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Diffraction And Imaging Techniques In Material Science P2
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Book Synopsis Diffraction and Imaging Techniques in Material Science P2 by : S Amelinckx
Download or read book Diffraction and Imaging Techniques in Material Science P2 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Book Synopsis Diffraction and Imaging Techniques in Material Science P1 by : S Amelinckx
Download or read book Diffraction and Imaging Techniques in Material Science P1 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science describes the various methods used to study the atomic structure of matter at an atomic scale based on the interaction between matter and radiation. It classifies the possible methods of observation by making a list of radiations on the basis of wavelength, including ions, X-ray photons, neutrons, and electrons. It also discusses transmission electron microscopy, the weak-beam method of electron microscopy, and some applications of transmission electron microscopy to phase transitions. Organized into 13 chapters, this volume begins with an overview of the kinematic theory of electron diffraction and the ways to treat diffraction by a deformed crystal. It discusses the dynamical theory of diffraction of fast electrons, the treatment of absorption in the dynamical theory of electron diffraction, the use of electron microscopy to study planar interfaces, and analysis of weak-beam images. The book also covers the use of computed electron micrographs in defect identification, crystallographic analysis of dislocation loops containing shear components, and detection and identification of small coherent particles. In addition, the reader is introduced to interpretation of diffuse scattering and short-range order, along with the crystallography of martensitic transformations. The remaining chapters focus on the working principle of the transmission electron microscope, experimental structure imaging of crystals, and the study of diffuse scattering effects originating from substitutional disorder and displacement disorder. The information on diffraction and imaging techniques in material science contained in this book will be helpful to students, researchers, and scientists.
Book Synopsis Diffraction and Imaging Techniques in Material Science: Imaging and diffraction techniques by : Severin Amelinckx
Download or read book Diffraction and Imaging Techniques in Material Science: Imaging and diffraction techniques written by Severin Amelinckx and published by . This book was released on 1978 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Modern Diffraction and Imaging Techniques in Material Science by : Severin Amelinckx
Download or read book Modern Diffraction and Imaging Techniques in Material Science written by Severin Amelinckx and published by . This book was released on 1970 with total page 768 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Real-time Radiologic Imaging by : D. A. Garrett
Download or read book Real-time Radiologic Imaging written by D. A. Garrett and published by ASTM International. This book was released on 1980 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Characterization of Solid Surfaces by : Philip F. Kane
Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Book Synopsis Practical Methods in Electron Microscopy: pt. 1. Specimen preparation in materials science by : Audrey M. Glauert
Download or read book Practical Methods in Electron Microscopy: pt. 1. Specimen preparation in materials science written by Audrey M. Glauert and published by . This book was released on 1972 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1987 with total page 398 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications by : United States. National Bureau of Standards
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1987 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis International Tables for Crystallography, Volume B by : Uri Shmueli
Download or read book International Tables for Crystallography, Volume B written by Uri Shmueli and published by Springer Science & Business Media. This book was released on 2008-08-27 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure-factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space. In Part 2, these general accounts are followed by detailed expositions of crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination, including applications of direct methods to electron crystallography. Part 3 deals with applications of reciprocal space to molecular geometry and `best'-plane calculations, and contains a treatment of the principles of molecular graphics and modelling and their applications. A convergence-acceleration method of importance in the computation of approximate lattice sums is presented and the part concludes with a discussion of the Ewald method. Part 4 contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5 of the volume contains introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques. The simplified trigonometric expressions for the structure factors in the 230 three-dimensional space groups, which appeared in Volume I of International Tables for X-ray Crystallography, are now given in Appendix 1.4.3 to Chapter 1.4 of this volume. Volume B is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.
Book Synopsis Publications of the National Bureau of Standards ... Catalog by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1986 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Bureau of Standards, 1986 Catalog by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards, 1986 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1987 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Proceedings, ... Annual Meeting, Electron Microscopy Society of America by : Electron Microscopy Society of America. Meeting
Download or read book Proceedings, ... Annual Meeting, Electron Microscopy Society of America written by Electron Microscopy Society of America. Meeting and published by . This book was released on 1992 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Transmission Electron Microscopy by : C. Barry Carter
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Book Synopsis ASTM Special Technical Publication by :
Download or read book ASTM Special Technical Publication written by and published by . This book was released on 1980 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Transactions of the Japan Institute of Metals by : Nihon Kinzoku Gakkai
Download or read book Transactions of the Japan Institute of Metals written by Nihon Kinzoku Gakkai and published by . This book was released on 1986 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Acoustical Imaging by : Woon Siong Gan
Download or read book Acoustical Imaging written by Woon Siong Gan and published by John Wiley & Sons. This book was released on 2012-05-11 with total page 437 pages. Available in PDF, EPUB and Kindle. Book excerpt: The technology of acoustical imaging has advanced rapidly over the last sixty years, and now represents a sophisticated technique applied to a wide range of fields including non-destructive testing, medical imaging, underwater imaging and SONAR, and geophysical exploration. Acoustical Imaging: Techniques and Applications for Engineers introduces the basic physics of acoustics and acoustical imaging, before progressing to more advanced topics such as 3D and 4D imaging, elasticity theory, gauge invariance property of acoustic equation of motion and acoustic metamaterials. The author draws together the different technologies in sonar, seismic and ultrasound imaging, highlighting the similarities between topic areas and their common underlying theory. Key features: Comprehensively covers all of the important applications of acoustical imaging. Introduces the gauge invariance property of acoustic equation of motion, with applications in the elastic constants of isotropic solids, time reversal acoustics, negative refraction, double negative acoustical metamaterial and acoustical cloaking. Contains up to date treatments on latest theories of sound propagation in random media, including statistical treatment and chaos theory. Includes a chapter devoted to new acoustics based on metamaterials, a field founded by the author, including a new theory of elasticity and new theory of sound propagation in solids and fluids and tremendous potential in several novel applications. Covers the hot topics on acoustical imaging including time reversal acoustics, negative refraction and acoustical cloaking. Acoustical Imaging: Techniques and Applications for Engineers is a comprehensive reference on acoustical imaging and forms a valuable resource for engineers, researchers, senior undergraduate and graduate students.
