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Direct Imaging Of The Atomic Structure And Chemistry Of Defects And Interfaces By Z Contrast Stem Scanning Transmission Electron Microscopy
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Book Synopsis Direct Imaging of the Atomic Structure and Chemistry of Defects and Interfaces by Z-contrast STEM (scanning Transmission Electron Microscopy). by :
Download or read book Direct Imaging of the Atomic Structure and Chemistry of Defects and Interfaces by Z-contrast STEM (scanning Transmission Electron Microscopy). written by and published by . This book was released on 1990 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Z-contrast scanning transmission electron microscopy (STEM) is a fundamentally new approach to high-resolution imaging which provides unambiguous, compositionally sensitive images on the atomic scale. Such images are intuitively interpretable, even in thick regions of the sample, tremendously simplifying determination of the structure and chemistry of defects and interfaces. To illustrate this, examples are presented of commonly observed planar defects in laser-ablated thin films of YBa2Cu3O{sub 7-x}. Film/substrate interfaces are shown to be chemically diffuse on the atomic scale and steps or undulations in the substrate need not result in defects in the film. Low-angle grain boundaries are found to be chemically clean, the drastic reductions in critical currents with tilt angle being due to the array of intrinsic structural defects comprising the boundary. 20 refs., 10 figs.
Book Synopsis Atomic-scale Structure and Chemistry of Interfaces by Z-contrast Imaging and Electron Energy Loss Spectroscopy in the STEM. by :
Download or read book Atomic-scale Structure and Chemistry of Interfaces by Z-contrast Imaging and Electron Energy Loss Spectroscopy in the STEM. written by and published by . This book was released on 1993 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO3 bicrystal.
Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Book Synopsis Z-contrast Scanning Transmission Electron Microscopy of Nanometer-scale Coated Particulate Materials by :
Download or read book Z-contrast Scanning Transmission Electron Microscopy of Nanometer-scale Coated Particulate Materials written by and published by . This book was released on 1998 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Particulate materials with unique functional properties have been the focus of much attention in recent years. Of particular interest, due to their considerable scientific and technological importance, are particles coated with nanoparticles. These have greatly stimulated interest for their novel structure and properties. In these kinds of particulate materials, the interface structures between the support particle and the nanoparticle play a crucial role in controlling their properties. Consequently, imaging of the atomic structures at the interfaces can provide deep understanding of the relationship between the particulate and the corresponding properties. Z-contrast scanning transmission electron microscope (STEM) provides a new view of materials on the atomic scale, a direct image of atomic structure composition which can be interpreted without the need for any preconceived model structure. Therefore it is a powerful tool in the study of particulate materials. In this report, the authors present the structures of 18 micron diameter alumina particles coated with Ag nanoparticles. Particulates were prepared by a laser ablation technique, which involves laser ablation of the target material (Ag) onto a fluidized bed of core particles (alumina). The core alumina particles were fluidized inside the deposition system using a mechanical vibration method. For the STEM analysis, the particulates were lightly crushed in water using a pestle and mortar, then diluted in ethanol and deposited on a TEM grid coated with an amorphous carbon thin film.
Download or read book Energy Research Abstracts written by and published by . This book was released on 1990 with total page 852 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis by : Nobuo Tanaka
Download or read book Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis written by Nobuo Tanaka and published by World Scientific. This book was released on 2014-08-21 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby
Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 1999-10-31 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Book Synopsis Transmission Electron Microscopy by : C. Barry Carter
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo
Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Book Synopsis Electron Nano-Imaging by : Nobuo Tanaka
Download or read book Electron Nano-Imaging written by Nobuo Tanaka and published by Springer. This book was released on 2017-04-04 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
Book Synopsis Direct Observations of Defect Structures in Optoelectronic Materials by Z-contrast STEM. by :
Download or read book Direct Observations of Defect Structures in Optoelectronic Materials by Z-contrast STEM. written by and published by . This book was released on 1998 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optoelectronic semiconductor materials have wide and important technological applications. For example, wide gap nitride semiconductors have attracted significant attention recently due to their promising performance as short-wavelength light emitting diodes (LEDs) and blue lasers, while HgCdTe II-VI semiconductors are the most promising candidates for applications as infrared detectors, or large array x-ray or gamma-ray detectors. In this paper, two examples are given to show that high-resolution Z-contrast imaging is an effective technique to determine the atomic structures of defects in these complex semiconductor materials. One interesting issue concerning GaN is that the material is relatively insensitive to the presence of a density of dislocations which is six orders of magnitude higher than that for III-V arsenide and phosphide based LEDs. To develop a fundamental understanding of the properties of the dislocations in GaN, the core structures are determined here by atomic-resolution Z-contrast imaging in a scanning transmission electron microscope (STEM) with a resolution of 0.13 nm. As the Z-contrast image is a convolution between the probe intensity profile and the specimen object function, it is possible to obtain detailed information on the atomic column positions through maximum entropy analysis. For a sphalerite semiconductor, polarity is an important issue, as the asymmetry of the structure gives rise to different physical and chemical properties. Here the authors show that high resolution Z-contrast imaging could be used as an effective method to determine the polarity of II-VI semiconductors without referring to reference samples or image simulations.
Book Synopsis Progress in Transmission Electron Microscopy 1 by : Xiao-Feng Zhang
Download or read book Progress in Transmission Electron Microscopy 1 written by Xiao-Feng Zhang and published by Springer Science & Business Media. This book was released on 2001-10-18 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Book Synopsis Determination of Interface Structure and Bonding by Z-contrast Stem by :
Download or read book Determination of Interface Structure and Bonding by Z-contrast Stem written by and published by . This book was released on 1995 with total page 11 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scanning transmission electron microscope (STEM) provides a route for the determination of interface structure and bonding directly from experimental data. Through an annular detector, Z-contrast images reveal atomic column locations without prior knowledge. The incoherent nature of such images allows a direct structure inversion through a maximum entropy analysis. The Z-contrast image also facilitates atomic-resolution spectroscopy by allowing the probe to be positioned with atomic precision. With this combination of atomic-resolution imaging and spectroscopy, structural units for [001] tilt grain boundaries in SrTiO3 were identified. All units revealed the presence of half-filled columns, an efficient way to overcome the problem of like-ion repulsion in ionic materials. With the 1.3 Å probe of the 300-kV STEM, an unexpected core structure has been found for Lomer dislocations at a CdTe/ GaAs [001] interface, while 60° dislocations were directly identified to be of glide type.
Book Synopsis Advances in Imaging and Electron Physics by : Peter W. Hawkes
Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Academic Press. This book was released on 2002-11-05 with total page 481 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Book Synopsis Denshi Kenbikyo Gakkai Shi: Kikan by :
Download or read book Denshi Kenbikyo Gakkai Shi: Kikan written by and published by . This book was released on 2005 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Z-contrast Imaging and Grain Boundaries in Semiconductors by :
Download or read book Z-contrast Imaging and Grain Boundaries in Semiconductors written by and published by . This book was released on 1996 with total page 3 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interest in grain boundaries in semiconductors is linked to the application of polycrystalline semiconductors as photovoltaic and interconnect materials. In real devices such as solar cells and MOS structures as well as future devices such as flat-panel displays, the intergranular regions of the polycrystalline solid have a significant effect on the flow of electronic current. These grain boundary barriers exist because the chemical potential of the boundary atoms are shifted from the bulk value by the change in local symmetry. The chemical potential is also changed by impurities, other structural defects, and other phases in the boundary. The lack of knowledge on the atomic structure of grain boundaries is, at present, the greatest barrier to advancements in the understanding of the electrical properties of these defects. The advances of the last few years have provided the tools with which to probe these interfaces at the true atomic scale. One such tool is the high-resolution scanning transmission electron microscope installed at Oak Ridge National Laboratory (VG Microscopes HB603) that can form a 1.27 Å electron probe. Images are formed by scanning the probe across a thin sample and using an annular detector to collect electrons scattered to high angles. Because the annular detector collects electrons scattered over a wide range of angles, phase correlation and dynamical diffraction effects are averaged by this annular integration. Thus, an image with incoherent characteristics is produced and retained to relatively large specimen thickness. The key advantage of incoherent imaging is that when the microscope is focused to produce maximum image contrast, the bright image features directly correspond to the positions of the atomic columns.
