Ballistic Electron Emission Microscopy on Low Dimensional Structures

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ISBN 13 :
Total Pages : 95 pages
Book Rating : 4.:/5 (827 download)

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Book Synopsis Ballistic Electron Emission Microscopy on Low Dimensional Structures by : Michaela Klemenc

Download or read book Ballistic Electron Emission Microscopy on Low Dimensional Structures written by Michaela Klemenc and published by . This book was released on 2000 with total page 95 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Center for Space Microelectronics Technology

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Publisher :
ISBN 13 :
Total Pages : 142 pages
Book Rating : 4.:/5 (317 download)

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Book Synopsis Center for Space Microelectronics Technology by :

Download or read book Center for Space Microelectronics Technology written by and published by . This book was released on 1995 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic Electron Emission Microscopy and Metallic Band Structure Effects

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ISBN 13 :
Total Pages : 338 pages
Book Rating : 4.:/5 (249 download)

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Book Synopsis Ballistic Electron Emission Microscopy and Metallic Band Structure Effects by : Martin Klaus Weilmeier

Download or read book Ballistic Electron Emission Microscopy and Metallic Band Structure Effects written by Martin Klaus Weilmeier and published by . This book was released on 1998 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Modeling of Ballistic Electron Emission Microscopy

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (9 download)

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Book Synopsis Modeling of Ballistic Electron Emission Microscopy by : Yann Claveau

Download or read book Modeling of Ballistic Electron Emission Microscopy written by Yann Claveau and published by . This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: After the discovery of Giant Magneto-Resistance (GMR) by Albert Fert and Peter Grünberg, electronics had a breakthrough with the birth of a new branch called spintronics. This discipline, while still young, exploit the spin of electrons, for instance to store digital information. Most quantum devices exploiting this property of electrons consist of alternating magnetic and nonmagnetic thin layers on a semiconductor substrate. One of the best tools used for characterizing these structures, invented in 1988 by Kaiser and Bell, is the so-called Ballistic Electron Emission Microscope (BEEM). Originally, this microscope, derived from the scanning tunneling microscope (STM), was dedicated to the imaging of buried (nanometer-scale) objects and to the study of the potential barrier (Schottky barrier) formed at the interface of a metal and a semiconductor when placed in contact. With the development of spintronics, the BEEM became an essential spectroscopy technique but still fundamentally misunderstood. It was in 1996 that the first realistic model, based on the non-equilibrium Keldysh formalism, was proposed to describe the transport of electrons during BEEM experiments. In particular, this model allowed to explain some experimental results previously misunderstood. However, despite its success, its use was limited to the study of semi-infinite structures through a calculation method called decimation of Green functions. In this context, we have extended this model to the case of thin films and hetero-structures like spin valves: starting from the same postulate that electrons follow the band structure of materials in which they propagate, we have established an iterative formula allowing calculation of the Green functions of the finite system by tight-binding method. This calculation of Green's functions has been encoded in a FORTRAN 90 program, BEEM v3, in order to calculate the BEEM current and the surface density of states. In parallel, we have developed a simpler method which allows to avoid passing through the non-equilibrium Keldysh formalism. Despite its simplicity, we have shown that this intuitive approach gives some physical interpretation qualitatively similar to the non-equilibrium approach. However, for a more detailed study, the use of “non-equilibrium approach” is inevitable, especially for the detection of thickness effects linked to layer interfaces. We hope these both tools should be useful to experimentalists, especially for the Surfaces and Interfaces team of our department.

Microprobe Characterization of Optoelectronic Materials

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Publisher : CRC Press
ISBN 13 : 1040283829
Total Pages : 731 pages
Book Rating : 4.0/5 (42 download)

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Book Synopsis Microprobe Characterization of Optoelectronic Materials by : Juan Jimenez

Download or read book Microprobe Characterization of Optoelectronic Materials written by Juan Jimenez and published by CRC Press. This book was released on 2024-11-01 with total page 731 pages. Available in PDF, EPUB and Kindle. Book excerpt: Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Semiconductor Macroatoms

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Publisher : World Scientific
ISBN 13 : 1860946089
Total Pages : 332 pages
Book Rating : 4.8/5 (69 download)

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Book Synopsis Semiconductor Macroatoms by : Fausto Rossi

