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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (913 download)
Download or read book 1990 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE Electron Devices Society
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (472 download)
Download or read book Reliability Physics written by IEEE Electron Devices Society and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (756 download)
Download or read book Reliability Physics Symposium, 1990. 28th Annual Proceedings., International written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1990 written by and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Reliability Physics
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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)
Download or read book Reliability Physics (28th Annual Proceedings 1990) written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. W. McPherson
Publisher : Springer
ISBN 13 : 3319936832
Total Pages : 469 pages
Book Rating : 4.3/5 (199 download)
Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer. This book was released on 2018-12-20 with total page 469 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
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ISBN 13 :
Total Pages : 384 pages
Book Rating : 4.:/5 (15 download)
Download or read book 1997 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1997 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Electrochemical Society. Dielectric Science and Technology Division
Publisher : The Electrochemical Society
ISBN 13 : 9781566770033
Total Pages : 346 pages
Book Rating : 4.7/5 (7 download)
Download or read book Proceedings of the Symposia on Reliability of Semiconductor Devices/interconnections and Dielectric Breakdown, and Laser Process for Microelectronic Applications written by Electrochemical Society. Dielectric Science and Technology Division and published by The Electrochemical Society. This book was released on 1992 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semiconductor devices, multilevel interconnection and dielectric breakdown in VLSI and ULSI technologies. The symposium establishes reliability from design through manufacturing. The second part of the symposium addresses laser ablation/etching, laser planarization laser/UV. CVD of metal end dielectric films, laser/UV enhanced etching and deposition processesing liquid phase, and photomodification of surfaces.
Author : Ieee
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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)
Download or read book 1998 Ieee International Reliability Physics Symposium Proceedings (36th Annual) written by Ieee and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 27th Annual Proceedings., International Reliability Physics Symposium written by and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 309 pages
Book Rating : 4.:/5 (932 download)
Download or read book 22nd Annual Proceedings of International Reliability Physics Symposium, 1984, Las Vegas, Nevada written by and published by . This book was released on 1984 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (476 download)
Download or read book 28th Annual Proceedings, Reliability Physics 1990 written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 279 pages
Book Rating : 4.:/5 (826 download)
Download or read book Reliability Physics 1987 written by and published by . This book was released on 1987 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 : 9780780335769
Total Pages : 384 pages
Book Rating : 4.3/5 (357 download)
Download or read book 1997 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1997 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.
Author :
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (221 download)
Download or read book 28th annual proceedings written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.0/5 (85 download)
Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
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ISBN 13 : 9780780344013
Total Pages : 421 pages
Book Rating : 4.3/5 (44 download)
Download or read book 1998 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1998 with total page 421 pages. Available in PDF, EPUB and Kindle. Book excerpt:
