Capacitance Spectroscopy Of Semiconductors

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Capacitance Spectroscopy of Semiconductors

Author : Jian V. Li
Publisher : CRC Press
ISBN 13 : 1351368451
Total Pages : 444 pages
Book Rating : 4.3/5 (513 download)

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Book Synopsis Capacitance Spectroscopy of Semiconductors by : Jian V. Li

Download or read book Capacitance Spectroscopy of Semiconductors written by Jian V. Li and published by CRC Press. This book was released on 2018-07-06 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

Capacitance Spectroscopy of Semiconductors

Author : Jian V. Li
Publisher : CRC Press
ISBN 13 : 1351368443
Total Pages : 320 pages
Book Rating : 4.3/5 (513 download)

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Book Synopsis Capacitance Spectroscopy of Semiconductors by : Jian V. Li

Download or read book Capacitance Spectroscopy of Semiconductors written by Jian V. Li and published by CRC Press. This book was released on 2018-07-06 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

Extended Defects in Semiconductors

Author : D. B. Holt
Publisher : Cambridge University Press
ISBN 13 : 1139463594
Total Pages : 625 pages
Book Rating : 4.1/5 (394 download)

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Book Synopsis Extended Defects in Semiconductors by : D. B. Holt

Download or read book Extended Defects in Semiconductors written by D. B. Holt and published by Cambridge University Press. This book was released on 2007-04-12 with total page 625 pages. Available in PDF, EPUB and Kindle. Book excerpt: A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy

Author : Lev Solomonovich Berman
Publisher :
ISBN 13 :
Total Pages : 122 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy by : Lev Solomonovich Berman

Download or read book Purity Control of Semiconductors by the Method of Capacitance Transient Spectroscopy written by Lev Solomonovich Berman and published by . This book was released on 1995 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Identification of Defects in Semiconductors

Author :
Publisher : Academic Press
ISBN 13 : 9780080864495
Total Pages : 434 pages
Book Rating : 4.8/5 (644 download)

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Book Synopsis Identification of Defects in Semiconductors by :

Download or read book Identification of Defects in Semiconductors written by and published by Academic Press. This book was released on 1998-10-27 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: GENERAL DESCRIPTION OF THE SERIES Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry. GENERAL DESCRIPTION OF THE VOLUME This volume has contributions on Advanced Characterization Techniques with a focus on defect identification. The combination of beam techniques with electrical and optical characterization has not been discussed elsewhere.

Narrow Gap Semiconductors 1995

Author : J.L Reno
Publisher : CRC Press
ISBN 13 : 1000112403
Total Pages : 401 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Narrow Gap Semiconductors 1995 by : J.L Reno

Download or read book Narrow Gap Semiconductors 1995 written by J.L Reno and published by CRC Press. This book was released on 2020-11-25 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Narrow Gap Semiconductors 1995 contains the invited and contributed papers presented at the Seventh International Conference on Narrow Gap Semiconductors, held in January 1995. The invited review papers provide an overview and the contributed papers provide in-depth coverage of research results across the whole field.

Semiconductor Measurement Technology

Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 128 pages
Book Rating : 4.:/5 (327 download)

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Book Synopsis Semiconductor Measurement Technology by : National Institute of Standards and Technology (U.S.)

Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electronic Structure of Metal-Semiconductor Contacts

Author : Winfried Mönch
Publisher : Springer Science & Business Media
ISBN 13 : 9400906579
Total Pages : 302 pages
Book Rating : 4.4/5 (9 download)

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Book Synopsis Electronic Structure of Metal-Semiconductor Contacts by : Winfried Mönch

Download or read book Electronic Structure of Metal-Semiconductor Contacts written by Winfried Mönch and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interface and surface science have been important in the development of semicon ductor physics right from the beginning on. Modern device concepts are not only based on p-n junctions, which are interfaces between regions containing different types of dopants, but take advantage of the electronic properties of semiconductor insulator interfaces, heterojunctions between distinct semiconductors, and metal semiconductor contacts. The latter ones stood almost at the very beginning of semi conductor physics at the end of the last century. The rectifying properties of metal-semiconductor contacts were first described by Braun in 1874. A physically correct explanation of unilateral conduction, as this deviation from Ohm's law was called, could not be given at that time. A prerequisite was Wilson's quantum theory of electronic semi-conductors which he published in 1931. A few years later, in 1938, Schottky finally explained the rectification at metal-semiconductor contacts by a space-

Semiconductor Radiation Detectors

Author : Alan Owens
Publisher : CRC Press
ISBN 13 : 1351629166
Total Pages : 784 pages
Book Rating : 4.3/5 (516 download)

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Book Synopsis Semiconductor Radiation Detectors by : Alan Owens

Download or read book Semiconductor Radiation Detectors written by Alan Owens and published by CRC Press. This book was released on 2019-05-31 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: Choice Recommended Title, July 2020 Bringing together material scattered across many disciplines, Semiconductor Radiation Detectors provides readers with a consolidated source of information on the properties of a wide range of semiconductors; their growth, characterization and the fabrication of radiation sensors with emphasis on the X- and gamma-ray regimes. It explores the promise and limitations of both the traditional and new generation of semiconductors and discusses where the future in semiconductor development and radiation detection may lie. The purpose of this book is two-fold; firstly to serve as a text book for those new to the field of semiconductors and radiation detection and measurement, and secondly as a reference book for established researchers working in related disciplines within physics and engineering. Features: The only comprehensive book covering this topic Fully up-to-date with new developments in the field Provides a wide-ranging source of further reference material

Compound Semiconductor Radiation Detectors

Author : Alan Owens
Publisher : Taylor & Francis
ISBN 13 : 1439873135
Total Pages : 570 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Compound Semiconductor Radiation Detectors by : Alan Owens

Download or read book Compound Semiconductor Radiation Detectors written by Alan Owens and published by Taylor & Francis. This book was released on 2016-04-19 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt: For many applications, compound semiconductors are now viable competitors to elemental semiconductors because of their wide range of physical properties. This book describes all aspects of radiation detection and measurement using compound semiconductors, including crystal growth, detector fabrication, contacting, and spectroscopic performance (with particular emphasis on the X- and gamma-ray regimes). A concentrated reference for researchers in various disciplines as well as graduate students in specialized courses, the text outlines the potential and limitations of semiconductor detectors.

Characterization in Compound Semiconductor Processing

Author : Yale Strausser
Publisher : Momentum Press
ISBN 13 : 1606500414
Total Pages : 217 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis Characterization in Compound Semiconductor Processing by : Yale Strausser

Download or read book Characterization in Compound Semiconductor Processing written by Yale Strausser and published by Momentum Press. This book was released on 2010 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Characterization in Compound Semiconductor Processing is for scientists and engineers working with compound semiconductor materials and devices who are not characterization specialists. Materials and processes typically used in R&D and in the fabrication of GaAs, GaA1As, InP and HgCdTe based devices provide examples of common analytical problems. The book discusses a variety of characterization techniques to provide insight into how each individually, or in combination, might be used in solving problems associated with these materials. The book will help in the selection and application of the appropriate analytical techniques by its coverage of all stages of materials or device processing: substrate preparation, epitaxial growth, dielectric film deposition, contact formation and dopant introduction."--P. [4] of cover.

Point and Extended Defects in Semiconductors

Author : Giorgio Benedek
Publisher : Springer Science & Business Media
ISBN 13 : 1468457098
Total Pages : 286 pages
Book Rating : 4.4/5 (684 download)

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Book Synopsis Point and Extended Defects in Semiconductors by : Giorgio Benedek

Download or read book Point and Extended Defects in Semiconductors written by Giorgio Benedek and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

Encyclopedic Dictionary of Condensed Matter Physics

Author : Charles P. Poole, Jr.
Publisher : Academic Press
ISBN 13 : 0080545238
Total Pages : 1672 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Encyclopedic Dictionary of Condensed Matter Physics by : Charles P. Poole, Jr.

Download or read book Encyclopedic Dictionary of Condensed Matter Physics written by Charles P. Poole, Jr. and published by Academic Press. This book was released on 2004-03-11 with total page 1672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is a translation and revision of the Original Russian version by Baryahktar. It covers all of the main fields involved in Condensed Matter Physics, such as crystallography, electrical properties, fluids, magnetism, material properties, optics, radiation, semiconductors, and superconductivity, as well as highlights of important related subjects such as quantum mechanics, spectroscopy, and statistical mechanics. Both theoretical and experimental aspects of condensed matter are covered in detail. The entries range from very short paragraphs on topics where definitions are needed, such as Bloch's law, clathrate compound, donor, domain, Kondo lattice, mean free path, and Wigner crystal, to long discussions of more general or more comprehensive topics such as antiferromagnetism, crystal lattice dynamics, dislocations, Fermi surface, Josephson effect, luminescence, magnetic films, phase transitions and semiconductors. The main theoretical approaches to Condensed Matter Physics are explained. There are several long tables on, for example, Bravais lattices, characteristics of magnetic materials, units of physical quantities, symmetry groups. The properties of the main elements of the periodic table are given. Numerous entries not covered by standard Solid State Physics texts o Self-similarity o The adiabatic approximation o Bistability Emphasis on materials not discussed in standard texts o Activated carborn o Austenite o Bainite o Calamitics o Carbine o Delat phase o Discotics o Gunier-Preston zones o Heterodesmic structures o Heusler Alloys o Stress and strain deviators o Vicalloy · Each entry is fully cross-referenced to help tracking down all aspects of a topic under investigation Highly illustrated to clarify many concepts

Compound Semiconductors 1996, Proceedings of the Twenty-Third INT Symposium on Compound Semiconductors held in St Petersburg, Russia, 23-27 September 1996

Download Compound Semiconductors 1996, Proceedings of the Twenty-Third INT Symposium on Compound Semiconductors held in St Petersburg, Russia, 23-27 September 1996 PDF Online Free

Author : M.S. Shur
Publisher : CRC Press
ISBN 13 : 1000112314
Total Pages : 1087 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Compound Semiconductors 1996, Proceedings of the Twenty-Third INT Symposium on Compound Semiconductors held in St Petersburg, Russia, 23-27 September 1996 by : M.S. Shur

Download or read book Compound Semiconductors 1996, Proceedings of the Twenty-Third INT Symposium on Compound Semiconductors held in St Petersburg, Russia, 23-27 September 1996 written by M.S. Shur and published by CRC Press. This book was released on 2020-10-28 with total page 1087 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing a comprehensive overview of developments to both the academic and industrial communities, Compound Semiconductors 1996 covers all types of compound semiconducting materials and devices. The book includes results on blue and green lasers, heterostructure devices, nanoelectronics, and novel wide band gap semiconductors. With invited review papers and research results in current topics of interest, this volume is part of a well-known series of conferences for the dissemination of research results in the field.

Advances in Imaging and Electron Physics

Author :
Publisher : Academic Press
ISBN 13 : 008057775X
Total Pages : 473 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Advances in Imaging and Electron Physics by :

Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 1999-09-28 with total page 473 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Survey of Semiconductor Physics

Author : Karl Wolfgang Böer
Publisher : Springer Science & Business Media
ISBN 13 : 9780442006723
Total Pages : 1496 pages
Book Rating : 4.0/5 (67 download)

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Book Synopsis Survey of Semiconductor Physics by : Karl Wolfgang Böer

Download or read book Survey of Semiconductor Physics written by Karl Wolfgang Böer and published by Springer Science & Business Media. This book was released on 1990 with total page 1496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Taking up where the first volume left off, this work provides coverage of the inhomogeneous semiconductor. It deals mainly with Si and GaAs, but also investigates other materials of theoretical and practical interest, such as Ge, other III-V and II-VI compounds, and amorphous SiH. Equipped with this source, physicists, semiconductor engineers, device engineers and fabrication engineers will have access to a vast reservoir of practical information on the design, production and operations of semiconductor devices.