Advanced Short-time Thermal Processing for Si-based CMOS Devices

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 9781566773966
Total Pages : 488 pages
Book Rating : 4.7/5 (739 download)

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Book Synopsis Advanced Short-time Thermal Processing for Si-based CMOS Devices by : Fred Roozeboom

Download or read book Advanced Short-time Thermal Processing for Si-based CMOS Devices written by Fred Roozeboom and published by The Electrochemical Society. This book was released on 2003 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advanced Short-time Thermal Processing for Si-based CMOS Devices 2

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 9781566774062
Total Pages : 444 pages
Book Rating : 4.7/5 (74 download)

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Book Synopsis Advanced Short-time Thermal Processing for Si-based CMOS Devices 2 by : Mehmet C. Öztürk

Download or read book Advanced Short-time Thermal Processing for Si-based CMOS Devices 2 written by Mehmet C. Öztürk and published by The Electrochemical Society. This book was released on 2004 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advanced Gate Stack, Source/drain, and Channel Engineering for Si-based CMOS 2

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 1566775027
Total Pages : 472 pages
Book Rating : 4.5/5 (667 download)

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Book Synopsis Advanced Gate Stack, Source/drain, and Channel Engineering for Si-based CMOS 2 by : Fred Roozeboom

Download or read book Advanced Gate Stack, Source/drain, and Channel Engineering for Si-based CMOS 2 written by Fred Roozeboom and published by The Electrochemical Society. This book was released on 2006 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings describe processing, materials, and equipment for CMOS front-end integration including gate stack, source/drain and channel engineering. Topics: strained Si/SiGe and Si/SiGe on insulator; high-mobility channels including III-V¿s, etc.; nanowires and carbon nanotubes; high-k dielectrics, metal and FUSI gate electrodes; doping/annealing for ultra-shallow junctions; low-resistivity contacts; advanced deposition (e.g. ALD, CVD, MBE), RTP, UV, plasma and laser-assisted processes.

Handbook of Semiconductor Manufacturing Technology

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Publisher : CRC Press
ISBN 13 : 1420017667
Total Pages : 1720 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Semiconductor Manufacturing Technology by : Yoshio Nishi

Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 1720 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Advanced Gate Stack, Source/drain and Channel Engineering for Si-based CMOS

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Publisher :
ISBN 13 :
Total Pages : 658 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Advanced Gate Stack, Source/drain and Channel Engineering for Si-based CMOS by :

Download or read book Advanced Gate Stack, Source/drain and Channel Engineering for Si-based CMOS written by and published by . This book was released on 2005 with total page 658 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Dielectric Films for Advanced Microelectronics

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 0470065419
Total Pages : 508 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Dielectric Films for Advanced Microelectronics by : Mikhail Baklanov

Download or read book Dielectric Films for Advanced Microelectronics written by Mikhail Baklanov and published by John Wiley & Sons. This book was released on 2007-04-04 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: The topic of thin films is an area of increasing importance in materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are a few examples of the miniaturized device technologies that depend on the utilization of thin film materials. This book presents an in-depth overview of the novel developments made by the scientific leaders in the area of modern dielectric films for advanced microelectronic applications. It contains clear, concise explanations of material science of dielectric films and their problem for device operation, including high-k, low-k, medium-k dielectric films and also specific features and requirements for dielectric films used in the packaging technology. A broad range of related topics are covered, from physical principles to design, fabrication, characterization, and applications of novel dielectric films.

Silicon Materials Science and Technology X

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 156677439X
Total Pages : 599 pages
Book Rating : 4.5/5 (667 download)

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Book Synopsis Silicon Materials Science and Technology X by : Howard R. Huff

Download or read book Silicon Materials Science and Technology X written by Howard R. Huff and published by The Electrochemical Society. This book was released on 2006 with total page 599 pages. Available in PDF, EPUB and Kindle. Book excerpt: This was the tenth symposium of the International Symposium on Silcon Material Science and Technology, going back to 1969. This issue provides a unique historical record of the program and will aid in the understanding of silicon materials over the last 35 years.

Rapid Thermal and Other Short-time Processing Technologies III

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 9781566773348
Total Pages : 500 pages
Book Rating : 4.7/5 (733 download)

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Book Synopsis Rapid Thermal and Other Short-time Processing Technologies III by : Paul J. Timans

Download or read book Rapid Thermal and Other Short-time Processing Technologies III written by Paul J. Timans and published by The Electrochemical Society. This book was released on 2002 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Physics and Technology of High-k Gate Dielectrics II

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 9781566774055
Total Pages : 512 pages
Book Rating : 4.7/5 (74 download)

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Book Synopsis Physics and Technology of High-k Gate Dielectrics II by : Samares Kar

Download or read book Physics and Technology of High-k Gate Dielectrics II written by Samares Kar and published by The Electrochemical Society. This book was released on 2004 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This volume is the proceedings of The Second International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues ... and was held during [the] 204th Meeting [of the Electrochemical Society] ..."--P. v.

Physics and Technology of High-k Gate Dielectrics 4

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 1566775035
Total Pages : 565 pages
Book Rating : 4.5/5 (667 download)

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Book Synopsis Physics and Technology of High-k Gate Dielectrics 4 by : Samares Kar

Download or read book Physics and Technology of High-k Gate Dielectrics 4 written by Samares Kar and published by The Electrochemical Society. This book was released on 2006 with total page 565 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue covers, in detail, all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.

Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6

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Publisher : The Electrochemical Society
ISBN 13 : 1607687143
Total Pages : 356 pages
Book Rating : 4.6/5 (76 download)

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Book Synopsis Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6 by : Fred Roozeboom

Download or read book Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6 written by Fred Roozeboom and published by The Electrochemical Society. This book was released on with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Rapid Thermal and Other Short-time Processing Technologies II

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Author :
Publisher : The Electrochemical Society
ISBN 13 : 9781566773157
Total Pages : 458 pages
Book Rating : 4.7/5 (731 download)

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Book Synopsis Rapid Thermal and Other Short-time Processing Technologies II by : Dim-Lee Kwong

Download or read book Rapid Thermal and Other Short-time Processing Technologies II written by Dim-Lee Kwong and published by The Electrochemical Society. This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."

Advanced Gate Technologies for Deep-submicron CMOSFETs

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Publisher :
ISBN 13 :
Total Pages : 330 pages
Book Rating : 4.:/5 (35 download)

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Book Synopsis Advanced Gate Technologies for Deep-submicron CMOSFETs by : Hiu Yung Wong

Download or read book Advanced Gate Technologies for Deep-submicron CMOSFETs written by Hiu Yung Wong and published by . This book was released on 2006 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electromagnetic Fast-firing for the Rapid Thermal Processing of Silicon

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Author :
Publisher :
ISBN 13 :
Total Pages : 144 pages
Book Rating : 4.:/5 (89 download)

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Book Synopsis Electromagnetic Fast-firing for the Rapid Thermal Processing of Silicon by : Keith Thompson

Download or read book Electromagnetic Fast-firing for the Rapid Thermal Processing of Silicon written by Keith Thompson and published by . This book was released on 2003 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings of the ASME Heat Transfer Division--2005

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Author :
Publisher :
ISBN 13 :
Total Pages : 1070 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Proceedings of the ASME Heat Transfer Division--2005 by :

Download or read book Proceedings of the ASME Heat Transfer Division--2005 written by and published by . This book was released on 2005 with total page 1070 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Integration of Advanced Micro- and Nanoelectronic Devices--critical Issues and Solutions

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Publisher :
ISBN 13 :
Total Pages : 506 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Integration of Advanced Micro- and Nanoelectronic Devices--critical Issues and Solutions by : Materials Research Society. Meeting

Download or read book Integration of Advanced Micro- and Nanoelectronic Devices--critical Issues and Solutions written by Materials Research Society. Meeting and published by . This book was released on 2004 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This volume is the joint proceedings of papers presented in Symposium D, 'High-k Insulators and Ferroelectrics for Advanced Microelectronic Devices,' and Symposium E, 'Integration Challenges in Next-Generation Oxide-Based Nanoelectronics,' held April 13-16 at the 2004 MRS Spring Meeting in San Francisco, California."--p. x

Characterization and Metrology for ULSI Technology 2005

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Publisher : American Institute of Physics
ISBN 13 :
Total Pages : 714 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Characterization and Metrology for ULSI Technology 2005 by : David G. Seiler

Download or read book Characterization and Metrology for ULSI Technology 2005 written by David G. Seiler and published by American Institute of Physics. This book was released on 2005-09-29 with total page 714 pages. Available in PDF, EPUB and Kindle. Book excerpt: The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.