Advance Characterization Of Electronic Materials

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Advanced Techniques for Materials Characterization

Author : A.K. Tyagi
Publisher : Trans Tech Publications Ltd
ISBN 13 : 303813323X
Total Pages : 516 pages
Book Rating : 4.0/5 (381 download)

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Book Synopsis Advanced Techniques for Materials Characterization by : A.K. Tyagi

Download or read book Advanced Techniques for Materials Characterization written by A.K. Tyagi and published by Trans Tech Publications Ltd. This book was released on 2009-01-02 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

Advanced Characterization Techniques for Thin Film Solar Cells

Author : Daniel Abou-Ras
Publisher : John Wiley & Sons
ISBN 13 : 3527699015
Total Pages : 760 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras

Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Daniel Abou-Ras and published by John Wiley & Sons. This book was released on 2016-07-13 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

Advanced Characterization and Testing of Textiles

Author : Patricia I. Dolez
Publisher : Woodhead Publishing
ISBN 13 : 0081004540
Total Pages : 476 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Advanced Characterization and Testing of Textiles by : Patricia I. Dolez

Download or read book Advanced Characterization and Testing of Textiles written by Patricia I. Dolez and published by Woodhead Publishing. This book was released on 2017-09-19 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced Characterization and Testing of Textiles explores developments in physical and chemical testing and specific high-performance tests relating to textiles. The book introduces the principles of advanced characterization and testing, including the importance of performance-based specifications in the textiles industry. Chapters are organized by textile properties, providing in-depth coverage of each characteristic. Tests for specific applications are addressed, with the main focus on high-performance and technical textiles. - Focuses on advanced testing methods for technical and high-performance textiles, covering state-of-the-art technology in its field - Details specific textile properties and associated testing for each characteristic

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures

Author : Jan Stehr
Publisher : Woodhead Publishing
ISBN 13 : 0081020546
Total Pages : 309 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Defects in Advanced Electronic Materials and Novel Low Dimensional Structures by : Jan Stehr

Download or read book Defects in Advanced Electronic Materials and Novel Low Dimensional Structures written by Jan Stehr and published by Woodhead Publishing. This book was released on 2018-06-29 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap. - Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayers - Addresses a range of defects in a variety of systems, providing a comparative approach - Includes sections on advances in theory that provide insights on where this body of research might lead

Advanced Electrical and Electronics Materials

Author : K. M. Gupta
Publisher : John Wiley & Sons
ISBN 13 : 111899857X
Total Pages : 672 pages
Book Rating : 4.1/5 (189 download)

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Book Synopsis Advanced Electrical and Electronics Materials by : K. M. Gupta

Download or read book Advanced Electrical and Electronics Materials written by K. M. Gupta and published by John Wiley & Sons. This book was released on 2015-02-23 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive and unique book is intended to cover the vast and fast-growing field of electrical and electronic materials and their engineering in accordance with modern developments. Basic and pre-requisite information has been included for easy transition to more complex topics. Latest developments in various fields of materials and their sciences/engineering, processing and applications have been included. Latest topics like PLZT, vacuum as insulator, fiber-optics, high temperature superconductors, smart materials, ferromagnetic semiconductors etc. are covered. Illustrations and examples encompass different engineering disciplines such as robotics, electrical, mechanical, electronics, instrumentation and control, computer, and their inter-disciplinary branches. A variety of materials ranging from iridium to garnets, microelectronics, micro alloys to memory devices, left-handed materials, advanced and futuristic materials are described in detail.

Characterization of Advanced Materials

Author : W. Altergott
Publisher : Springer Science & Business Media
ISBN 13 : 146153688X
Total Pages : 185 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Characterization of Advanced Materials by : W. Altergott

Download or read book Characterization of Advanced Materials written by W. Altergott and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 185 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Nanoelectronics and Information Technology

Author : Rainer Waser
Publisher : John Wiley & Sons
ISBN 13 : 3527409270
Total Pages : 1041 pages
Book Rating : 4.5/5 (274 download)

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Book Synopsis Nanoelectronics and Information Technology by : Rainer Waser

Download or read book Nanoelectronics and Information Technology written by Rainer Waser and published by John Wiley & Sons. This book was released on 2012-05-29 with total page 1041 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fachlich auf höchstem Niveau, visuell überzeugend und durchgängig farbig illustriert: Das ist die neue Auflage der praxisbewährten Einführung in spezialisierte elektronische Materialien und Bauelemente aus der Informationstechnologie. Über ein Drittel des Inhalts ist neu, alle anderen Beiträge wurden gründlich überarbeitet und aktualisiert.

Mechanical Characterization Using Digital Image Correlation

Author : Matthias Merzkirch
Publisher : Springer Nature
ISBN 13 : 3030840409
Total Pages : 311 pages
Book Rating : 4.0/5 (38 download)

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Book Synopsis Mechanical Characterization Using Digital Image Correlation by : Matthias Merzkirch

Download or read book Mechanical Characterization Using Digital Image Correlation written by Matthias Merzkirch and published by Springer Nature. This book was released on 2021-12-14 with total page 311 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, a precise treatment of the experimental characterization of advanced composite materials using Digital Image Correlation (DIC) is presented. The text explains test methods, testing setup with 2D- and stereo-DIC, specimen preparation and patterning, testing analysis and data reduction schemes to determine and to compare mechanical properties, such as modulus, strength and fracture toughness of advanced composite materials. Sensitivity and uncertainty studies on the DIC calculated data and mechanical properties for a detailed engineering-based understanding are covered instead of idealized theories and sugarcoated results. The book provides students, instructors, researchers and engineers in industrial or government institutions, and practitioners working in the field of experimental/applied structural mechanics of materials a myriad of color figures from DIC measurements for better explanation, datasets of material properties serving as input parameters for analytical modelling, raw data and computer codes for data reduction, illustrative graphs for teaching purposes, practice exercises with solutions provided online and extensive references to the literature at the end of each stand-alone chapter.

Advanced Materials for Thermal Management of Electronic Packaging

Author : Xingcun Colin Tong
Publisher : Springer Science & Business Media
ISBN 13 : 1441977597
Total Pages : 633 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Advanced Materials for Thermal Management of Electronic Packaging by : Xingcun Colin Tong

Download or read book Advanced Materials for Thermal Management of Electronic Packaging written by Xingcun Colin Tong and published by Springer Science & Business Media. This book was released on 2011-01-05 with total page 633 pages. Available in PDF, EPUB and Kindle. Book excerpt: The need for advanced thermal management materials in electronic packaging has been widely recognized as thermal challenges become barriers to the electronic industry’s ability to provide continued improvements in device and system performance. With increased performance requirements for smaller, more capable, and more efficient electronic power devices, systems ranging from active electronically scanned radar arrays to web servers all require components that can dissipate heat efficiently. This requires that the materials have high capability of dissipating heat and maintaining compatibility with the die and electronic packaging. In response to critical needs, there have been revolutionary advances in thermal management materials and technologies for active and passive cooling that promise integrable and cost-effective thermal management solutions. This book meets the need for a comprehensive approach to advanced thermal management in electronic packaging, with coverage of the fundamentals of heat transfer, component design guidelines, materials selection and assessment, air, liquid, and thermoelectric cooling, characterization techniques and methodology, processing and manufacturing technology, balance between cost and performance, and application niches. The final chapter presents a roadmap and future perspective on developments in advanced thermal management materials for electronic packaging.

Preparation and Characterization of Materials

Author : J Honig
Publisher : Elsevier
ISBN 13 : 0323144357
Total Pages : 622 pages
Book Rating : 4.3/5 (231 download)

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Book Synopsis Preparation and Characterization of Materials by : J Honig

Download or read book Preparation and Characterization of Materials written by J Honig and published by Elsevier. This book was released on 2012-12-02 with total page 622 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preparation and Characterization of Materials brings together the proceedings of the Indo-U.S. Workshop on the Preparation and Characterization of Materials, held on February 19-23, 1981, at the Indian Institute of Science in Bangalore, India. The papers focus on advances and developments in the preparation and characterization of materials such as ferroics, layered materials, metal oxides and other electronic materials, amorphous materials including glasses, and high-temperature ceramics. This book is comprised of 25 chapters and begins with a discussion on crystal growth and other preparation techniques, touching on topics such as solid state synthesis of complex oxides and preparation of soft ferrites. The application of neutron scattering techniques and analytical electron microscopy to materials research and materials science is then considered, along with the dielectric and electro-optic applications of ferroics and the preparation and characterization of synthetic layered inorganic ion exchangers. Subsequent chapters deal with metal oxides and other electronic materials; glasses and other amorphous materials; and high-temperature ceramics such as silicon nitride. This monograph will be of interest to materials scientists and engineers as well as students and researchers in materials science.

Materials Characterization

Author : Yang Leng
Publisher : John Wiley & Sons
ISBN 13 : 0470822996
Total Pages : 384 pages
Book Rating : 4.4/5 (78 download)

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Book Synopsis Materials Characterization by : Yang Leng

Download or read book Materials Characterization written by Yang Leng and published by John Wiley & Sons. This book was released on 2009-03-04 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Advances in Semiconductor Nanostructures

Author : Alexander V. Latyshev
Publisher : Elsevier
ISBN 13 : 0128105135
Total Pages : 553 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Advances in Semiconductor Nanostructures by : Alexander V. Latyshev

Download or read book Advances in Semiconductor Nanostructures written by Alexander V. Latyshev and published by Elsevier. This book was released on 2016-11-10 with total page 553 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications focuses on the physical aspects of semiconductor nanostructures, including growth and processing of semiconductor nanostructures by molecular-beam epitaxy, ion-beam implantation/synthesis, pulsed laser action on all types of III–V, IV, and II–VI semiconductors, nanofabrication by bottom-up and top-down approaches, real-time observations using in situ UHV-REM and high-resolution TEM of atomic structure of quantum well, nanowires, quantum dots, and heterostructures and their electrical, optical, magnetic, and spin phenomena. The very comprehensive nature of the book makes it an indispensable source of information for researchers, scientists, and post-graduate students in the field of semiconductor physics, condensed matter physics, and physics of nanostructures, helping them in their daily research. - Presents a comprehensive reference on the novel physical phenomena and properties of semiconductor nanostructures - Covers recent developments in the field from all over the world - Provides an International approach, as chapters are based on results obtained in collaboration with research groups from Russia, Germany, France, England, Japan, Holland, USA, Belgium, China, Israel, Brazil, and former Soviet Union countries

Properties of Advanced Semiconductor Materials

Author : Michael E. Levinshtein
Publisher : John Wiley & Sons
ISBN 13 : 9780471358275
Total Pages : 220 pages
Book Rating : 4.3/5 (582 download)

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Book Synopsis Properties of Advanced Semiconductor Materials by : Michael E. Levinshtein

Download or read book Properties of Advanced Semiconductor Materials written by Michael E. Levinshtein and published by John Wiley & Sons. This book was released on 2001-02-21 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing the most reliable parameter values for each of these semiconductor materials, along with applicable references, these data are organized in a structured, logical way for each semiconductor material. * Reviews traditional semiconductor materials as well as new, advanced semiconductors. * Essential authoritative handbook on the properties of semiconductor materials.

Electronic Materials

Author : L.S. Miller
Publisher : Springer Science & Business Media
ISBN 13 : 1461538181
Total Pages : 549 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Electronic Materials by : L.S. Miller

Download or read book Electronic Materials written by L.S. Miller and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 549 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electronic materials are a dominant factor in many areas of modern technology. The need to understand'them is paramount; this book addresses that need. The main aim of this volume is to provide a broad unified view of electronic materials, including key aspects of their science and technology and also, in many cases, their commercial implications. It was considered important that much of the contents of such an overview should be intelligible by a broad audience of graduates and industrial scientists, and relevant to advanced undergraduate studies. It should also be up to date and even looking forward to the future. Although more extensive, and written specifically as a text, the resulting book has much in common with a short course of the same name given at Coventry Polytechnic. The interpretation of the term "electronic materials" used in this volume is a very broad one, in line with the initial aim. The principal restriction is that, with one or two minor exceptions relating to aspects of device processing, for example, the materials dealt with are all active materials. Materials such as simple insulators or simple conductors, playing only a passive role, are not singled out for consider ation. Active materials might be defined as those involved in the processing of signals in a way that depends crucially on some specific property of those materials, and the immediate question then concerns the types of signals that might be considered.

Advanced Characterization of Thin Film Solar Cells

Author : Mowafak Al-Jassim
Publisher : Institution of Engineering and Technology
ISBN 13 : 1839530235
Total Pages : 457 pages
Book Rating : 4.8/5 (395 download)

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Book Synopsis Advanced Characterization of Thin Film Solar Cells by : Mowafak Al-Jassim

Download or read book Advanced Characterization of Thin Film Solar Cells written by Mowafak Al-Jassim and published by Institution of Engineering and Technology. This book was released on 2020-09-17 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Polycrystalline thin-film solar cells have reached a levelized cost of energy that is competitive with all other sources of electricity. The technology has significantly improved in recent years, with laboratory cell efficiencies for cadmium telluride (CdTe), perovskites, and copper indium gallium diselenide (CIGS) each exceeding 22 percent. Both CdTe and CIGS solar panels are now produced at the gigawatt scale. However, there are ongoing challenges, including the continued need to improve performance and stability while reducing cost. Advancing polycrystalline solar cell technology demands an in-depth understanding of efficiency, scaling, and degradation mechanisms, which requires sophisticated characterization methods. These methods will enable researchers and manufacturers to improve future solar modules and systems.

X-ray Characterization of Materials

Author : Eric Lifshin
Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis X-ray Characterization of Materials by : Eric Lifshin

Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.