Download or read book Semiconductor Macroatoms written by Fausto Rossi and published by World Scientific. This book was released on 2005 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the basic physics of semiconductor macroatoms at the nanoscale as well as their potential application as building blocks for the realization of new-generation quantum devices.It provides a review on state-of-the art fabrication and characterization of semiconductor quantum dots aimed at implementing single-electron/exciton devices for quantum information processing and communication. After an introductory chapter on the fundamentals of quantum dots, a number of more specialized review articles presents a comprehensive picture of this rapidly developing field, specifically including strongly multidisciplinary topics such as state-of-the-art nanofabrication and optical characterization, fully microscopic theoretical modeling of nontrivial many-body processes, as well as design and optimization of novel quantum-device architectures.Sample Chapter(s)

Theory of Ballistic Electron Emission Microscopy

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Publisher :
ISBN 13 :
Total Pages : 934 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Theory of Ballistic Electron Emission Microscopy by : David Allen Pearson

Download or read book Theory of Ballistic Electron Emission Microscopy written by David Allen Pearson and published by . This book was released on 1999 with total page 934 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Molecular Beam Epitaxy

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ISBN 13 : 0199695822
Total Pages : 529 pages
Book Rating : 4.1/5 (996 download)

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Book Synopsis Molecular Beam Epitaxy by : John Wilfred Orton

Download or read book Molecular Beam Epitaxy written by John Wilfred Orton and published by . This book was released on 2015 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a history of Molecular Beam Epitaxy (MBE) as applied to the growth of semiconductor thin films (note that it does not cover the subject of metal thin films). It begins by examining the origins of MBE, first of all looking at the nature of molecular beams and considering their application to fundamental physics, to the development of nuclear magnetic resonance and to the invention of the microwave MASER. It shows how molecular beams of silane (SiH4) were used to study the nucleation of silicon films on a silicon substrate and how such studies were extended to compound semiconductors such as GaAs. From such surface studies in ultra-high vacuum the technique developed into a method of growing high quality single crystal films of a wide range of semiconductors. Comparing this with earlier evaporation methods of deposition and with other epitaxial deposition methods such as liquid phase and vapour phase epitaxy (LPE and VPE). The text describes the development of MBE machines from the early 'home-made' variety to that of commercial equipment and show how MBE was gradually refined to produce high quality films with atomic dimensions. This was much aided by the use of various in-situ surface analysis techniques, such as reflection high energy electron diffraction (RHEED) and mass spectrometry, a feature unique to MBE. It looks at various modified versions of the basic MBE process, then proceed to describe their application to the growth of so-called 'low-dimensional structures' (LDS) based on ultra-thin heterostructure films with thickness of order a few molecular monolayers. Further chapters cover the growth of a wide range of different compounds and describe their application to fundamental physics and to the fabrication of electronic and opto-electronic devices. The authors study the historical development of all these aspects and emphasise both the (often unexpected) manner of their discovery and development and the unique features which MBE brings to the growth of extremely complex structures with monolayer accuracy.

Ultra Low Signals in Ballistic Electron Emission Microscopy

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (555 download)

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Book Synopsis Ultra Low Signals in Ballistic Electron Emission Microscopy by : Eric Heller

Download or read book Ultra Low Signals in Ballistic Electron Emission Microscopy written by Eric Heller and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: In this work it is first shown that internal gain can be applied specifically to hot BEEM electrons without amplifying standard BEEM noise sources. It is shown that BEEM with single hot electron sensitivity (approximately a factor of 1000 improvement in the minimum detectable BEEM signal) is attainable with modified commercially existing avalanche photodiodes. This allows useful data collection at lower signal levels than previously possible. With this new low-signal capability, it was obvious that a new BEEM-like signal was being detected. We have discovered that STM tunneling generated photons that will create a false signal in most BEEM samples. Furthermore, we have characterized this effect which we call "STM-PC" and it is demonstrated with Pd/SiO2/Si and Au/SiO2/Si samples that this false signal closely mimics BEEM and is easily confused for BEEM. We discuss ways to separate real BEEM from this new effect. Separately, thermally generated kinks on steps on the Si(001) surface are counted and analyzed to determine the energy of the SB-type step. Previous work by others is extended by counting a new type of feature, the "switch" kink, to allow a more accurate determination of the energy of SB-steps in the presence of defects that will bow steps and cause non-thermal kinks. Extensive data collection along with this new extension allows a more accurate determination of the B-type kink energy than before and the first experimental evidence that this energy increases with tensile strain on the Si(001) surface. Modifications to an Omicron Variable Temperature Scanning Tunneling Microscope (VT-STM) will be presented. The VT-STM will be moved to the Electrical Engineering Department cleanroom of The Ohio State University and will allow in-situ studies of Molecular Beam Epitaxy (MBE) grown samples. Modifications, repairs, and operating procedures will be discussed for the VT-STM and supporting hardware. The bulk of the modifications to be discussed have been to allow sample transfer between the STM and the MBE machine. Last, work on Low Temperature Grown Gallium Arsenide (LTG-GaAs) will be presented. The ultimate goal of detecting nm-scale arsenic precipitates that form with annealing using BEEM was not successful.

