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Author : Sigmund Weissmann
Publisher : Springer
ISBN 13 :
Total Pages : 560 pages
Book Rating : 4.3/5 (91 download)
Download or read book Applications of X-Ray Topographic Methods to Materials Science written by Sigmund Weissmann and published by Springer. This book was released on 1984-12 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 536 pages
Book Rating : 4.:/5 (112 download)
Download or read book Applications of X-ray Topographic Methods to Materials Science written by and published by . This book was released on 1984 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sigmund Weissmann
Publisher : Springer
ISBN 13 :
Total Pages : 562 pages
Book Rating : 4.:/5 (89 download)
Download or read book Applications of X-Ray Topographic Methods to Materials Science written by Sigmund Weissmann and published by Springer. This book was released on 1984-12 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rutgers University. Bureau of Engineering Research
Publisher :
ISBN 13 :
Total Pages : 124 pages
Book Rating : 4.E/5 ( download)
Download or read book Research Report written by Rutgers University. Bureau of Engineering Research and published by . This book was released on 1985 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : B. K. Tanner
Publisher : Elsevier
ISBN 13 : 1483187683
Total Pages : 189 pages
Book Rating : 4.4/5 (831 download)
Download or read book X-Ray Diffraction Topography written by B. K. Tanner and published by Elsevier. This book was released on 2013-10-22 with total page 189 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
Author : Eric Lifshin
Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)
Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Author : S Amelinckx
Publisher : Elsevier
ISBN 13 : 0444601864
Total Pages : 412 pages
Book Rating : 4.4/5 (446 download)
Download or read book Diffraction and Imaging Techniques in Material Science P2 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Author : Rebecca J. Pardee
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications of the National Institute of Standards and Technology 1988 Catalog written by Rebecca J. Pardee and published by . This book was released on 1989 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 408 pages
Book Rating : 4.3/5 (91 download)
Download or read book Applications of Synchrotron Radiation Techniques to Materials Science written by and published by . This book was released on 1998 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.:/5 (31 download)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zainal Arifin Ahmad
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3038139416
Total Pages : 550 pages
Book Rating : 4.0/5 (381 download)
Download or read book Advanced X-Ray Characterization Techniques written by Zainal Arifin Ahmad and published by Trans Tech Publications Ltd. This book was released on 2012-12-13 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
Author : Gubicza, Jen?
Publisher : IGI Global
ISBN 13 : 1466658533
Total Pages : 359 pages
Book Rating : 4.4/5 (666 download)
Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author : Sérgio Luiz Morelhão
Publisher : Springer
ISBN 13 : 3319195549
Total Pages : 302 pages
Book Rating : 4.3/5 (191 download)
Download or read book Computer Simulation Tools for X-ray Analysis written by Sérgio Luiz Morelhão and published by Springer. This book was released on 2015-10-05 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analysing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks. The scientific productivity worldwide is growing at a breakneck pace, demanding ever more dynamic approaches and synergies between different fields of knowledge. To master the fundamentals of X-ray physics means the opportunity of working at an infiniteness of fields, studying systems where the organizational understanding of matter at the atomic scale is necessary. Since the discovery of X radiation, its usage as investigative tool has always been under fast expansion afforded by instrumental advances and computational resources. Developments in medical and technological fields have, as one of the master girders, the feasibility of structural analysis offered by X-rays. One of the major difficulties faced by beginners in using this fantastic tool lies in the analysis of experimental data. There are only few cases where it is possible to extract structural information directly from experiments. In most cases, structure models and simulation of radiation-matter interaction processes are essential. The advent of intense radiation sources and rapid development of nanotechnology constantly creates challenges that seek solutions beyond those offered by standard X-ray techniques. Preparing new researchers for this scenario of rapid and drastic changes requires more than just teaching theories of physical phenomena. It also requires teaching of how to implement them in a simple and efficient manner. In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools.
Author :
Publisher :
ISBN 13 :
Total Pages : 1092 pages
Book Rating : 4.:/5 (3 download)
Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1988 with total page 1092 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Susan M. Mini
Publisher :
ISBN 13 :
Total Pages : 408 pages
Book Rating : 4.:/5 (318 download)
Download or read book Applications of Synchrotron Radiation Techniques to Materials Science IV: Volume 524 written by Susan M. Mini and published by . This book was released on 1998-08-17 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 57 papers update the status of characterization techniques that use synchrotron radiation since the previous symposium on the subject in the spring of 1996. The techniques considered include X-ray absorption and scattering, imaging, tomography, microscopy, and topographic methods. Among the materials are surfaces, interfaces, electronic materials, metal oxides, solar cells, thin films, carbides, polymers, alloys, nanoparticles, and graphitic materials. Some of the papers are doubled spaced. Annotation copyrighted by Book News, Inc., Portland, OR
Author : Volker Weiss
Publisher : Springer Science & Business Media
ISBN 13 : 1461329523
Total Pages : 533 pages
Book Rating : 4.4/5 (613 download)
Download or read book Nondestructive Evaluation of Materials written by Volker Weiss and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Army Materials and Mechanics Research Center of Water town, Massachusetts in cooperation with the Materials Science Group of the Department of Chemical Engineering and Materials Science of Syracuse University has conducted the Sagamore Army Materials Research Conference since 1954. The main purpose of these conferences has been to gather together over 150 scientists and engineers from academic institutions, industry and government who are uniquely qualified to explore in depth a subject of importance to the Department of Defense, the Army and the scientific community. This volume NONDESTRUCTIVE EVALUATION OF MATERIALS, addresses the areas of x-ray, ultrasonics and other methods of nondestructive testing. We wish to acknowledge the dedicated assistance of Joseph M. Bernier of the Army Materials and Mechanics Research Center and Helen Brown DeMascio of Syracuse University throughout the stages of the conference planning and finally the publication of this book. Their help is deeply appreciated. Syracuse University Syracuse, New York The Editors Contents SESSION I X-RAY S. Heissman, Moderator H. K. Herglotz, Moderator 1. Overview of X-Ray Diffraction Methods for Nondestructive Testing • • • • • • • ••• 1 L. V. Azaroff 2. Detection of Fatigue Damage by X-Rays 21 S. Taira and K. Kamachi 3. A Historical Example of Fatigue Damage • • • • • • • 55 H. K. Herglotz 4. The Application of X-Ray Topography to Materials Science . . . . . . . . . . . . . . . . . . . . 69 S. Weissman 5.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1989 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
