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Asian Test Symposium 2nd Ats 93
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Book Synopsis 11th Asian Test Symposium (ATS'02) by :
Download or read book 11th Asian Test Symposium (ATS'02) written by and published by IEEE Computer Society Press. This book was released on 2002 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt: Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Responsive Computer Systems: Steps Toward Fault-Tolerant Real-Time Systems by : Donald Fussell
Download or read book Responsive Computer Systems: Steps Toward Fault-Tolerant Real-Time Systems written by Donald Fussell and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 283 pages. Available in PDF, EPUB and Kindle. Book excerpt: Responsive Computer Systems: Steps Towards Fault-Tolerant Real-Time Systems provides an extensive treatment of the most important issues in the design of modern Responsive Computer Systems. It lays the groundwork for a more comprehensive model that allows critical design issues to be treated in ways that more traditional disciplines of computer research have inhibited. It breaks important ground in the development of a fruitful, modern perspective on computer systems as they are currently developing and as they may be expected to develop over the next decade. Audience: An interesting and important road map to some of the most important emerging issues in computing, suitable as a secondary text for graduate level courses on responsive computer systems and as a reference for industrial practitioners.
Book Synopsis Index of Conference Proceedings by : British Library. Document Supply Centre
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 2003 with total page 870 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Books in Print written by and published by . This book was released on 1994 with total page 2132 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Kokuritsu Kokkai Toshokan shozō kagaku gijutsu kankei Ōbun kaigiroku mokuroku by : Kokuritsu Kokkai Toshokan (Japan)
Download or read book Kokuritsu Kokkai Toshokan shozō kagaku gijutsu kankei Ōbun kaigiroku mokuroku written by Kokuritsu Kokkai Toshokan (Japan) and published by . This book was released on 1997 with total page 1596 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis 国立国会図書館所蔵科学技術関係欧文会議錄目錄 by : 国立国会図書館 (Japan)
Download or read book 国立国会図書館所蔵科学技術関係欧文会議錄目錄 written by 国立国会図書館 (Japan) and published by . This book was released on 1997 with total page 1592 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Index to IEEE Publications by : Institute of Electrical and Electronics Engineers
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1996 with total page 1292 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Dependable Computing - EDDC-3 by : Jan Hlavicka
Download or read book Dependable Computing - EDDC-3 written by Jan Hlavicka and published by Springer. This book was released on 2003-06-26 with total page 442 pages. Available in PDF, EPUB and Kindle. Book excerpt: The idea of creating the European Dependable Computing Conference (EDCC) was born at the moment when the Iron Curtain fell. A group of enthusiasts, who were pre viously involved in research and teaching in the ?eld of fault tolerant computing in different European countries, agreed that there is no longer any point in keeping pre viously independent activities apart and created a steering committee which took the responsibility for preparing the EDCC calendar and appointing the chairs for the in dividual conferences. There is no single European or global professional organization that took over the responsibility for this conference, but there are three national in terest groups that sent delegates to the steering committee and support its activities, especially by promoting the conference materials. As can be seen from these materi als, they are the SEE Working Group “Dependable Computing” (which is a successor organizationof AFCET)in France,theGI/ITG/GMATechnicalCommitteeonDepend ability and Fault Tolerance in Germany, and the AICA Working Group “Dependability of Computer Systems” in Italy. In addition, committees of several global professional organizations, such as IEEE and IFIP, support this conference. Prague has been selected as a conference venue for several reasons. It is an easily accessible location that may attract many visitors by its beauty and that has a tradition in organizing international events of this kind (one of the last FTSD conferences took place here).
Download or read book ATS 2003 written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Book Synopsis Embedded Processor-Based Self-Test by : Dimitris Gizopoulos
Download or read book Embedded Processor-Based Self-Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Download or read book 国立国会図書館所蔵科学技術関係欧文会議錄目錄 written by and published by . This book was released on 1997 with total page 1594 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis 10th Anniversary Compendium of Papers from Asian Test Symposium by :
Download or read book 10th Anniversary Compendium of Papers from Asian Test Symposium written by and published by . This book was released on 2001 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Languages, Design Methods, and Tools for Electronic System Design by : Frank Oppenheimer
Download or read book Languages, Design Methods, and Tools for Electronic System Design written by Frank Oppenheimer and published by Springer. This book was released on 2015-12-11 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings together a selection of the best papers from the seventeenth edition of the Forum on specification and Design Languages Conference (FDL), which took place on October 14-16, 2014, in Munich, Germany. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems.
Book Synopsis Proceedings of Technical Papers by :
Download or read book Proceedings of Technical Papers written by and published by . This book was released on 1995 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Design for Testability, Debug and Reliability by : Sebastian Huhn
Download or read book Design for Testability, Debug and Reliability written by Sebastian Huhn and published by Springer Nature. This book was released on 2021-04-19 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Download or read book Books in Print Supplement written by and published by . This book was released on 1994 with total page 1852 pages. Available in PDF, EPUB and Kindle. Book excerpt:
