Multiple Diffraction of X-Rays in Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 3642821669
Total Pages : 312 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Multiple Diffraction of X-Rays in Crystals by : Shih-Lin In-Hang

Download or read book Multiple Diffraction of X-Rays in Crystals written by Shih-Lin In-Hang and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin ciple, reflect three-dimensional information about the structure of the dif fracting material. Recent progress in understanding this diffraction phenome non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys tematic review of this type of diffraction, encompasses its diverse applica tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.

X-Ray and Neutron Diffraction in Nonideal Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 3642742912
Total Pages : 483 pages
Book Rating : 4.6/5 (427 download)

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Book Synopsis X-Ray and Neutron Diffraction in Nonideal Crystals by : Mikhail A. Krivoglaz

Download or read book X-Ray and Neutron Diffraction in Nonideal Crystals written by Mikhail A. Krivoglaz and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 483 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).

X-Ray Diffraction Crystallography

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Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda

Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

X Rays and Crystal Structure

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Publisher :
ISBN 13 :
Total Pages : 364 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis X Rays and Crystal Structure by : William Henry Bragg

Download or read book X Rays and Crystal Structure written by William Henry Bragg and published by . This book was released on 1924 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Diffraction

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Author :
Publisher : Courier Corporation
ISBN 13 : 0486141349
Total Pages : 404 pages
Book Rating : 4.4/5 (861 download)

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Book Synopsis X-Ray Diffraction by : A. Guinier

Download or read book X-Ray Diffraction written by A. Guinier and published by Courier Corporation. This book was released on 2013-01-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.

Modern X-Ray Analysis on Single Crystals

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Author :
Publisher : Walter de Gruyter
ISBN 13 : 3110370611
Total Pages : 370 pages
Book Rating : 4.1/5 (13 download)

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Book Synopsis Modern X-Ray Analysis on Single Crystals by : Peter Luger

Download or read book Modern X-Ray Analysis on Single Crystals written by Peter Luger and published by Walter de Gruyter. This book was released on 2014-04-01 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.

Parametric X-Ray Radiation in Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540269052
Total Pages : 194 pages
Book Rating : 4.2/5 (69 download)

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Book Synopsis Parametric X-Ray Radiation in Crystals by : Vladimir G. Baryshevsky

Download or read book Parametric X-Ray Radiation in Crystals written by Vladimir G. Baryshevsky and published by Springer Science & Business Media. This book was released on 2005-12-20 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: This systematic and comprehensive monograph is devoted to parametric X-ray radiation (PXR). This radiation is generated by the motion of electrons inside a crystal, whereby the emitted photons are diffracted by the crystal and the radiation intensity critically depends on the parameters of the crystal structure. Nowadays PXR is the subject of numerous theoretical and experimental studies throughout the world. The first part of the book is a theoretical treatment of PXR, which includes a new approach to describe the radiation process in crystals. The second part is a survey of PXR experimental results and the possible applications of PXR as a tool for crystal structure analysis and a source of tunable X-ray radiation.

Understanding Single-Crystal X-Ray Crystallography

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 3527326774
Total Pages : 826 pages
Book Rating : 4.5/5 (273 download)

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Book Synopsis Understanding Single-Crystal X-Ray Crystallography by : Dennis W. Bennett

Download or read book Understanding Single-Crystal X-Ray Crystallography written by Dennis W. Bennett and published by John Wiley & Sons. This book was released on 2010-03-08 with total page 826 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first textbook for teaching this method to users with little mathematical background logically presents the theory and fundamentals in an easily comprehensible, self-contained way. The result is a must-have for advanced undergraduate students, as well as masters and graduate students and other users of single-crystal X-ray crystallography from many various disciplines.

Structure Determination by X-Ray Crystallography

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Publisher : Springer Science & Business Media
ISBN 13 : 1461579333
Total Pages : 404 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Structure Determination by X-Ray Crystallography by : M. F. C. Ladd

Download or read book Structure Determination by X-Ray Crystallography written by M. F. C. Ladd and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.

Characterization of Crystal Growth Defects by X-Ray Methods

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Publisher : Springer Science & Business Media
ISBN 13 : 1475711263
Total Pages : 615 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods by : B.K. Tanner

Download or read book Characterization of Crystal Growth Defects by X-Ray Methods written by B.K. Tanner and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 615 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Dynamical Scattering of X-Rays in Crystals

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Publisher : Springer
ISBN 13 : 9783642812095
Total Pages : 0 pages
Book Rating : 4.8/5 (12 download)

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Book Synopsis Dynamical Scattering of X-Rays in Crystals by : Z.G. Pinsker

Download or read book Dynamical Scattering of X-Rays in Crystals written by Z.G. Pinsker and published by Springer. This book was released on 2012-02-01 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: (Historical Survey) The discovery of X-ray diffraction in crystals by LAUE, FRIDRICH and KNIPPING in 1912 [1.1] served as the starting pOint for the development of scientific research along a number of important lines. We shall discuss just a few of them. The above discovery convincingly demonstrated the wave properties of X-rays. This, together with the previously established electromagnetic nature of radiation, confirmed the hypothesis that X-rays form the short-wave part of the electromagnetic spectrum. Further, this discovery was the first and decisive experimental proof of the periodic structure of crystals. In fact, theoretical crystallography had already arrived at this conclusion, mainly as an outcome of the theory of the space groups of symmetry elaborated by FEDOROV [1.2] and SCHOENFLIES [1.3]. From the optics of visible light we know that the radiation of a wave length of the same order as, and preferably less than, the period of a grat ing suffers diffraction on periodic objects of the type of optical grating. Thus, the discovery proved that the wavelength of an X-ray must be of the order of interatomic distances. It became clear why the visible light of wavelengths exceeding the crystal lattice periods by about 500 to 1000 times failed to reveal the periodic structure of crystals in diffraction experi ments.

X-Ray Diffraction for Materials Research

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Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.3/5 (153 download)

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Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee

Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

An Introduction to X-ray Crystallography

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Publisher : Cambridge University Press
ISBN 13 : 9780521423595
Total Pages : 422 pages
Book Rating : 4.4/5 (235 download)

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Book Synopsis An Introduction to X-ray Crystallography by : Michael M. Woolfson

Download or read book An Introduction to X-ray Crystallography written by Michael M. Woolfson and published by Cambridge University Press. This book was released on 1997-01-13 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: A textbook for the student beginning a serious study of X-ray crystallography.

X-Ray Diffraction

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Publisher : Courier Corporation
ISBN 13 : 0486141616
Total Pages : 402 pages
Book Rating : 4.4/5 (861 download)

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Book Synopsis X-Ray Diffraction by : B. E. Warren

Download or read book X-Ray Diffraction written by B. E. Warren and published by Courier Corporation. This book was released on 2012-05-23 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.

X-Ray Structure Determination

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Publisher : John Wiley & Sons
ISBN 13 : 0471607118
Total Pages : 484 pages
Book Rating : 4.4/5 (716 download)

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Book Synopsis X-Ray Structure Determination by : George H. Stout

Download or read book X-Ray Structure Determination written by George H. Stout and published by John Wiley & Sons. This book was released on 1989-05-08 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: Closely follows an actual structural determination. After some introductory material on the nature of x-rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring raw x-ray data are covered, plus their reduction into a useable form. The second part discusses both traditional and novel methods of solving the ``phase'' problem, the principal difficulty in x-ray structure determination. The third part considers how to extract the most information from the data and how to evaluate its reliability. Finally, there is a discussion of sources of error in practice and interpretation.

University Physics

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Publisher :
ISBN 13 : 9781680920451
Total Pages : 622 pages
Book Rating : 4.9/5 (24 download)

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Book Synopsis University Physics by : OpenStax

Download or read book University Physics written by OpenStax and published by . This book was released on 2016-11-04 with total page 622 pages. Available in PDF, EPUB and Kindle. Book excerpt: University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.

X-Ray Diffraction by Polycrystalline Materials

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Publisher : John Wiley & Sons
ISBN 13 : 1118613953
Total Pages : 290 pages
Book Rating : 4.1/5 (186 download)

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Book Synopsis X-Ray Diffraction by Polycrystalline Materials by : René Guinebretière

Download or read book X-Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.