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Accounting For The Dead Time In Analysis Of Time Of Flight Secondary Ion Mass Spectrometry Data
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Book Synopsis Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data by : Negar Shahrokhesfahani
Download or read book Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data written by Negar Shahrokhesfahani and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass spectra at each pixel at an imaged area. Many ToF SIMS instruments use a type of detector that suffers from two problems that lead to non-linearity in the measured sample properties: detector saturation and dead time. Linearity in this type of system is defined as the proportionality of the measured and true ion counts. Non-linearity can influence the interpretation of the data with methods such as multivariate analysis. "Detector saturation" happens when more than one ion arrives at the detector in the time interval related to one specific channel but the detector records only a single count. "Dead time" is when one event happens at a certain channel and the detector become insensitive to subsequent ions arriving within the dead time window. These problems both lead to under-counting of ions. In this thesis, we mainly focus on correcting for the dead time effects. Using extensive simulations, we first characterize the adverse effects of dead time on the output and evaluate quality of existing ways to "correct" for dead time effects. Then, we propose a novel method using the Maximum Likelihood Estimation (MLE) to estimate the true spectrum for the measured data. Specifically, we incorporate the statistical distribution of the dead time affected data in MLE, which leads to a new method for dead time correction.
Book Synopsis Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files by :
Download or read book Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files written by and published by . This book was released on 2007 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Time-of-flight Secondary Ion Mass Spectrometry by : Joanna Lee
Download or read book Time-of-flight Secondary Ion Mass Spectrometry written by Joanna Lee and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000 +; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. This thesis describes research undertaken to address the above challenges. Sample topography and field effects were evaluated experimentally using model conducting and insulating fibres and compared with computer simulations to provide recommendation to diagnose and reduce the effects. Two popular multivariate methods, principal component analysis (PCA) and multivariate curve resolution (MCR), were explored using mixed organic systems consisting of a simple polymer blend and complex hair fibres treated with a multi-component formulation to evaluate different multivariate and data preprocessing methods for the optimal identification, localisation and quantification of the chemical components. Finally, cluster ion beams C60 n+ and ArSOO-2S00 + were evaluated on an inorganic surface and an organic delta layer reference material respectively to elucidate the fundamental metrology of cluster ion sputtering and pave the way for their use in organic depth profiling. These studies provide the essential metrological foundation to address frontier issues in surface and nanoanalysis and extend the measurement capabilities ofToF-SIMS.
Book Synopsis Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry by : Danica Heller-Krippendorf
Download or read book Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry written by Danica Heller-Krippendorf and published by Springer Spektrum. This book was released on 2019-11-15 with total page 195 pages. Available in PDF, EPUB and Kindle. Book excerpt: Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.
Book Synopsis Application of Time-of-flight Secondary Ion Mass Spectrometry to Cellular Analysis by : Matthew J. Baker
Download or read book Application of Time-of-flight Secondary Ion Mass Spectrometry to Cellular Analysis written by Matthew J. Baker and published by . This book was released on 2007 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale by : Sadia Rabbani
Download or read book Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale written by Sadia Rabbani and published by . This book was released on 2010 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Time of Flight Secondary Ion Mass Spectrometry Analysis of Organic and Biological Materials Using Polyatomic Primary Ions by : Xavier Anthony Conlan
Download or read book Time of Flight Secondary Ion Mass Spectrometry Analysis of Organic and Biological Materials Using Polyatomic Primary Ions written by Xavier Anthony Conlan and published by . This book was released on 2006 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Pre-processing Influences on Multivariate Data Analysis of Time-of-flight Secondary Ion Mass Spectroscopy Data and Images by : Thérèse Gerri-Ann Lee
Download or read book Pre-processing Influences on Multivariate Data Analysis of Time-of-flight Secondary Ion Mass Spectroscopy Data and Images written by Thérèse Gerri-Ann Lee and published by . This book was released on 2014 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale by : Sadia Rabbani
Download or read book Advances in Time-of-flight Secondary Ion Mass Spectrometry for the Analysis of Single Cells on Sub-cellular Scale written by Sadia Rabbani and published by . This book was released on 2010 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry by : Robert Dale English
Download or read book Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry written by Robert Dale English and published by . This book was released on 2001 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry by Time-of-flight by : Erich Werner Ens
Download or read book Secondary Ion Mass Spectrometry by Time-of-flight written by Erich Werner Ens and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Campaign 1.7 Pu Aging. Development of Time of Flight Secondary Ion Mass Spectroscopy by :
Download or read book Campaign 1.7 Pu Aging. Development of Time of Flight Secondary Ion Mass Spectroscopy written by and published by . This book was released on 2015 with total page 12 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first application of Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) to an aged plutonium surface has resulted in a rich set of surface chemistry data, as well as some unexpected results. FY15 was highlighted by not only the first mapping of hydrogen-containing features within the metal, but also a prove-in series of experiments using the system's Sieverts Reaction Cell. These experiments involved successfully heating the sample to ~450 oC for nearly 24 hours while the sample was dosed several times with hydrogen, followed by an in situ ToF-SIMS analysis. During this year, the data allowed for better and more consistent identification of the myriad peaks that result from the SIMS sputter process. In collaboration with the AWE (U.K), the system was also fully aligned for sputter depth profiling for future experiments.
Book Synopsis The Application of Time-in-flight Secondary Ion Mass Spectrometry for the Analysis of Overlapping Fingerprints and Inks by : Nicholas J. Bright
Download or read book The Application of Time-in-flight Secondary Ion Mass Spectrometry for the Analysis of Overlapping Fingerprints and Inks written by Nicholas J. Bright and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination by : John Denman
Download or read book The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination written by John Denman and published by . This book was released on 2007 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry by Time-of-flight by : Erich Werner Ens
Download or read book Secondary Ion Mass Spectrometry by Time-of-flight written by Erich Werner Ens and published by . This book was released on 1984 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Application of Chemometric Tools for Ion Analysis in Time of Flight Secondary Ion Mass Spectrometry and Ion Mobility Spectrometry by : Peng Zheng
Download or read book Application of Chemometric Tools for Ion Analysis in Time of Flight Secondary Ion Mass Spectrometry and Ion Mobility Spectrometry written by Peng Zheng and published by . This book was released on 1996 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Time-Of-Flight Mass Spectrometry by : D. Price
Download or read book Time-Of-Flight Mass Spectrometry written by D. Price and published by Elsevier. This book was released on 2013-10-22 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-Flight Mass Spectrometry contains the proceedings of the First European Symposium on Time-of-flight Mass Spectrometry held at the University of Salford in the UK on July 3-5, 1967. The papers focus on time-of-flight mass spectrometry and its chemical applications, from flash photolysis and pyrolysis reactions to shock wave reactions and high-temperature studies of inorganic solids. This book is comprised of nine chapters and opens with an introduction to the MA-1 and other time-of-flight mass spectrometers, followed by their applications to studies of chemical reactions such as flash photolysis and pyrolysis reactions, reactions involving shock waves, and high-temperature studies of inorganic solids. Subsequent chapters explore fast recording techniques for time-resolved mass spectrometry; detection of the NH2 free radical and other ammoniacal complexes in the electrical discharge decomposition of ammonia gas; and reactions of ions with molecules in the gas phase and the sputtering of solid surfaces by ion bombardment. The use of a time-of-flight mass spectrometer in experimental investigations of negative ions is also described. This monograph will be a valuable resource for users of a time-of-flight mass spectrometer and allow non-users to become acquainted with its applications and advantages.
