Conception, realisation et validation d'un circuit integre de test pour la fiabilisation des technologies d'encapsulation plastique

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (494 download)

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Book Synopsis Conception, realisation et validation d'un circuit integre de test pour la fiabilisation des technologies d'encapsulation plastique by : Christine Ducos

Download or read book Conception, realisation et validation d'un circuit integre de test pour la fiabilisation des technologies d'encapsulation plastique written by Christine Ducos and published by . This book was released on 1997 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Conception, réalisation et validation d'un circuit intégré de test pour la fiabilisation des technologies d'encapsulation plastique

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ISBN 13 :
Total Pages : 235 pages
Book Rating : 4.:/5 (489 download)

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Book Synopsis Conception, réalisation et validation d'un circuit intégré de test pour la fiabilisation des technologies d'encapsulation plastique by : Christine Ducos

Download or read book Conception, réalisation et validation d'un circuit intégré de test pour la fiabilisation des technologies d'encapsulation plastique written by Christine Ducos and published by . This book was released on 1997 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: L'UTILISATION DE RESINES D'ENROBAGE, PLUTOT QUE DE MATERIAUX TELS QUE LA CERAMIQUE OU LE METAL, POUR REALISER LES BOITIERS D'ENCAPSULATION DES CIRCUITS INTEGRES A PERMIS DE DIMINUER DE MANIERE SIGNIFICATIVE LES COUTS DE PRODUCTION. CEPENDANT, LA NATURE MEME DES BOITIERS PLASTIQUE EST SOURCE DE PROBLEMES SPECIFIQUES DE FIABILITE. POUR EVALUER LA FIABILITE D'UN BOITIER, IL CONVIENT DONC DE SE DOTER D'OUTILS PARTICULIERS. LE TRAVAIL REALISE A CONSISTE EN LA MISE AU POINT D'UN CIRCUIT DE TEST CONDUISANT A UNE MEILLEURE COMPREHENSION DES DIFFERENTS MECANISMES MIS EN JEU LORS DES PHENOMENES DE DEGRADATION. DES SIMULATIONS PAR ELEMENTS FINIS ONT PERMIS D'ETUDIER L'EVOLUTION DES ZONES SENSIBLES DES BOITIERS EN FONCTION DES TYPES DE MATERIAUX UTILISES. CES DEUX APPROCHES COMPLEMENTAIRES REPRESENTENT DONC DES OUTILS D'AIDE DANS LE CHOIX DES MATERIAUX ET DES GEOMETRIES LORS DE LA CONCEPTION D'UN BOITIER.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 0387235213
Total Pages : 310 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz

Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Digital Circuit Testing

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Publisher : Elsevier
ISBN 13 : 0080504345
Total Pages : 248 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Digital Circuit Testing by : Francis C. Wong

Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Digital Systems Testing and Testable Design

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Publisher : Wiley-IEEE Press
ISBN 13 : 9780780310629
Total Pages : 672 pages
Book Rating : 4.3/5 (16 download)

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Book Synopsis Digital Systems Testing and Testable Design by : Miron Abramovici

Download or read book Digital Systems Testing and Testable Design written by Miron Abramovici and published by Wiley-IEEE Press. This book was released on 1994-09-27 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Design for Testability, Debug and Reliability

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Publisher : Springer
ISBN 13 : 9783030692087
Total Pages : 164 pages
Book Rating : 4.6/5 (92 download)

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Book Synopsis Design for Testability, Debug and Reliability by : Sebastian Huhn

Download or read book Design for Testability, Debug and Reliability written by Sebastian Huhn and published by Springer. This book was released on 2021-05-01 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Digital System Verification

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Publisher : Springer
ISBN 13 : 9783031798146
Total Pages : 0 pages
Book Rating : 4.7/5 (981 download)

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Book Synopsis Digital System Verification by : Lun Li

Download or read book Digital System Verification written by Lun Li and published by Springer. This book was released on 2010-02-18 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large designs before fabrication poses an extremely challenging problem. Formal verification validates the correctness of the implementation of a design with respect to its specification through mathematical proof techniques. Formal techniques have been emerging as commercialized EDA tools in the past decade. Simulation remains a predominantly used tool to validate a design in industry. After more than 50 years of development, simulation methods have reached a degree of maturity, however, new advances continue to be developed in the area. A simulation approach for functional verification can theoretically validate all possible behaviors of a design but requires excessive computational resources. Rapidly evolving markets demand short design cycles while the increasing complexity of a design causes simulation approaches to provide less and less coverage. Formal verification is an attractive alternative since 100% coverage can be achieved; however, large designs impose unrealistic computational requirements. Combining formal verification and simulation into a single integrated circuit validation framework is an attractive alternative. This book focuses on an Integrated Design Validation (IDV) system that provides a framework for design validation and takes advantage of current technology in the areas of simulation and formal verification resulting in a practical validation engine with reasonable runtime. After surveying the basic principles of formal verification and simulation, this book describes the IDV approach to integrated circuit functional validation. Table of Contents: Introduction / Formal Methods Background / Simulation Approaches / Integrated Design Validation System / Conclusion and Summary

Conception et réalisation d'un module de test d'intégrité des signaux pour un circuit intégré de grande surface

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Publisher :
ISBN 13 :
Total Pages : 278 pages
Book Rating : 4.:/5 (575 download)

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Book Synopsis Conception et réalisation d'un module de test d'intégrité des signaux pour un circuit intégré de grande surface by : Daniel Picard

Download or read book Conception et réalisation d'un module de test d'intégrité des signaux pour un circuit intégré de grande surface written by Daniel Picard and published by . This book was released on 2004 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Validation des séquences de test des circuits intégrés complexes

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ISBN 13 :
Total Pages : 233 pages
Book Rating : 4.:/5 (636 download)

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Book Synopsis Validation des séquences de test des circuits intégrés complexes by : Mohamed Abid (professeur d'électronique).)

Download or read book Validation des séquences de test des circuits intégrés complexes written by Mohamed Abid (professeur d'électronique).) and published by . This book was released on 1989 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: LE TRAVAIL PRESENTE DANS CE DOCUMENT A ETE REALISE AU SEIN DU GERII, DANS LE CADRE D'UNE COLLABORATION MENEE AVEC LE GROUPE D'EXPERTS 9 DE L'UNION TECHNIQUE DE L'ELECTRICITE SUR LA NORMALISATION DES OUTILS DE CONTROLE. IL CONCERNE L'ETUDE ET LA REALISATION D'UN OUTIL INFORMATIQUE, INTEGRE AU PROJET SOLINE, PERMETTANT LA COMPREHENSION ET LA VALIDATION DES SEQUENCES DE TEST DES CIRCUTIS INTEGRES COMPLEXES. L'ANALYSE CRITIQUE DES DIFFERENTES METHODES DE GENERATION DES SEQUENCES DE TEST FONCTIONNEL DES CIRCUITS COMPLEXES MONTRE LA NECESSITE DE VALIDER CES SEQUENCES APRES LEUR ELABORATION. L'APPROCHE UTILISEE ICI EST BASEE SUR L'IDENTIFICATION DU CIRCUIT ETUDIE A PARTIR DES RELATIONS ENTREES/SORTIES DEFINIES PAR LA SEQUENCE DE TEST: LES SOLUTIONS (MODELISEES PAR DES GRAPHES CARTESIENS) DEDUITES DE L'IDENTIFICATION SONT COMPAREES AU MODELE BON. PLUSIEURS JEUX DE CONTRAINTES PERMETTENT D'ADAPTER L'ANALYSE AU NIVEAU DE CONNAISSANCE APPORTEE PAR LE MODELE DU CIRCUIT. LE LOGICIEL REALISE A ETE UTILISE POUR VALIDER UNE SEQUENCE DE TEST D'UN CIRCUIT INTEGRE REEL (6800). NOUS CONCLUONS SUR LA FAISABILITE D'UNE TELLE APPROCHE QUI MET EN UVRE DES PROCESSUS COMBINATOIRES COMPLEXES

Design for Testability, Debug and Reliability

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Publisher :
ISBN 13 : 9783030692100
Total Pages : 0 pages
Book Rating : 4.6/5 (921 download)

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Book Synopsis Design for Testability, Debug and Reliability by : Sebastian Huhn

Download or read book Design for Testability, Debug and Reliability written by Sebastian Huhn and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

Modern Surface Organometallic Chemistry

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Publisher : John Wiley & Sons
ISBN 13 : 3527627103
Total Pages : 725 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Modern Surface Organometallic Chemistry by : Jean-Marie Basset

Download or read book Modern Surface Organometallic Chemistry written by Jean-Marie Basset and published by John Wiley & Sons. This book was released on 2009-07-10 with total page 725 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering everything from the basics to recent applications, this monograph represents an advanced overview of the field. Edited by internationally acclaimed experts respected throughout the community, the book is clearly divided into sections on fundamental and applied surface organometallic chemistry. Backed by numerous examples from the recent literature, this is a key reference for all chemists.