Ballistic-Electron Emission Microscopy (BEEM) Applied to Study the Electronic Structure of Metal/Semiconductor Interfaces

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (918 download)

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Book Synopsis Ballistic-Electron Emission Microscopy (BEEM) Applied to Study the Electronic Structure of Metal/Semiconductor Interfaces by :

Download or read book Ballistic-Electron Emission Microscopy (BEEM) Applied to Study the Electronic Structure of Metal/Semiconductor Interfaces written by and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic-electron-emission Microscopy of Silicon-based Schottky Systems

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ISBN 13 :
Total Pages : 562 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Ballistic-electron-emission Microscopy of Silicon-based Schottky Systems by : Angela D. Davies

Download or read book Ballistic-electron-emission Microscopy of Silicon-based Schottky Systems written by Angela D. Davies and published by . This book was released on 1994 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic-electron emission microscopy (BEEM)

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Publisher :
ISBN 13 :
Total Pages : 69 pages
Book Rating : 4.:/5 (15 download)

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Book Synopsis Ballistic-electron emission microscopy (BEEM) by : Mario Prietsch

Download or read book Ballistic-electron emission microscopy (BEEM) written by Mario Prietsch and published by . This book was released on 1995 with total page 69 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic Electron Emission Microscopy Studies of Lateral Variation in Schottky Barrier Height

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ISBN 13 :
Total Pages : 344 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Ballistic Electron Emission Microscopy Studies of Lateral Variation in Schottky Barrier Height by : Francesca Diane Pardo

Download or read book Ballistic Electron Emission Microscopy Studies of Lateral Variation in Schottky Barrier Height written by Francesca Diane Pardo and published by . This book was released on 1998 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this dissertation, three experiments are discussed. The first BEEM (Ballistic Electron Emission Microscopy) characterization of an InAlAs Schottky barrier, an investigation into the possibility of field pinch-off in Au/GaAs samples, and the first demonstration of BEEM on a cleaved multilayer cross-section. Covers results for BEEM research, focusing on BEEM resolution and noise analysis.

Demonstration of Ballistic Electron Emission Microscopy

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ISBN 13 :
Total Pages : 96 pages
Book Rating : 4.:/5 (376 download)

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Book Synopsis Demonstration of Ballistic Electron Emission Microscopy by : Mary Alyssa Drummond

Download or read book Demonstration of Ballistic Electron Emission Microscopy written by Mary Alyssa Drummond and published by . This book was released on 1997 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic Electron Emission Microscopy Studies of Semiconductor Heterostructures

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Publisher :
ISBN 13 :
Total Pages : 270 pages
Book Rating : 4.:/5 (39 download)

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Book Synopsis Ballistic Electron Emission Microscopy Studies of Semiconductor Heterostructures by : James J. O'Shea

Download or read book Ballistic Electron Emission Microscopy Studies of Semiconductor Heterostructures written by James J. O'Shea and published by . This book was released on 1997 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic Electron Emission Microscopy of Semiconductor Interfacess

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (127 download)

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Book Synopsis Ballistic Electron Emission Microscopy of Semiconductor Interfacess by : Angela Elizabeth Fowell

Download or read book Ballistic Electron Emission Microscopy of Semiconductor Interfacess written by Angela Elizabeth Fowell and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ballistic Electron Emission Microscopy of Semiconductor Interfaces

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ISBN 13 :
Total Pages : 308 pages
Book Rating : 4.:/5 (896 download)

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Book Synopsis Ballistic Electron Emission Microscopy of Semiconductor Interfaces by : Angela Elizabeth Fowell

Download or read book Ballistic Electron Emission Microscopy of Semiconductor Interfaces written by Angela Elizabeth Fowell and published by . This book was released on 1991 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt: