATPG are filtered (selected) carefully so that there is a minimum overlap with the already tested robust paths. A relationship between path delay fault model and transition fault model has been observed which helps us reduce the number of non-robust paths considered for test generation. To generate tests for robust and non-robust paths, a deterministic ATPG engine is developed. To deal with small delay faults, we have proposed a new transition fault model called As late As Possible Transition Fault (ALAPTF) Model. The model aims at detecting smaller delays, which will be missed by both the traditional transition fault model and the path delay model. The model makes sure that each transition is launched as late as possible at the fault site, accumulating the small delay defects along its way. Because some transition faults may require multiple paths to be launched, simple path-delay model will miss such faults.
Author : 張家源
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (822 download)
Download or read book Compact Test Pattern Selection for Small Delay Defect written by 張家源 and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fault Modeling, Delay Evaluation and Path Selection for Delay Test Under Process Variation in Nano-scale VLSI Circuits written by and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Delay test in nano-scale VLSI circuits becomes more difficult with shrinking technology feature sizes and rising clock frequencies. In this dissertation, we study three challenging issues in delay test: fault modeling, variational delay evaluation and path selection under process variation. Previous research of fault modeling on resistive spot defects, such as resistive opens and bridges in the interconnect, and resistive shorts in devices, lacked an accurate fault model. As a result it was difficult to perform fault simulation and select the best vectors. Conventional methods to compute variational delay under process variation are either slow or inaccurate. On the problem of path selection under process variation, previous approaches either choose too many paths, or missed the path that is necessary to be tested. We present new solutions in this dissertation. A new fault model that clearly and comprehensively expresses the relationship between electrical behaviors and resistive spots is proposed. Then the effect of process variations on path delays is modeled with a linear function and a fast method to compute coefficients of the linear function is also derived. Finally, we present the new path pruning algorithms that efficiently prune unimportant paths for test, and as a result we select as few as possible paths for test while the fault coverage is satisfied. The experimental results show that the new solutions are efficient and accurate.
Author : Bejoy George Oomman
Publisher :
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.:/5 (192 download)
Download or read book Fault Simulation and Test Generation for Delay Faults written by Bejoy George Oomman and published by . This book was released on 1988 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sudhakar M. Reddy
Publisher :
ISBN 13 :
Total Pages : 156 pages
Book Rating : 4.:/5 (358 download)
Download or read book Delay Faults written by Sudhakar M. Reddy and published by . This book was released on 1994 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Richard Dean Putman
Publisher :
ISBN 13 :
Total Pages : 164 pages
Book Rating : 4.:/5 (244 download)
Download or read book Testing for Delay Defects Utilizing Test Data Compression Techniques written by Richard Dean Putman and published by . This book was released on 2008 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: As technology shrinks new types of defects are being discovered and new fault models are being created for those defects. Transition delay and path delay fault models are two such models that have been created, but they still fall short in that they are unable to obtain a high test coverage of smaller delay defects; these defects can cause functional behavior to fail and also indicate potential reliability issues. The first part of this dissertation addresses these problems by presenting an enhanced timing-based delay fault testing technique that incorporates the use of standard delay ATPG, along with timing information gathered from standard static timing analysis. Utilizing delay fault patterns typically increases the test data volume by 3-5X when compared to stuck-at patterns. Combined with the increase in test data volume associated with the increase in gate count that typically accompanies the miniaturization of technology, this adds up to a very large increase in test data volume that directly affect test time and thus the manufacturing cost. The second part of this dissertation presents a technique for improving test compression and reducing test data volume by using multiple expansion ratios while determining the configuration of the scan chains for each of the expansion ratios using a dependency analysis procedure that accounts for structural dependencies as well as free variable dependencies to improve the probability of detecting faults. Finally, this dissertation addresses the problem of unknown values (X's) in the output response data corrupting the data and degrading the performance of the output response compactor and thus the overall amount of test compression. Four techniques are presented that focus on handling response data with large percentages of X's. The first uses X-canceling MISR architecture that is based on deterministically observing scan cells, and the second is a hybrid approach that combines a simple X-masking scheme with the X-canceling MISR for further gains in test compression. The third and fourth techniques revolve around reiterative LFSR X-masking, which take advantage of LFSR-encoded masks that can be reused for multiple scan slices in novel ways.
Author : Gerrit van Brakel
Publisher :
ISBN 13 : 9789090092133
Total Pages : 155 pages
Book Rating : 4.0/5 (921 download)
Download or read book Test Pattern Generation for Delay Faults written by Gerrit van Brakel and published by . This book was released on 1996 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zheng Wang
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (746 download)
Download or read book High Quality Compact Delay Test Generation written by Zheng Wang and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Delay testing is used to detect timing defects and ensure that a circuit meets its timing specifications. The growing need for delay testing is a result of the advances in deep submicron (DSM) semiconductor technology and the increase in clock frequency. Small delay defects that previously were benign now produce delay faults, due to reduced timing margins. This research focuses on the development of new test methods for small delay defects, within the limits of affordable test generation cost and pattern count. First, a new dynamic compaction algorithm has been proposed to generate compacted test sets for K longest paths per gate (KLPG) in combinational circuits or scan-based sequential circuits. This algorithm uses a greedy approach to compact paths with non-conflicting necessary assignments together during test generation. Second, to make this dynamic compaction approach practical for industrial use, a recursive learning algorithm has been implemented to identify more necessary assignments for each path, so that the path-to-test-pattern matching using necessary assignments is more accurate. Third, a realistic low cost fault coverage metric targeting both global and local delay faults has been developed. The metric suggests the test strategy of generating a different number of longest paths for each line in the circuit while maintaining high fault coverage. The number of paths and type of test depends on the timing slack of the paths under this metric. Experimental results for ISCAS89 benchmark circuits and three industry circuits show that the pattern count of KLPG can be significantly reduced using the proposed methods. The pattern count is comparable to that of transition fault test, while achieving higher test quality. Finally, the proposed ATPG methodology has been applied to an industrial quad-core microprocessor. FMAX testing has been done on many devices and silicon data has shown the benefit of KLPG test.
Author : Angela Krstic
Publisher : Springer Science & Business Media
ISBN 13 : 1461555973
Total Pages : 201 pages
Book Rating : 4.4/5 (615 download)
Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Author : Tejinder Gandhi
Publisher : ASM International
ISBN 13 : 1627082468
Total Pages : 750 pages
Book Rating : 4.6/5 (27 download)
Download or read book Microelectronics Fialure Analysis Desk Reference, Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 750 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 1441982973
Total Pages : 228 pages
Book Rating : 4.4/5 (419 download)
Download or read book Test and Diagnosis for Small-Delay Defects written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author : Ashish Srivastava
Publisher : Springer Science & Business Media
ISBN 13 : 0387265287
Total Pages : 284 pages
Book Rating : 4.3/5 (872 download)
Download or read book Statistical Analysis and Optimization for VLSI: Timing and Power written by Ashish Srivastava and published by Springer Science & Business Media. This book was released on 2006-04-04 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)
Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author :
Publisher : Elsevier
ISBN 13 : 0123849896
Total Pages : 889 pages
Book Rating : 4.1/5 (238 download)
Download or read book GPU Computing Gems Emerald Edition written by and published by Elsevier. This book was released on 2011-01-13 with total page 889 pages. Available in PDF, EPUB and Kindle. Book excerpt: GPU Computing Gems Emerald Edition offers practical techniques in parallel computing using graphics processing units (GPUs) to enhance scientific research. The first volume in Morgan Kaufmann's Applications of GPU Computing Series, this book offers the latest insights and research in computer vision, electronic design automation, and emerging data-intensive applications. It also covers life sciences, medical imaging, ray tracing and rendering, scientific simulation, signal and audio processing, statistical modeling, video and image processing. This book is intended to help those who are facing the challenge of programming systems to effectively use GPUs to achieve efficiency and performance goals. It offers developers a window into diverse application areas, and the opportunity to gain insights from others' algorithm work that they may apply to their own projects. Readers will learn from the leading researchers in parallel programming, who have gathered their solutions and experience in one volume under the guidance of expert area editors. Each chapter is written to be accessible to researchers from other domains, allowing knowledge to cross-pollinate across the GPU spectrum. Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution. The insights and ideas as well as practical hands-on skills in the book can be immediately put to use. Computer programmers, software engineers, hardware engineers, and computer science students will find this volume a helpful resource. For useful source codes discussed throughout the book, the editors invite readers to the following website: ..." Covers the breadth of industry from scientific simulation and electronic design automation to audio / video processing, medical imaging, computer vision, and more Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution Offers insights and ideas as well as practical "hands-on" skills you can immediately put to use
