Advances in Metrology for X-Ray and EUV Optics IV.

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ISBN 13 :
Total Pages : pages
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Advances in Metrology for X-ray and EUV Optics

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ISBN 13 :
Total Pages : 192 pages
Book Rating : 4.3/5 (91 download)

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Advances in Metrology for X-Ray and EUV Optics VII

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ISBN 13 : 9781510612280
Total Pages : pages
Book Rating : 4.6/5 (122 download)

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Book Synopsis Advances in Metrology for X-Ray and EUV Optics VII by : Lahsen Assoufid

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Advances in Metrology for X-Ray and EUV Optics VI.

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ISBN 13 : 9781510603165
Total Pages : pages
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Advances in Metrology for X-ray and EUV Optics III

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Publisher : SPIE-International Society for Optical Engineering
ISBN 13 : 9780819482976
Total Pages : 150 pages
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Download or read book Advances in Metrology for X-ray and EUV Optics III written by Lahsen Assoufid and published by SPIE-International Society for Optical Engineering. This book was released on 2010 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821

Advances in Metrology for X-Ray and EUV Optics IV

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ISBN 13 : 9780819492180
Total Pages : 160 pages
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Book Synopsis Advances in Metrology for X-Ray and EUV Optics IV by : Lahsen Assoufid

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Advances in Metrology for X-ray and EUV Optics III

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ISBN 13 : 9780819482983
Total Pages : pages
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Advances in Metrology for X-Ray and EUV Optics VII

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ISBN 13 : 9781510612273
Total Pages : 146 pages
Book Rating : 4.6/5 (122 download)

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Advances in Metrology for X-ray and EUV Optics

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ISBN 13 : 9781510637917
Total Pages : 0 pages
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Advances in Metrology for X-Ray and EUV Optics III

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ISBN 13 :
Total Pages : pages
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Advances in Metrology for X-Ray and EUV Optics VIII.

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ISBN 13 : 9781510629127
Total Pages : pages
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Advances in Metrology for X-Ray and EUV Optics V

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ISBN 13 : 9781628412338
Total Pages : 277 pages
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Download or read book Advances in Metrology for X-Ray and EUV Optics V written by Lahsen Assoufid and published by . This book was released on 2014-10-30 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Advances in Metrology for X-ray and EUV Optics

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Publisher : Society of Photo Optical
ISBN 13 : 9780819459268
Total Pages : 184 pages
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Advances in Mirror Technology for X-ray, EUV Lithography, Laser and Other Applications

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ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (91 download)

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Advances in Metrology for X-Ray and EUV Optics VIII

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ISBN 13 : 9781510629110
Total Pages : pages
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Advances in Metrology for X-Ray and EUV Optics II

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ISBN 13 :
Total Pages : pages
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Advances in X-ray/EUV Optics, Components, and Applications

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ISBN 13 :
Total Pages : 406 pages
Book Rating : 4.3/5 (91 download)

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Download or read book Advances in X-ray/EUV Optics, Components, and Applications written by and published by . This book was released on 2006 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: