Contactless Radio Frequency Probes For High Temperature Characterization Of Microwave Integrated Circuits

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Contactless Radio Frequency Probes for High Temperature Characterization of Microwave Integrated Circuits

Author : Jennifer L Jordan
Publisher :
ISBN 13 :
Total Pages : 70 pages
Book Rating : 4.:/5 (891 download)

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Book Synopsis Contactless Radio Frequency Probes for High Temperature Characterization of Microwave Integrated Circuits by : Jennifer L Jordan

Download or read book Contactless Radio Frequency Probes for High Temperature Characterization of Microwave Integrated Circuits written by Jennifer L Jordan and published by . This book was released on 2014 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt: A method of characterizing microwave integrated circuits (MICs) at high temperature by way of a contactless probing method is developed. Current methods for characterizing MICs include probing circuits use either ground-signal-ground (GSG) or ground-signal (GS) contact probes that are not designed to withstand exposure to high temperatures. Although specially made GSG and GS probes for high temperature use have been developed, they lack the robustness for repeated use and often damage the device under test (DUT). A contactless approach was developed to address these limitations. In this work, a contactless probe design based on a microstrip transmission line that electromagnetically couples RF signals to a second microstrip transmission line connected in series to DUT was developed. To verify the efficacy of these contactless RF probes at high temperatures, three different circuits were designed, fabricated, and characterized at temperatures from 25 to 200 degrees C.

Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement

Author : Ramon L. Jesch
Publisher :
ISBN 13 :
Total Pages : 64 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement by : Ramon L. Jesch

Download or read book Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement written by Ramon L. Jesch and published by . This book was released on 1975 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt: A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements is given along with the procedure that extracts the parasitic effects of the probe assembly from measurements made at the input connectors of the probe assembly. The scattering parameters of an integrated-circuit device or transistor can now be extracted and accurately determined up to 2 GHz at the wafer stage of assembly. This represents a significant advance over conventional techniques that enable only dc parameters to be measured. Measurement results using this technique are given along with the precision of values obtained as well as the nature of the measurement bias introduced by the probe assembly.

Characterization of High Frequency Probe Assembly for Integrated Circuit Measurements [with List of References

Author :
Publisher :
ISBN 13 :
Total Pages : 52 pages
Book Rating : 4.:/5 (966 download)

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Book Synopsis Characterization of High Frequency Probe Assembly for Integrated Circuit Measurements [with List of References by :

Download or read book Characterization of High Frequency Probe Assembly for Integrated Circuit Measurements [with List of References written by and published by . This book was released on 1975 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization of a High Frequency Probe Assembly for Integrated Circuits Measurements

Author : R. L.. Jesch
Publisher :
ISBN 13 :
Total Pages : 52 pages
Book Rating : 4.:/5 (495 download)

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Book Synopsis Characterization of a High Frequency Probe Assembly for Integrated Circuits Measurements by : R. L.. Jesch

Download or read book Characterization of a High Frequency Probe Assembly for Integrated Circuits Measurements written by R. L.. Jesch and published by . This book was released on 1975 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Contact-free Photomixing Probe for Device and Integrated Circuit Measurement Or Characterization

Author : Elliott R. Brown
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (898 download)

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Book Synopsis Contact-free Photomixing Probe for Device and Integrated Circuit Measurement Or Characterization by : Elliott R. Brown

Download or read book Contact-free Photomixing Probe for Device and Integrated Circuit Measurement Or Characterization written by Elliott R. Brown and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A device for measuring and characterizing solid-state devices or integrated circuits at RF frequencies up to 1.0 THz and beyond is provided that includes a transmitting photomixing probe structure and a receiving photomixing probe structure. The transmitting photomixing probe structure and the receiving photomixing probe structure are ac-coupled to the solid-state device or integrated circuit in a contact-free manner.

Scientific and Technical Aerospace Reports

Author :
Publisher :
ISBN 13 :
Total Pages : 1134 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1989 with total page 1134 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements

Author : R. L. Jesch
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (227 download)

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Book Synopsis Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements by : R. L. Jesch

Download or read book Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements written by R. L. Jesch and published by . This book was released on 1975 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements is given along with the procedure that extracts the parasitic effects of the probe assembly. The scattering parameters of an integrated-circuit device or transistor can now be extracted and accurately determined up to 2 GHz at the wafer stage of assembly. This represents a significant advance over conventional techniques that enabled only dc parameters to be measured. Measurement results using this technique are given along with the precision of values obtained as well as the nature of bias introduced. (Author).

Signal

Author :
Publisher :
ISBN 13 :
Total Pages : 948 pages
Book Rating : 4.P/5 (18 download)

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Book Synopsis Signal by :

Download or read book Signal written by and published by . This book was released on 1991 with total page 948 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Characterization

Author : W. Murray Bullis
Publisher : American Institute of Physics
ISBN 13 :
Total Pages : 760 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Semiconductor Characterization by : W. Murray Bullis

Download or read book Semiconductor Characterization written by W. Murray Bullis and published by American Institute of Physics. This book was released on 1996 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.

Signals

Author :
Publisher :
ISBN 13 :
Total Pages : 1404 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Signals by :

Download or read book Signals written by and published by . This book was released on 1991 with total page 1404 pages. Available in PDF, EPUB and Kindle. Book excerpt:

International Aerospace Abstracts

Author :
Publisher :
ISBN 13 :
Total Pages : 940 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis International Aerospace Abstracts by :

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1997 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Smart Sensors for Environmental and Medical Applications

Author : Hamida Hallil
Publisher : John Wiley & Sons
ISBN 13 : 1119587344
Total Pages : 240 pages
Book Rating : 4.1/5 (195 download)

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Book Synopsis Smart Sensors for Environmental and Medical Applications by : Hamida Hallil

Download or read book Smart Sensors for Environmental and Medical Applications written by Hamida Hallil and published by John Wiley & Sons. This book was released on 2020-05-12 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides an introduction to the topic of smart chemical sensors, along with an overview of the state of the art based on potential applications This book presents a comprehensive overview of chemical sensors, ranging from the choice of material to sensor validation, modeling, simulation, and manufacturing. It discusses the process of data collection by intelligent techniques such as deep learning, multivariate analysis, and others. It also incorporates different types of smart chemical sensors and discusses each under a common set of sub-sections so that readers can fully understand the advantages and disadvantages of the relevant transducers—depending on the design, transduction mode, and final applications. Smart Sensors for Environmental and Medical Applications covers all major aspects of the field of smart chemical sensors, including working principle and related theory, sensor materials, classification of respective transducer type, relevant fabrication processes, methods for data analysis, and suitable applications. Chapters address field effect transistors technologies for biological and chemical sensors, mammalian cell–based electrochemical sensors for label-free monitoring of analytes, electronic tongues, chemical sensors based on metal oxides, metal oxide (MOX) gas sensor electronic interfaces, and more. Addressing the limitations and challenges in obtaining state-of-the-art smart biochemical sensors, this book: Balances the fundamentals of sensor design, fabrication, characterization, and analysis with advanced methods Categorizes sensors into sub-types and describes their working, focusing on prominent applications Describes instrumentation and IoT networking methods of chemical transducers that can be used for inexpensive, accurate detection in commercialized smart chemical sensors Covers monitoring of food spoilage using polydiacetylene- and liposome-based sensors; smart and intelligent E-nose for sensitive and selective chemical sensing applications; odor sensing system; and microwave chemical sensors Smart Sensors for Environmental and Medical Applications is an important book for senior-level undergraduate and graduate students learning about this high-performance technology and its many applications. It will also inform practitioners and researchers involved in the creation and use of smart sensors.

Microwave Electronics

Author : L. F. Chen
Publisher : John Wiley & Sons
ISBN 13 : 0470020458
Total Pages : 552 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Microwave Electronics by : L. F. Chen

Download or read book Microwave Electronics written by L. F. Chen and published by John Wiley & Sons. This book was released on 2004-11-19 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and applications. Presents materials property characterisation methods along with a discussion of the underlying theory. Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications. Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences. This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

NASA Patent Abstracts Bibliography

Author : United States. National Aeronautics and Space Administration. Scientific and Technical Information Program
Publisher :
ISBN 13 :
Total Pages : 632 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis NASA Patent Abstracts Bibliography by : United States. National Aeronautics and Space Administration. Scientific and Technical Information Program

Download or read book NASA Patent Abstracts Bibliography written by United States. National Aeronautics and Space Administration. Scientific and Technical Information Program and published by . This book was released on 1993 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electrical & Electronics Abstracts

Author :
Publisher :
ISBN 13 :
Total Pages : 2304 pages
Book Rating : 4.3/5 (243 download)

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Book Synopsis Electrical & Electronics Abstracts by :

Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

RFID Handbook

Author : Klaus Finkenzeller
Publisher : John Wiley & Sons
ISBN 13 : 1119991870
Total Pages : 526 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis RFID Handbook by : Klaus Finkenzeller

Download or read book RFID Handbook written by Klaus Finkenzeller and published by John Wiley & Sons. This book was released on 2010-11-04 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the third revised edition of the established and trusted RFID Handbook; the most comprehensive introduction to radio frequency identification (RFID) available. This essential new edition contains information on electronic product code (EPC) and the EPC global network, and explains near-field communication (NFC) in depth. It includes revisions on chapters devoted to the physical principles of RFID systems and microprocessors, and supplies up-to-date details on relevant standards and regulations. Taking into account critical modern concerns, this handbook provides the latest information on: the use of RFID in ticketing and electronic passports; the security of RFID systems, explaining attacks on RFID systems and other security matters, such as transponder emulation and cloning, defence using cryptographic methods, and electronic article surveillance; frequency ranges and radio licensing regulations. The text explores schematic circuits of simple transponders and readers, and includes new material on active and passive transponders, ISO/IEC 18000 family, ISO/IEC 15691 and 15692. It also describes the technical limits of RFID systems. A unique resource offering a complete overview of the large and varied world of RFID, Klaus Finkenzeller’s volume is useful for end-users of the technology as well as practitioners in auto ID and IT designers of RFID products. Computer and electronics engineers in security system development, microchip designers, and materials handling specialists benefit from this book, as do automation, industrial and transport engineers. Clear and thorough explanations also make this an excellent introduction to the topic for graduate level students in electronics and industrial engineering design. Klaus Finkenzeller was awarded the Fraunhofer-Smart Card Prize 2008 for the second edition of this publication, which was celebrated for being an outstanding contribution to the smart card field.