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Applied Scanning Probe Methods Viii
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Book Synopsis Applied Scanning Probe Methods VIII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods VIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 465 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Book Synopsis Applied Scanning Probe Methods X by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods X written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Book Synopsis Applied Scanning Probe Methods IX by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods IX written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 387 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
Book Synopsis Applied Scanning Probe Methods III by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods III written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-04-28 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Book Synopsis Applied Scanning Probe Methods II by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods II written by Bharat Bhushan and published by Springer. This book was released on 2009-09-02 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Book Synopsis Applied Scanning Probe Methods XI by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Book Synopsis Applied Scanning Probe Methods XIII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Applied Scanning Probe Methods VI by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods VI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-11-07 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.
Book Synopsis Applied Scanning Probe Methods I by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods I written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2014-02-26 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
Book Synopsis Hybridizing Surface Probe Microscopies by : Susana Moreno-Flores
Download or read book Hybridizing Surface Probe Microscopies written by Susana Moreno-Flores and published by CRC Press. This book was released on 2012-11-08 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books and reviews about scanning probe microscopies (SPM) cover the basics of their performance, novel developments, and state-of-the-art applications. Taking a different approach, Hybridizing Surface Probe Microscopies: Towards a Full Description of the Meso- and Nanoworlds encompasses the technical efforts in combining SPM with spectroscopic and optical complementary techniques that, altogether, provide a complete description of nanoscale and mesoscale systems and processes from corrosion to enzymatic reactions. The book is organized into eight chapters, following a general scheme that revolves around the two main capabilities of SPM: imaging and measuring interactions. Each chapter introduces key theoretical concepts and basic equations of the particular stand-alone technique with which the scanning probe microscopies are combined. Chapters end with the SPM-technique combination and some real-world examples in which the combination has been devised or used. Most chapters include a historical review of the techniques and numerous illustrations to support key ideas and provide the reader with intuitive understanding. To understand the limitations of any technique also means to understand how this technique works. This book has devoted a considerable amount of space in explaining the basics of each technique as they are being introduced. At the same time, it avoids explaining the particularities of each SPM-based technique and opts for a rather generalized approach. In short, the book’s focus is not on what SPM can do, but rather on what SPM cannot do and, most specifically, on presenting the experimental approaches that circumvent these limitations.
Book Synopsis Nanotribology and Nanomechanics II by : Bharat Bhushan
Download or read book Nanotribology and Nanomechanics II written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2011-05-30 with total page 1025 pages. Available in PDF, EPUB and Kindle. Book excerpt: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 by : Bharat Bhushan
Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2012-10-16 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Multiscale Dissipative Mechanisms and Hierarchical Surfaces by : Michael Nosonovsky
Download or read book Multiscale Dissipative Mechanisms and Hierarchical Surfaces written by Michael Nosonovsky and published by Springer Science & Business Media. This book was released on 2008-06-21 with total page 285 pages. Available in PDF, EPUB and Kindle. Book excerpt: Multiscale Dissipative Mechanisms and Hierarchical Surfaces covers the rapidly developing topics of hierarchical surfaces, roughness-induced superhydrophobicity and biomimetic surfaces. The research in these topics has been progressing rapidly in the recent years due to the advances in the nanosciences and surfaces science and due to potential applications in nanotechnology. The first in its field, this monograph provides a comprehensive review of these subjects and presents the background introduction as well as recent and new results in the area.
Book Synopsis Semiconductor Nanostructures by : Dieter Bimberg
Download or read book Semiconductor Nanostructures written by Dieter Bimberg and published by Springer Science & Business Media. This book was released on 2008-06-03 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reducing the size of a coherently grown semiconductor cluster in all three directions of space to a value below the de Broglie wavelength of a charge carrier leads to complete quantization of the energy levels, density of states, etc. Such “quantum dots” are more similar to giant atoms in a dielectric cage than to classical solids or semiconductors showing a dispersion of energy as a function of wavevector. Their electronic and optical properties depend strongly on their size and shape, i.e. on their geometry. By designing the geometry by controlling the growth of QDs, absolutely novel possibilities for material design leading to novel devices are opened. This multiauthor book written by world-wide recognized leaders of their particular fields and edited by the recipient of the Max-Born Award and Medal 2006 Professor Dieter Bimberg reports on the state of the art of the growing of quantum dots, the theory of self-organised growth, the theory of electronic and excitonic states, optical properties and transport in a variety of materials. It covers the subject from the early work beginning of the 1990s up to 2006. The topics addressed in the book are the focus of research in all leading semiconductor and optoelectronic device laboratories of the world.
Book Synopsis Atomic Force Microscopy for Biologists by : Victor J Morris
Download or read book Atomic Force Microscopy for Biologists written by Victor J Morris and published by World Scientific. This book was released on 2009-08-11 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the "natural" conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems. The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike. Contents:ApparatusBasic PrinciplesMacromoleculesInterfacial SystemsOrdered MacromoleculesCells, Tissue and BiomineralsOther Probe MicroscopesForce Spectroscopy Readership: Undergraduates, postgraduates and researchers in biophysics. Keywords:AFM;Scanning Probe Microscopy (SPM);Biophysics;Cells;Macromolecules;Imaging;Biopolymers;Interfaces;DNA;PhospholipidsKey Features:Over 70 new pages, 700 new references, bringing it bang up-to-date with current literature, and 24 new figuresOnly book covering published research, machines and methodology from inception to the present day (2009)Updated to include and an entirely new chapter on force spectroscopyReviews:“This second edition of an excellent book updates considerably the information contained, and is expanded, too. The main focus of this book are the biological applications of AFM, and these are covered very well … The chapters are in-depth and very informative, and contain lots of useful and detailed information. In general the book is well written with an informal style, and contains useful information for beginners, including detailed information on how to carry out some experiments, answers to common questions, etc. … Overall this book is highly recommended for those wishing to get an overview of the biological applications of AFM.”Peter Eaton University of Porto, Portugal Reviews of the First Edition “This book fills an important niche by providing an introduction to AFM that will be understandable to a wide range of scientists … the reader is offered an introduction of sufficient brevity to actually be read and of sufficient depth to help in defining the potential uses of SPMs in his or her own research.” Scott Fraser (California Institute of Technology, USA) Nature Cell Biology “I found this book easy to read with clear, simple explanations of a complex topic. I think that the selection of the subjects treated in the book is sufficient for the non-specialist to understand both the basic concepts of the AFM and the production of AFM images in biological systems.”Microscopy and Analysis “… is an excellent introduction for anybody wishing to enter this field … In summary I would strongly recommend this book to any biologist planning on carrying out research using SPM imaging techniques and existing users in the field who wish to broaden their knowledge of SPM imaging and the research already carried out on common biological systems.”Drew Murray JPK Instruments, Berlin “This book provides an excellent survey of novel applications. It is nicely illustrated with numerous images from leading experts in the field. Clear descriptions of the apparatus and its basic principles are provided in a way accessible to students/scientists who do not have a strong physics background. It will be useful to biologists, but also non-biologists dealing with biosystems …”Prof Y F Dufrêne UCL, Belgium
Book Synopsis Nanotribology and Nanomechanics by : Bharat Bhushan
Download or read book Nanotribology and Nanomechanics written by Bharat Bhushan and published by Springer. This book was released on 2017-04-05 with total page 928 pages. Available in PDF, EPUB and Kindle. Book excerpt: This textbook and comprehensive reference source and serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.
