Electron Microscopy In Science And Engineering

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Electron Microscopy in Science and Engineering

Author : Krishanu Biswas
Publisher : Springer Nature
ISBN 13 : 9811651019
Total Pages : 153 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Electron Microscopy in Science and Engineering by : Krishanu Biswas

Download or read book Electron Microscopy in Science and Engineering written by Krishanu Biswas and published by Springer Nature. This book was released on 2022-02-09 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.

Electron Microscopy In Material Science

Author : U Valdre
Publisher : Elsevier
ISBN 13 : 0323142567
Total Pages : 785 pages
Book Rating : 4.3/5 (231 download)

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Book Synopsis Electron Microscopy In Material Science by : U Valdre

Download or read book Electron Microscopy In Material Science written by U Valdre and published by Elsevier. This book was released on 2012-12-02 with total page 785 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.

Field Emission Scanning Electron Microscopy

Author : Nicolas Brodusch
Publisher : Springer
ISBN 13 : 9811044333
Total Pages : 143 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Science of Microscopy

Author : P.W. Hawkes
Publisher : Springer Science & Business Media
ISBN 13 : 0387497625
Total Pages : 1336 pages
Book Rating : 4.3/5 (874 download)

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Book Synopsis Science of Microscopy by : P.W. Hawkes

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Transmission Electron Microscopy and Diffractometry of Materials

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Author : Brent Fultz
Publisher : Springer Science & Business Media
ISBN 13 : 3642297609
Total Pages : 775 pages
Book Rating : 4.6/5 (422 download)

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Book Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz

Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2012-10-14 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Scanning Transmission Electron Microscopy

Author : Stephen J. Pennycook
Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Electron Microscopy and Analysis 2001

Author : M. Aindow
Publisher : CRC Press
ISBN 13 : 9780750308120
Total Pages : 562 pages
Book Rating : 4.3/5 (81 download)

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Book Synopsis Electron Microscopy and Analysis 2001 by : M. Aindow

Download or read book Electron Microscopy and Analysis 2001 written by M. Aindow and published by CRC Press. This book was released on 2001-12-01 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

Transmission Electron Microscopy

Author : David B. Williams
Publisher : Springer Science & Business Media
ISBN 13 : 1475725191
Total Pages : 708 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Transmission Electron Microscopy by : David B. Williams

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Scanning Electron Microscopy for the Life Sciences

Author : Heide Schatten
Publisher : Cambridge University Press
ISBN 13 : 0521195993
Total Pages : 275 pages
Book Rating : 4.5/5 (211 download)

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Book Synopsis Scanning Electron Microscopy for the Life Sciences by : Heide Schatten

Download or read book Scanning Electron Microscopy for the Life Sciences written by Heide Schatten and published by Cambridge University Press. This book was released on 2013 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: A guide to modern scanning electron microscopy instrumentation, methodology and techniques, highlighting novel applications to cell and molecular biology.

Impact of Electron and Scanning Probe Microscopy on Materials Research

Author : David G. Rickerby
Publisher : Springer Science & Business Media
ISBN 13 : 9401144516
Total Pages : 503 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby

Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

In-situ Electron Microscopy at High Resolution

Author : Florian Banhart
Publisher : World Scientific
ISBN 13 : 9812797343
Total Pages : 318 pages
Book Rating : 4.8/5 (127 download)

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Book Synopsis In-situ Electron Microscopy at High Resolution by : Florian Banhart

Download or read book In-situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

A Beginners' Guide to Scanning Electron Microscopy

Author : Anwar Ul-Hamid
Publisher : Springer
ISBN 13 : 3319984829
Total Pages : 422 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis A Beginners' Guide to Scanning Electron Microscopy by : Anwar Ul-Hamid

Download or read book A Beginners' Guide to Scanning Electron Microscopy written by Anwar Ul-Hamid and published by Springer. This book was released on 2018-10-26 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.

Advanced Transmission Electron Microscopy

Author : Jian Min Zuo
Publisher : Springer
ISBN 13 : 1493966073
Total Pages : 741 pages
Book Rating : 4.4/5 (939 download)

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Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo

Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Chemical Imaging Analysis

Author : Freddy Adams
Publisher : Elsevier
ISBN 13 : 0444634509
Total Pages : 493 pages
Book Rating : 4.4/5 (446 download)

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Book Synopsis Chemical Imaging Analysis by : Freddy Adams

Download or read book Chemical Imaging Analysis written by Freddy Adams and published by Elsevier. This book was released on 2015-06-06 with total page 493 pages. Available in PDF, EPUB and Kindle. Book excerpt: Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. Provides comprehensive coverage of analytical techniques used in chemical imaging analysis Explores a variety of specialized techniques Provides a general overview of imaging techniques in diverse fields

New Horizons of Applied Scanning Electron Microscopy

Author : Kenichi Shimizu
Publisher : Springer
ISBN 13 : 9783642261688
Total Pages : 182 pages
Book Rating : 4.2/5 (616 download)

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Book Synopsis New Horizons of Applied Scanning Electron Microscopy by : Kenichi Shimizu

Download or read book New Horizons of Applied Scanning Electron Microscopy written by Kenichi Shimizu and published by Springer. This book was released on 2012-05-04 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Advanced Computing in Electron Microscopy

Author : Earl J. Kirkland
Publisher : Springer Nature
ISBN 13 : 3030332608
Total Pages : 357 pages
Book Rating : 4.0/5 (33 download)

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Book Synopsis Advanced Computing in Electron Microscopy by : Earl J. Kirkland

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Nature. This book was released on 2020-03-09 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics

Author : Theodore G. Rochow
Publisher : Springer Science & Business Media
ISBN 13 : 1489915133
Total Pages : 462 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics by : Theodore G. Rochow

Download or read book Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics written by Theodore G. Rochow and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: Following three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up to date. In doing so the authors aim to show how the newer microscopies are related to the older types with respect to theoretical resolving power (what you pay for) and resolution (what you get). The book is an introduction to students, technicians, technologists, and scientists in biology, medicine, science, and engineering. It should be useful in academic and industrial research, consulting, and forensics; how ever, the book is not intended to be encyclopedic. The authors are greatly indebted to the College of Textiles of North Carolina State University at Raleigh for support from the administration there for typing, word processing, stationery, mailing, drafting diagrams, and general assistance. We personally thank Joann Fish for word process ing, Teresa M. Langley and Grace Parnell for typing services, Mark Bowen for drawing graphs and diagrams, Chuck Gardner for photographic ser vices, Deepak Bhattavahalli for his work with the proofs, and all the other people who have given us their assistance. The authors wish to acknowledge the many valuable suggestions given by Eugene G. Rochow and the significant editorial contributions made by Elizabeth Cook Rochow.