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8th International Conference On X Ray Optics And Microanalysis
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Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph I. Goldstein
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph I. Goldstein and published by Springer. This book was released on 2017-11-17 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
Book Synopsis Synchrotron Radiation Research by : Herman Winick
Download or read book Synchrotron Radiation Research written by Herman Winick and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 767 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has grown out of our shared experience in the development of the Stanford Synchrotron Radiation Laboratory (SSRL), based on the electron-positron storage ring SPEAR at the Stanford Linear Accelerator Center (SLAC) starting in Summer, 1973. The immense potential of the photon beam from SPEAR became obvious as soon as experiments using the beam started to run in May, 1974. The rapid growth of interest in using the beam since that time and the growth of other facilities using high-energy storage rings (see Chapters 1 and 3) demonstrates how the users of this source of radiation are finding applications in an increasingly wide variety of fields of science and technology. In assembling the list of authors for this book, we have tried to cover as many of the applications of synchrotron radiation, both realized already or in the process of realization, as we can. Inevitably, there are omissions both through lack of space and because many projects are at an early stage. We thank the authors for their efforts and cooperation in producing what we believe is the most comprehensive treatment of synchrotron radiation research to date.
Book Synopsis Current Catalog by : National Library of Medicine (U.S.)
Download or read book Current Catalog written by National Library of Medicine (U.S.) and published by . This book was released on 1970 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: First multi-year cumulation covers six years: 1965-70.
Download or read book Scanning Electron Microscopy written by and published by . This book was released on 1985 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
Book Synopsis Sampling Source Book by : C L Thomas
Download or read book Sampling Source Book written by C L Thomas and published by Elsevier. This book was released on 2013-10-22 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Sampling Source Book is an invaluable guide to the world's literature on sampling and provides a timely and much needed focus on what is a diverse and important subject. Based on an exhaustive search of the world's literature, this index containsbibliographic references to journal articles, patents, conference proceedings, books, technical reports and standards. Details of databases searched and outlines are provided as to how the searches were conducted to facilitate update of the data by usersof the index. The material contained in this source book has been assessed by specialists in sampling operations; assuring relevance of the material included. Comprehensive lists of suppliers of sampling equipment, consultants and professional bodieswith expertise and interests in sampling are also presented.
Author :Gottfried Möllenstedt Publisher :Springer Science & Business Media ISBN 13 :3662121085 Total Pages :624 pages Book Rating :4.6/5 (621 download)
Book Synopsis Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse by : Gottfried Möllenstedt
Download or read book Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Book Synopsis Non-Stoichiometric Compounds by : J. Nowotny
Download or read book Non-Stoichiometric Compounds written by J. Nowotny and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: The material in this book is based on invited and contributed pa pers presented at the NATO Advanced Research Workshop on INon-stoichio l metric Compounds held in Ringberg Castle, Rottach-Egern (Bavarian Alps), Germany, July 3-9, 1988. The workshop followed previous meetings held in Mogilany, Poland (1980), Alenya, France (1982), Penn State, USA (1984) and Keele University, UK (1986). The aim of these workshops is to present and discuss up-to-date knowledge in the study of non-stoichiometry and its effect on materials properties as well as to indicate the most urgent research pathways required in this field. Since the subject of non-stoichiometry is interdisciplinary, the workshops bring together solid state physicists and chemists, surface scientists, materials scientists, ceramists and metallurgists. The present workshop, which gathered 42 scientists of an inter national reputation, mainly considered the effect of surfaces, grain boundaries and structural defects on materials properties. From discus sions during this meeting it emerged that correct understanding of properties of ceramic materials requires urgent studies on the defect structure of the interface region. Progress in this direction requires the development of the interface defect chemistry. This is the task for materials scientists in the near future. The present proceedings includes both theoretical and experimen tal work on general aspects of non-stoichiometry, defect structure and diffusion in relation to the bulk and to the interface region of such materials as high tech ceramics, solid electrolytes, electronic cera mics, nuclear materials and high Tc oxide superconductors.
Book Synopsis Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy by : Kurt F. J. Heinrich
Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by . This book was released on 1977 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1975 with total page 1212 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book NBS Special Publication written by and published by . This book was released on 1977 with total page 726 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Science of Microscopy by : P.W. Hawkes
Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Book Synopsis Index to Conferences Relating to Nuclear Science by : Willie E. Clark
Download or read book Index to Conferences Relating to Nuclear Science written by Willie E. Clark and published by . This book was released on 1968 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Inorganic Mass Spectrometry by : Christopher Barshick
Download or read book Inorganic Mass Spectrometry written by Christopher Barshick and published by CRC Press. This book was released on 2000-02-18 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing a theoretical background for inorganic mass spectrometry, this text describes classical applications of four modern mass spectrometers - magnetic sector, quadrupole, time-of-flight, and ion trap - and illustrates how they have impacted elemental and isotopic analysis. The book features examples that concentrate on routine and non-routine applications of inorganic analysis techniques.
Download or read book Energy Research Abstracts written by and published by . This book was released on 1993 with total page 884 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Grants and Awards for the Fiscal Year Ended ... by : National Science Foundation (U.S.)
Download or read book Grants and Awards for the Fiscal Year Ended ... written by National Science Foundation (U.S.) and published by . This book was released on 1980 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry SIMS II by : A. Benninghoven
Download or read book Secondary Ion Mass Spectrometry SIMS II written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
